DOI: 10.1021/cm00039a013. ESR Characterization of Oligomeric Thiophene Materials

ESR Characterization of Oligomeric Thiophene Materials

10.1021/cm00039a013

Crossref journal-article

American Chemical Society (ACS)

Chemistry of Materials (316)

Bibliography

Diers, J. R., DeArmond, M. K., Guay, J., Diaz, A., Wu, R., Schumm, J. S., & Tour, J. M. (1994). ESR Characterization of Oligomeric Thiophene Materials. Chemistry of Materials, 6(3), 327â332.

Authors 7

James R. Diers (first)
M. Keith DeArmond (additional)
Jean Guay (additional)
Art Diaz (additional)
Rulian Wu (additional)
Jeffry S. Schumm (additional)
James M. Tour (additional)

References 0 Referenced 17

None

Dates

Type	When
Created	20 years, 5 months ago (March 8, 2005, 12:53 a.m.)
Deposited	2 years, 5 months ago (March 22, 2023, 12:24 a.m.)
Indexed	1 year, 10 months ago (Oct. 31, 2023, 6:12 p.m.)
Issued	31 years, 6 months ago (March 1, 1994)
Published	31 years, 6 months ago (March 1, 1994)
Published Online	23 years, 4 months ago (May 1, 2002)
Published Print	31 years, 6 months ago (March 1, 1994)

Funders 0

None

BibTeX

@article{Diers_1994, title={ESR Characterization of Oligomeric Thiophene Materials}, volume={6}, ISSN={1520-5002}, url={http://dx.doi.org/10.1021/cm00039a013}, DOI={10.1021/cm00039a013}, number={3}, journal={Chemistry of Materials}, publisher={American Chemical Society (ACS)}, author={Diers, James R. and DeArmond, M. Keith and Guay, Jean and Diaz, Art and Wu, Rulian and Schumm, Jeffry S. and Tour, James M.}, year={1994}, month=mar, pages={327–332} }

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