DOI: 10.1021/acsnano.6b01673. Detailed Atomic Reconstruction of Extended Line Defects in Monolayer MoS<sub>2</sub>

Detailed Atomic Reconstruction of Extended Line Defects in Monolayer MoS2

10.1021/acsnano.6b01673

Crossref journal-article

American Chemical Society (ACS)

ACS Nano (316)

Bibliography

Wang, S., Lee, G.-D., Lee, S., Yoon, E., & Warner, J. H. (2016). Detailed Atomic Reconstruction of Extended Line Defects in Monolayer MoS2. ACS Nano, 10(5), 5419â5430.

Authors 5

Shanshan Wang (first)
Gun-Do Lee (additional)
Sungwoo Lee (additional)
Euijoon Yoon (additional)
Jamie H. Warner (additional)

References 38 Referenced 188

Dates

Type	When
Created	9 years, 3 months ago (May 9, 2016, 2:23 p.m.)
Deposited	2 years, 3 months ago (April 27, 2023, 5:11 p.m.)
Indexed	28 minutes ago (Aug. 21, 2025, 8:10 a.m.)
Issued	9 years, 3 months ago (May 9, 2016)
Published	9 years, 3 months ago (May 9, 2016)
Published Online	9 years, 3 months ago (May 9, 2016)
Published Print	9 years, 2 months ago (May 24, 2016)

Funders 0

None

BibTeX

@article{Wang_2016, title={Detailed Atomic Reconstruction of Extended Line Defects in Monolayer MoS2}, volume={10}, ISSN={1936-086X}, url={http://dx.doi.org/10.1021/acsnano.6b01673}, DOI={10.1021/acsnano.6b01673}, number={5}, journal={ACS Nano}, publisher={American Chemical Society (ACS)}, author={Wang, Shanshan and Lee, Gun-Do and Lee, Sungwoo and Yoon, Euijoon and Warner, Jamie H.}, year={2016}, month=may, pages={5419–5430} }

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