Crossref journal-article
American Chemical Society (ACS)
ACS Applied Materials & Interfaces (316)
Bibliography

Amit, I., Jeon, N., Lauhon, L. J., & Rosenwaks, Y. (2015). Impact of Dopant Compensation on Graded p–n Junctions in Si Nanowires. ACS Applied Materials & Interfaces, 8(1), 128–134.

Dates
Type When
Created 9 years, 8 months ago (Dec. 9, 2015, 3:03 p.m.)
Deposited 2 years, 4 months ago (April 14, 2023, 3:17 p.m.)
Indexed 6 months, 1 week ago (Feb. 21, 2025, 10:54 a.m.)
Issued 9 years, 8 months ago (Dec. 22, 2015)
Published 9 years, 8 months ago (Dec. 22, 2015)
Published Online 9 years, 8 months ago (Dec. 22, 2015)
Published Print 9 years, 7 months ago (Jan. 13, 2016)
Funders 2
  1. United States-Israel Binational Science Foundation 10.13039/501100001742

    Region: Asia

    pri (Trusts, charities, foundations (both public and private))

    Labels2
    1. U.S-Israel Binational Science Foundation
    2. BSF
    Awards1
    1. 2012088
  2. Division of Materials Research 10.13039/100000078

    Region: Americas

    gov (National government)

    Labels4
    1. NSF Division of Materials Research
    2. Materials Research
    3. DMR
    4. MPS/DMR
    Awards1
    1. 1308654

@article{Amit_2015, title={Impact of Dopant Compensation on Graded p–n Junctions in Si Nanowires}, volume={8}, ISSN={1944-8252}, url={http://dx.doi.org/10.1021/acsami.5b07746}, DOI={10.1021/acsami.5b07746}, number={1}, journal={ACS Applied Materials & Interfaces}, publisher={American Chemical Society (ACS)}, author={Amit, Iddo and Jeon, Nari and Lauhon, Lincoln J. and Rosenwaks, Yossi}, year={2015}, month=dec, pages={128–134} }