DOI: 10.1017/s1551929512000715. Charged Particle Microscopy: Why Mass Matters

Charged Particle Microscopy: Why Mass Matters

10.1017/s1551929512000715

Crossref journal-article

Oxford University Press (OUP)

Microscopy Today (286)

Abstract

From the nearly mass-less electron to massive ions, charged particle microscopes have diversified over the last few decades. At present, a broad range of available charged particles with varying masses fulfill many applications: from imaging to analysis to nanofabrication.

Bibliography

Notte, J. A. (2012). Charged Particle Microscopy: Why Mass Matters. Microscopy Today, 20(5), 16â22.

Authors 1

John A. Notte (first)

References 20 Referenced 18

10.1021/nl202447n
10.1116/1.3182742
10.1116/1.3253603
{'key': 'S1551929512000715_ref015', 'volume-title': 'Secondary Ion Mass Spectroscopy', 'author': 'Benninghoven', 'year': '1987'} / Secondary Ion Mass Spectroscopy by Benninghoven (1987)
10.1116/1.3271254
{'key': 'S1551929512000715_ref013', 'volume-title': 'Principles and Applications of Ion Scattering Spectroscopy', 'author': 'Rabalais', 'year': '2003'} / Principles and Applications of Ion Scattering Spectroscopy by Rabalais (2003)
10.1017/S1431927611000596
10.1007/978-3-540-38967-5
10.1016/j.ultramic.2009.01.013
10.1116/1.3237101
{'key': 'S1551929512000715_ref003', 'first-page': '101', 'volume': '101', 'author': 'Barth', 'year': '1996', 'journal-title': 'Optik'} / Optik by Barth (1996)
10.1116/1.2779049
10.1016/j.ultramic.2011.03.019
10.1007/978-1-4615-0215-9
10.1016/j.mee.2010.11.041
10.1002/sca.20222 / Scanning by Rahman (2011)
10.1016/j.nima.2010.12.220
[4] Casino Simulation Software, Version 3.2 (http://www.gel.usherbrooke.ca/casino/).
{'key': 'S1551929512000715_ref001', 'volume-title': 'Advances in Imaging and Electron Physics', 'author': 'Hill', 'year': '2012'} / Advances in Imaging and Electron Physics by Hill (2012)
{'key': 'S1551929512000715_ref005', 'volume-title': 'The Stopping and Range of Ions in Matter', 'volume': '1', 'author': 'Zeigler', 'year': '1985'} / The Stopping and Range of Ions in Matter by Zeigler (1985)

Dates

Type	When
Created	12 years, 11 months ago (Sept. 5, 2012, 3:59 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:26 p.m.)
Indexed	1 year, 1 month ago (July 8, 2024, 1:52 a.m.)
Issued	13 years ago (Sept. 1, 2012)
Published	13 years ago (Sept. 1, 2012)
Published Online	12 years, 11 months ago (Sept. 5, 2012)
Published Print	13 years ago (Sept. 1, 2012)

Funders 0

None

BibTeX

@article{Notte_2012, title={Charged Particle Microscopy: Why Mass Matters}, volume={20}, ISSN={2150-3583}, url={http://dx.doi.org/10.1017/s1551929512000715}, DOI={10.1017/s1551929512000715}, number={5}, journal={Microscopy Today}, publisher={Oxford University Press (OUP)}, author={Notte, John A.}, year={2012}, month=sep, pages={16–22} }

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