DOI: 10.1017/s1431927614013622. Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy

Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy

10.1017/s1431927614013622

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

AbstractPiezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to monitor electric-field-induced ionic displacements in solids, the technique being referred to as electrochemical strain microscopy (ESM). ESM has been implemented only in multi-frequency detection modes such as dual AC resonance tracking (DART) and band excitation, where the response is recorded within a finite frequency range, typically around the first contact resonance. In this paper, we analyze and compare signal-to-noise ratios of the conventional single-frequency method with multi-frequency regimes of measuring surface displacements. Single-frequency detection ESM is demonstrated using a commercial AFM.

Bibliography

Romanyuk, K., Luchkin, S. Yu., Ivanov, M., Kalinin, A., & Kholkin, A. L. (2015). Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy. Microscopy and Microanalysis, 21(1), 154â163.

Authors 5

Konstantin Romanyuk (first)
Sergey Yu. Luchkin (additional)
Maxim Ivanov (additional)
Arseny Kalinin (additional)
Andrei L. Kholkin (additional)

References 31 Referenced 18

10.1063/1.2749463
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10.1063/1.1143970
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10.1007/s10832-013-9819-7
10.1063/1.3460637
10.1103/PhysRevB.83.195313
10.1103/PhysRevLett.74.4309
10.1088/0957-0233/19/1/015504
10.1088/0957-4484/11/3/306
10.1021/nl101439x
10.1142/8613
10.1557/mrs2009.176
10.1088/0957-4484/6/1/001
Han W. & Lindsay S.M. (2007). Intrinsic contact noise: A figure of merit for identifying high resolution AFMs. Application note.
10.1007/978-1-4419-9044-0
10.1088/0022-3727/44/46/464006
10.1088/0957-4484/18/43/435503
{'volume-title': 'Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale (vols. 1 and 2)', 'year': '2006', 'author': 'Kalinin', 'key': 'S1431927614013622_ref15'} / Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale (vols. 1 and 2) by Kalinin (2006)
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10.1088/0957-4484/22/35/355705
10.3762/bjnano.4.4
10.1111/j.1551-2916.2009.03240.x

Dates

Type	When
Created	10 years, 7 months ago (Jan. 2, 2015, 10:14 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 3:54 p.m.)
Indexed	2 months ago (June 23, 2025, 6:05 a.m.)
Issued	10 years, 7 months ago (Jan. 2, 2015)
Published	10 years, 7 months ago (Jan. 2, 2015)
Published Online	10 years, 7 months ago (Jan. 2, 2015)
Published Print	10 years, 6 months ago (Feb. 1, 2015)

Funders 0

None

BibTeX

@article{Romanyuk_2015, title={Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy}, volume={21}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927614013622}, DOI={10.1017/s1431927614013622}, number={1}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Romanyuk, Konstantin and Luchkin, Sergey Yu. and Ivanov, Maxim and Kalinin, Arseny and Kholkin, Andrei L.}, year={2015}, month=jan, pages={154–163} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        6,
        23
      ]
    ],
    "date-time": "2025-06-23T10:05:47Z",
    "timestamp": 1750673147647,
    "version": "3.37.3"
  },
  "reference-count": 31,
  "publisher": "Oxford University Press (OUP)",
  "issue": "1",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2015,
            1,
            2
          ]
        ],
        "date-time": "2015-01-02T00:00:00Z",
        "timestamp": 1420156800000
      },
      "content-version": "unspecified",
      "delay-in-days": 0,
      "URL": "https://www.cambridge.org/core/terms"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2015,
        2
      ]
    ]
  },
  "abstract": "<jats:title>Abstract</jats:title><jats:p>Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to monitor electric-field-induced ionic displacements in solids, the technique being referred to as electrochemical strain microscopy (ESM). ESM has been implemented only in multi-frequency detection modes such as dual AC resonance tracking (DART) and band excitation, where the response is recorded within a finite frequency range, typically around the first contact resonance. In this paper, we analyze and compare signal-to-noise ratios of the conventional single-frequency method with multi-frequency regimes of measuring surface displacements. Single-frequency detection ESM is demonstrated using a commercial AFM.</jats:p>",
  "DOI": "10.1017/s1431927614013622",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2015,
        1,
        2
      ]
    ],
    "date-time": "2015-01-02T15:14:42Z",
    "timestamp": 1420211682000
  },
  "page": "154-163",
  "source": "Crossref",
  "is-referenced-by-count": 18,
  "title": "Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy",
  "prefix": "10.1093",
  "volume": "21",
  "author": [
    {
      "given": "Konstantin",
      "family": "Romanyuk",
      "sequence": "first",
      "affiliation": []
    },
    {
      "ORCID": "https://orcid.org/0000-0003-1923-7449",
      "authenticated-orcid": false,
      "given": "Sergey Yu.",
      "family": "Luchkin",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Maxim",
      "family": "Ivanov",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Arseny",
      "family": "Kalinin",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Andrei L.",
      "family": "Kholkin",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "286",
  "published-online": {
    "date-parts": [
      [
        2015,
        1,
        2
      ]
    ]
  },
  "reference": [
    {
      "key": "S1431927614013622_ref7",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.2749463"
    },
    {
      "key": "S1431927614013622_ref2",
      "doi-asserted-by": "publisher",
      "DOI": "10.1038/nnano.2010.174"
    },
    {
      "key": "S1431927614013622_ref14",
      "doi-asserted-by": "publisher",
      "DOI": "10.1557/mrs.2012.144"
    },
    {
      "key": "S1431927614013622_ref19",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/j.ultramic.2005.12.006"
    },
    {
      "key": "S1431927614013622_ref16",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0034-4885/73/5/056502"
    },
    {
      "key": "S1431927614013622_ref28",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0957-4484/18/47/475504"
    },
    {
      "key": "S1431927614013622_ref11",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1143970"
    },
    {
      "key": "S1431927614013622_ref30",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1896938"
    },
    {
      "key": "S1431927614013622_ref17",
      "doi-asserted-by": "publisher",
      "DOI": "10.1007/s10832-013-9819-7"
    },
    {
      "key": "S1431927614013622_ref24",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.3460637"
    },
    {
      "key": "S1431927614013622_ref25",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRevB.83.195313"
    },
    {
      "key": "S1431927614013622_ref18",
      "doi-asserted-by": "publisher",
      "DOI": "10.1103/PhysRevLett.74.4309"
    },
    {
      "key": "S1431927614013622_ref20",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0957-0233/19/1/015504"
    },
    {
      "key": "S1431927614013622_ref27",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0957-4484/11/3/306"
    },
    {
      "key": "S1431927614013622_ref3",
      "doi-asserted-by": "publisher",
      "DOI": "10.1021/nl101439x"
    },
    {
      "key": "S1431927614013622_ref5",
      "doi-asserted-by": "publisher",
      "DOI": "10.1142/8613"
    },
    {
      "key": "S1431927614013622_ref4",
      "doi-asserted-by": "publisher",
      "DOI": "10.1557/mrs2009.176"
    },
    {
      "key": "S1431927614013622_ref6",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0957-4484/6/1/001"
    },
    {
      "key": "S1431927614013622_ref9",
      "unstructured": "Han W. & Lindsay S.M. (2007). Intrinsic contact noise: A figure of merit for identifying high resolution AFMs. Application note."
    },
    {
      "key": "S1431927614013622_ref10",
      "doi-asserted-by": "publisher",
      "DOI": "10.1007/978-1-4419-9044-0"
    },
    {
      "key": "S1431927614013622_ref13",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0022-3727/44/46/464006"
    },
    {
      "key": "S1431927614013622_ref12",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0957-4484/18/43/435503"
    },
    {
      "volume-title": "Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale (vols. 1 and 2)",
      "year": "2006",
      "author": "Kalinin",
      "key": "S1431927614013622_ref15"
    },
    {
      "key": "S1431927614013622_ref21",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.4802189"
    },
    {
      "key": "S1431927614013622_ref23",
      "doi-asserted-by": "publisher",
      "DOI": "10.1016/j.jpowsour.2014.06.143"
    },
    {
      "key": "S1431927614013622_ref26",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.3673868"
    },
    {
      "key": "S1431927614013622_ref29",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0957-4484/20/19/195701"
    },
    {
      "key": "S1431927614013622_ref31",
      "doi-asserted-by": "publisher",
      "DOI": "10.1063/1.1147177"
    },
    {
      "key": "S1431927614013622_ref8",
      "doi-asserted-by": "publisher",
      "DOI": "10.1088/0957-4484/22/35/355705"
    },
    {
      "key": "S1431927614013622_ref22",
      "doi-asserted-by": "publisher",
      "DOI": "10.3762/bjnano.4.4"
    },
    {
      "key": "S1431927614013622_ref1",
      "doi-asserted-by": "publisher",
      "DOI": "10.1111/j.1551-2916.2009.03240.x"
    }
  ],
  "container-title": "Microscopy and Microanalysis",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927614013622",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2023,
        2,
        14
      ]
    ],
    "date-time": "2023-02-14T20:54:56Z",
    "timestamp": 1676408096000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://academic.oup.com/mam/article/21/1/154/6953369"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2015,
        1,
        2
      ]
    ]
  },
  "references-count": 31,
  "journal-issue": {
    "issue": "1",
    "published-print": {
      "date-parts": [
        [
          2015,
          2
        ]
      ]
    }
  },
  "alternative-id": [
    "S1431927614013622"
  ],
  "URL": "http://dx.doi.org/10.1017/S1431927614013622",
  "relation": {},
  "ISSN": [
    "1431-9276",
    "1435-8115"
  ],
  "subject": [],
  "container-title-short": "Microsc Microanal",
  "published": {
    "date-parts": [
      [
        2015,
        1,
        2
      ]
    ]
  }
}