DOI: 10.1017/s1431927614013476. Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope

Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope

10.1017/s1431927614013476

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

AbstractA procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.

Bibliography

Duchamp, M., Xu, Q., & Dunin-Borkowski, R. E. (2014). Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope. Microscopy and Microanalysis, 20(6), 1638â1645.

Authors 3

Martial Duchamp (first)
Qiang Xu (additional)
Rafal E Dunin-Borkowski (additional)

References 25 Referenced 44

10.1007/978-1-4615-0765-9
10.1116/1.1378072
10.1016/j.ultramic.2004.11.018
10.1557/PROC-589-179
10.1557/PROC-480-19
10.1016/j.ultramic.2004.08.002
{'key': 'S1431927614013476_ref14', 'first-page': '309', 'article-title': 'Dynamic observation of Al thin films plastically strained in a TEM', 'volume': '463', 'author': 'Legros', 'year': '2001', 'journal-title': 'Mater Sci Eng A'} / Mater Sci Eng A / Dynamic observation of Al thin films plastically strained in a TEM by Legros (2001)
10.1063/1.3074309
10.1016/j.ultramic.2012.01.005
{'key': 'S1431927614013476_ref11', 'first-page': '249', 'article-title': 'In situ FIB lift-out for site specific TEM specimen preparation of grain boundaries and interfaces', 'volume': '1', 'author': 'Kempshall', 'year': '2002', 'journal-title': 'Int Congress Electron Microsc Durban South Africa Proc'} / Int Congress Electron Microsc Durban South Africa Proc / In situ FIB lift-out for site specific TEM specimen preparation of grain boundaries and interfaces by Kempshall (2002)
10.1007/BF02673337
10.1038/nmat2713
10.1063/1.348452
10.1016/j.jallcom.2010.10.185
10.1021/nn3053582
10.1021/nl8024467
10.1116/1.1371317
10.1021/nl101482q
{'volume-title': 'Nova NanoLab User’s Manual', 'year': '2003', 'key': 'S1431927614013476_ref3'} / Nova NanoLab User’s Manual (2003)
10.1017/S143192761400974X
10.1016/j.actamat.2011.03.069
10.1002/adma.200902561
10.3139/147.100257
10.1063/1.347742
10.1016/j.actamat.2010.04.019

Dates

Type	When
Created	10 years, 9 months ago (Nov. 5, 2014, 9:54 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 3:54 p.m.)
Indexed	1 month ago (July 19, 2025, 11:42 p.m.)
Issued	10 years, 9 months ago (Nov. 5, 2014)
Published	10 years, 9 months ago (Nov. 5, 2014)
Published Online	10 years, 9 months ago (Nov. 5, 2014)
Published Print	10 years, 8 months ago (Dec. 1, 2014)

Funders 0

None

BibTeX

@article{Duchamp_2014, title={Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope}, volume={20}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927614013476}, DOI={10.1017/s1431927614013476}, number={6}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Duchamp, Martial and Xu, Qiang and Dunin-Borkowski, Rafal E}, year={2014}, month=nov, pages={1638–1645} }

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