Crossref journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
Bibliography

Delobbe, A., Salord, O., Hrncir, T., David, A., Sudraud, P., & Lopour, F. (2014). High Speed TEM Sample Preparation by Xe FIB. Microscopy and Microanalysis, 20(S3), 298–299.

Authors 6
  1. A. Delobbe (first)
  2. O. Salord (additional)
  3. T. Hrncir (additional)
  4. A. David (additional)
  5. P. Sudraud (additional)
  6. F. Lopour (additional)
References 6 Referenced 18
  1. Giannuzzi LA , Smith NS Microsc. Microanal. 17 2011), p. 646. (10.1017/S1431927611004107)
  2. Szot J , et al J. Vac. Sci. Technol. B 10 1992), p. 575. (10.1116/1.586415)
  3. Delobbe A , Salord O & Sudraud P The European Focused Ion Beam Users Group (EFUG) annual meeting 2011),http://www.imec.be/efug/EFUG20o.html.
  4. Overwijk MHF , van del Heuvel FC , Bulle-Lieuwma CWT J. Vac. Sci. Technol. B 11 1993), p. 2021. (10.1116/1.586537)
  5. Young RJ Cleaver JRA & Ahmed H Microelectron. Eng. 11 1990), p. 409. (10.1016/0167-9317(90)90140-O)
  6. Hrnčíř T , et al ISTFA: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis 2012), p. 26.
Dates
Type When
Created 10 years, 11 months ago (Aug. 27, 2014, 9:05 a.m.)
Deposited 2 years, 6 months ago (Feb. 14, 2023, 3:47 p.m.)
Indexed 5 months ago (March 19, 2025, 9:42 a.m.)
Issued 11 years ago (Aug. 1, 2014)
Published 11 years ago (Aug. 1, 2014)
Published Online 10 years, 11 months ago (Aug. 27, 2014)
Published Print 11 years ago (Aug. 1, 2014)
Funders 0

None

@article{Delobbe_2014, title={High Speed TEM Sample Preparation by Xe FIB}, volume={20}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927614003213}, DOI={10.1017/s1431927614003213}, number={S3}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Delobbe, A. and Salord, O. and Hrncir, T. and David, A. and Sudraud, P. and Lopour, F.}, year={2014}, month=aug, pages={298–299} }