Crossref
journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
References
6
Referenced
18
-
Giannuzzi LA , Smith NS Microsc. Microanal. 17 2011), p. 646.
(
10.1017/S1431927611004107
) -
Szot J , et al J. Vac. Sci. Technol. B 10 1992), p. 575.
(
10.1116/1.586415
) - Delobbe A , Salord O & Sudraud P The European Focused Ion Beam Users Group (EFUG) annual meeting 2011),http://www.imec.be/efug/EFUG20o.html.
-
Overwijk MHF , van del Heuvel FC , Bulle-Lieuwma CWT J. Vac. Sci. Technol. B 11 1993), p. 2021.
(
10.1116/1.586537
) -
Young RJ Cleaver JRA & Ahmed H Microelectron. Eng. 11 1990), p. 409.
(
10.1016/0167-9317(90)90140-O
) - Hrnčíř T , et al ISTFA: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis 2012), p. 26.
Dates
Type | When |
---|---|
Created | 10 years, 11 months ago (Aug. 27, 2014, 9:05 a.m.) |
Deposited | 2 years, 6 months ago (Feb. 14, 2023, 3:47 p.m.) |
Indexed | 5 months ago (March 19, 2025, 9:42 a.m.) |
Issued | 11 years ago (Aug. 1, 2014) |
Published | 11 years ago (Aug. 1, 2014) |
Published Online | 10 years, 11 months ago (Aug. 27, 2014) |
Published Print | 11 years ago (Aug. 1, 2014) |
@article{Delobbe_2014, title={High Speed TEM Sample Preparation by Xe FIB}, volume={20}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927614003213}, DOI={10.1017/s1431927614003213}, number={S3}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Delobbe, A. and Salord, O. and Hrncir, T. and David, A. and Sudraud, P. and Lopour, F.}, year={2014}, month=aug, pages={298–299} }