DOI: 10.1017/s1431927613001402. Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

10.1017/s1431927613001402

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

AbstractThe aberration-corrected scanning transmission electron microscope has great sensitivity to environmental or instrumental disturbances such as acoustic, mechanical, or electromagnetic interference. This interference can introduce distortions to the images recorded and degrade both signal noise and resolution performance. In addition, sample or stage drift can cause the images to appear warped and leads to unreliable lattice parameters being exhibited. Here a detailed study of the sources, natures, and effects of imaging distortions is presented, and from this analysis a piece of image reconstruction code has been developed that can restore the majority of the effects of these detrimental image distortions for atomic-resolution data. Example data are presented, and the performance of the restored images is compared quantitatively against the as-recorded data. An improvement in apparent resolution of 16% and an improvement in signal-to-noise ratio of 30% were achieved, as well as correction of the drift up to the precision to which it can be measured.

Bibliography

Jones, L., & Nellist, P. D. (2013). Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope. Microscopy and Microanalysis, 19(4), 1050â1060.

Authors 2

Lewys Jones (first)
Peter D. Nellist (additional)

References 16 Referenced 155

10.1146/annurev-matsci-010510-104604
10.1364/JOSA.38.000196
10.1098/rsta.2009.0112
10.1016/S0304-3991(99)00194-1
10.1093/jmicro/dfn010
10.1016/S0304-3991(99)00013-3
{'key': 'S1431927613001402_ref006', 'first-page': '219', 'article-title': 'Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy', 'volume': '50', 'author': 'Muller', 'year': '2001', 'journal-title': 'J Electron Microsc'} / J Electron Microsc / Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy by Muller (2001)
10.1016/j.ultramic.2012.04.001
10.1016/S0304-3991(02)00155-9
10.1016/j.ultramic.2005.01.003
10.1016/j.ultramic.2006.04.017
10.1093/oxfordjournals.jmicro.a023753
10.1017/S1431927608080136
10.1093/jmicro/51.6.383
10.1016/0304-3991(94)00172-J
10.1093/jmicro/dfp052

Dates

Type	When
Created	12 years, 3 months ago (May 14, 2013, 9:39 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:03 p.m.)
Indexed	2 weeks ago (Aug. 6, 2025, 8:36 a.m.)
Issued	12 years, 3 months ago (May 14, 2013)
Published	12 years, 3 months ago (May 14, 2013)
Published Online	12 years, 3 months ago (May 14, 2013)
Published Print	12 years ago (Aug. 1, 2013)

Funders 0

None

BibTeX

@article{Jones_2013, title={Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope}, volume={19}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927613001402}, DOI={10.1017/s1431927613001402}, number={4}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Jones, Lewys and Nellist, Peter D.}, year={2013}, month=may, pages={1050–1060} }

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