DOI: 10.1017/s1431927612001560. Improving Fabrication and Application of Zach Phase Plates for Phase-Contrast Transmission Electron Microscopy

Improving Fabrication and Application of Zach Phase Plates for Phase-Contrast Transmission Electron Microscopy

10.1017/s1431927612001560

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

AbstractZach phase plates (PPs) are promising devices to enhance phase contrast in transmission electron microscopy. The Zach PP shifts the phase of the zero-order beam by a strongly localized inhomogeneous electrostatic potential in the back focal plane of the objective lens. We present substantial improvements of the Zach PP, which overcome previous limitations. The implementation of a microstructured heating device significantly reduces contamination and charging of the PP structure and extends its lifetime. An improved production process allows fabricating PPs with reduced dimensions resulting in lower cut-on frequencies as revealed by simulations of the electrostatic potential. Phase contrast with inversion of PbSe nanoparticles is demonstrated in a standard transmission electron microscope with LaB6cathode by applying different voltages.

Bibliography

Hettler, S., Gamm, B., Dries, M., Frindt, N., SchrÃ¶der, R. R., & Gerthsen, D. (2012). Improving Fabrication and Application of Zach Phase Plates for Phase-Contrast Transmission Electron Microscopy. Microscopy and Microanalysis, 18(5), 1010â1015.

Authors 6

Simon Hettler (first)
Björn Gamm (additional)
Manuel Dries (additional)
Nicole Frindt (additional)
Rasmus R. Schröder (additional)
Dagmar Gerthsen (additional)

References 14 Referenced 12

10.1063/1.2179411
{'key': 'S1431927612001560_ref010', 'first-page': '136', 'article-title': 'Contrast enhancement by anamorphotic phase plates in an aberration-corrected TEM', 'volume': '13', 'author': 'Schröder', 'year': '2007', 'journal-title': 'Microsc Microanal'} / Microsc Microanal / Contrast enhancement by anamorphotic phase plates in an aberration-corrected TEM by Schröder (2007)
10.1016/S0304-3991(01)00088-2
10.1016/j.ultramic.2006.09.001
10.1016/S0031-8914(42)80035-X
10.1016/j.ultramic.2009.10.003
10.1016/j.ultramic.2009.11.016
10.1017/S1431927610093803
10.1093/jmicro/dfp006
10.1088/1367-2630/12/7/073011
10.1016/j.ultramic.2010.02.006
10.1143/JPSJ.70.696
10.1016/j.ultramic.2008.12.006
10.1515/zna-1947-11-1204 / Z Naturforsch / Über die Kontraste von Atomen im Elektronenmikroskop by Boersch (1947)

Dates

Type	When
Created	12 years, 10 months ago (Oct. 12, 2012, 4:55 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 3:55 p.m.)
Indexed	2 years ago (Aug. 23, 2023, 9:19 p.m.)
Issued	12 years, 11 months ago (Oct. 1, 2012)
Published	12 years, 11 months ago (Oct. 1, 2012)
Published Online	12 years, 10 months ago (Oct. 12, 2012)
Published Print	12 years, 11 months ago (Oct. 1, 2012)

Funders 0

None

BibTeX

@article{Hettler_2012, title={Improving Fabrication and Application of Zach Phase Plates for Phase-Contrast Transmission Electron Microscopy}, volume={18}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927612001560}, DOI={10.1017/s1431927612001560}, number={5}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Hettler, Simon and Gamm, Björn and Dries, Manuel and Frindt, Nicole and Schröder, Rasmus R. and Gerthsen, Dagmar}, year={2012}, month=oct, pages={1010–1015} }

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