DOI: 10.1017/s143192761101035x. Atomic Scale Structural and Chemical Quantification of Non-Stoichiometric Defects in Ti and Bi Doped BiFeO<sub>3</sub>

Atomic Scale Structural and Chemical Quantification of Non-Stoichiometric Defects in Ti and Bi Doped BiFeO3

10.1017/s143192761101035x

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Bibliography

Wang, L., Schaffer, B., Craven, A., MacLaren, I., Miao, S., & Reaney, I. (2011). Atomic Scale Structural and Chemical Quantification of Non-Stoichiometric Defects in Ti and Bi Doped BiFeO3. Microscopy and Microanalysis, 17(S2), 1896â1897.

Authors 6

L Wang (first)
B Schaffer (additional)
A Craven (additional)
I MacLaren (additional)
S Miao (additional)
I Reaney (additional)

References 0 Referenced 1

None

Dates

Type	When
Created	13 years, 10 months ago (Oct. 7, 2011, 4:17 p.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 3:53 p.m.)
Indexed	2 years, 6 months ago (Feb. 15, 2023, 12:28 a.m.)
Issued	14 years, 1 month ago (July 1, 2011)
Published	14 years, 1 month ago (July 1, 2011)
Published Online	8 years, 4 months ago (April 9, 2017)
Published Print	14 years, 1 month ago (July 1, 2011)

Funders 0

None

BibTeX

@article{Wang_2011, title={Atomic Scale Structural and Chemical Quantification of Non-Stoichiometric Defects in Ti and Bi Doped BiFeO3}, volume={17}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s143192761101035x}, DOI={10.1017/s143192761101035x}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Wang, L and Schaffer, B and Craven, A and MacLaren, I and Miao, S and Reaney, I}, year={2011}, month=jul, pages={1896–1897} }

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