DOI: 10.1017/s1431927611004107. TEM Specimen Preparation with Plasma FIB Xe<sup>+</sup> Ions

TEM Specimen Preparation with Plasma FIB Xe+ Ions

10.1017/s1431927611004107

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Bibliography

Giannuzzi, L., & Smith, N. (2011). TEM Specimen Preparation with Plasma FIB Xe+ Ions. Microscopy and Microanalysis, 17(S2), 646â647.

Authors 2

L Giannuzzi (first)
N Smith (additional)

References 0 Referenced 30

None

Dates

Type	When
Created	13 years, 10 months ago (Oct. 7, 2011, 4:17 p.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 3:48 p.m.)
Indexed	1 week, 1 day ago (Aug. 12, 2025, 5:24 p.m.)
Issued	14 years, 1 month ago (July 1, 2011)
Published	14 years, 1 month ago (July 1, 2011)
Published Online	8 years, 4 months ago (April 9, 2017)
Published Print	14 years, 1 month ago (July 1, 2011)

Funders 0

None

BibTeX

@article{Giannuzzi_2011, title={TEM Specimen Preparation with Plasma FIB Xe+ Ions}, volume={17}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927611004107}, DOI={10.1017/s1431927611004107}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Giannuzzi, L and Smith, N}, year={2011}, month=jul, pages={646–647} }

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