DOI: 10.1017/s1431927610094109. Variable Resolution Fluctuation Electron Microscopy on Cu-Zr Metallic Glass Using a Wide Range of Coherent STEM Probe Size

Variable Resolution Fluctuation Electron Microscopy on Cu-Zr Metallic Glass Using a Wide Range of Coherent STEM Probe Size

10.1017/s1431927610094109

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

AbstractWe report variable resolution fluctuation electron microscopy (VRFEM) measurements on Cu64.5Zr35.5metallic glass acquired using scanning transmission electron microscopy nanodiffraction using coherent probes 0.8 to 11 nm in diameter. The VRFEM results show that medium range atomic order structure of Cu64.5Zr35.5bulk metallic glass at the ∼1 nm scale has large fluctuations, but the structure becomes almost completely homogeneous at the 11 nm scale. We show that our experimental VRFEM data are consistent with two different models, the pair persistent model and the amorphous/nanocrystal composite model. We also report a new way to filter VRFEM data to eliminate the effect of specimen thickness gradient using high-angle annular dark field images as references.

Bibliography

Hwang, J., & Voyles, P. M. (2010). Variable Resolution Fluctuation Electron Microscopy on Cu-Zr Metallic Glass Using a Wide Range of Coherent STEM Probe Size. Microscopy and Microanalysis, 17(1), 67â74.

Authors 2

Jinwoo Hwang (first)
P.M. Voyles (additional)

References 31 Referenced 68

10.1038/nmat2634
10.1016/0001-6160(79)90055-5
{'key': 'S1431927610094109_ref005', 'first-page': '245', 'volume-title': 'The Structure of Non-Crystalline Materials', 'author': 'Freeman', 'year': '1976'} / The Structure of Non-Crystalline Materials by Freeman (1976)
10.1073/pnas.0905337106
Voyles P.M. (2001). Fluctuation electron microscopy of medium-range order in amorphous silicon. Dissertation. Urbana, IL: University of Illinois at Urbana-Champaign.
10.1126/science.1177483
10.1063/1.1897830
10.1016/S1369-7021(09)70037-9
10.1088/0034-4885/69/1/R05
10.1093/jmicro/dfq052
10.1016/S0304-3991(00)00013-9
10.1016/S0304-3991(02)00155-9
10.1103/RevModPhys.72.621
10.1016/S0927-0248(02)00434-8
10.1016/j.ultramic.2010.05.001
10.1111/j.1365-2818.2007.01714.x
{'key': 'S1431927610094109_ref008', 'article-title': 'Nanometer-scale structural relaxation in Zr-based bulk metallic glass', 'volume': '1048', 'author': 'Hwang', 'year': '2008', 'journal-title': 'Mater Res Soc Symp Proc'} / Mater Res Soc Symp Proc / Nanometer-scale structural relaxation in Zr-based bulk metallic glass by Hwang (2008)
10.1103/PhysRevB.80.014202
10.1103/PhysRevLett.104.105701
10.1016/0304-3991(88)90007-1
{'key': 'S1431927610094109_ref017', 'first-page': '119', 'article-title': 'A cross-correlation measure of order in “amorphous” indium oxide', 'volume': '98', 'author': 'Rodenburg', 'year': '1989', 'journal-title': 'Inst Phys Conf Ser'} / Inst Phys Conf Ser / A cross-correlation measure of order in “amorphous” indium oxide by Rodenburg (1989)
10.1063/1.1407319
10.1038/nature04421
10.1088/0953-8984/19/45/455203
10.1016/j.ultramic.2007.11.004
10.1016/S0022-3093(01)00652-4
10.1007/3-540-46008-X / Anomalous X-Ray Scattering for Materials Characterization by Waseda (2002)
10.1088/0034-4885/68/12/R06
10.1016/0304-3991(94)00184-O
10.1557/jmr.2009.0386
10.1107/S0108767388006403

Dates

Type	When
Created	14 years, 9 months ago (Dec. 2, 2010, 7:47 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 3:43 p.m.)
Indexed	2 days ago (Sept. 4, 2025, 10:24 a.m.)
Issued	14 years, 9 months ago (Dec. 2, 2010)
Published	14 years, 9 months ago (Dec. 2, 2010)
Published Online	14 years, 9 months ago (Dec. 2, 2010)
Published Print	14 years, 7 months ago (Feb. 1, 2011)

Funders 0

None

BibTeX

@article{Hwang_2010, title={Variable Resolution Fluctuation Electron Microscopy on Cu-Zr Metallic Glass Using a Wide Range of Coherent STEM Probe Size}, volume={17}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927610094109}, DOI={10.1017/s1431927610094109}, number={1}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Hwang, Jinwoo and Voyles, P.M.}, year={2010}, month=dec, pages={67–74} }

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