DOI: 10.1017/s1431927610059957. Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices

Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices

10.1017/s1431927610059957

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Bibliography

Gazda, J., Duarte, J., & Daby-Merrill, F. (2010). Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices. Microscopy and Microanalysis, 16(S2), 230â231.

Authors 3

J Gazda (first)
J Duarte (additional)
F Daby-Merrill (additional)

References 0 Referenced 3

None

Dates

Type	When
Created	14 years, 11 months ago (Aug. 26, 2010, 10:30 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:09 p.m.)
Indexed	1 year, 11 months ago (Aug. 22, 2023, 9:42 p.m.)
Issued	15 years, 1 month ago (July 1, 2010)
Published	15 years, 1 month ago (July 1, 2010)
Published Online	15 years ago (Aug. 1, 2010)
Published Print	15 years, 1 month ago (July 1, 2010)

Funders 0

None

BibTeX

@article{Gazda_2010, title={Twice Flipped - Avoiding Milling Curtains in FIB Prepared TEM Specimens of Nano-Electronics Devices}, volume={16}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927610059957}, DOI={10.1017/s1431927610059957}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Gazda, J and Duarte, J and Daby-Merrill, F}, year={2010}, month=jul, pages={230–231} }

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