DOI: 10.1017/s1431927610054474. Ultra-thin TEM Sample Preparation with Advanced Backside FIB Milling Method

Ultra-thin TEM Sample Preparation with Advanced Backside FIB Milling Method

10.1017/s1431927610054474

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Bibliography

Kang, H.-J., Kim, J., Oh, J., Back, T., & Kim, H. (2010). Ultra-thin TEM Sample Preparation with Advanced Backside FIB Milling Method. Microscopy and Microanalysis, 16(S2), 170â171.

Authors 5

H-J Kang (first)
JH Kim (additional)
JW Oh (additional)
TS Back (additional)
HJ Kim (additional)

References 0 Referenced 10

None

Dates

Type	When
Created	15 years ago (Aug. 26, 2010, 10:30 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:06 p.m.)
Indexed	1 year, 5 months ago (March 15, 2024, 1:23 a.m.)
Issued	15 years, 1 month ago (July 1, 2010)
Published	15 years, 1 month ago (July 1, 2010)
Published Online	15 years ago (Aug. 1, 2010)
Published Print	15 years, 1 month ago (July 1, 2010)

Funders 0

None

BibTeX

@article{Kang_2010, title={Ultra-thin TEM Sample Preparation with Advanced Backside FIB Milling Method}, volume={16}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927610054474}, DOI={10.1017/s1431927610054474}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Kang, H-J and Kim, JH and Oh, JW and Back, TS and Kim, HJ}, year={2010}, month=jul, pages={170–171} }

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