Crossref journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Bibliography

Geiser, B., Larson, D., Oltman, E., Gerstl, S., Reinhard, D., Kelly, T., & Prosa, T. (2009). Wide-Field-of-View Atom Probe Reconstruction. Microscopy and Microanalysis, 15(S2), 292–293.

Authors 7
  1. BP Geiser (first)
  2. DJ Larson (additional)
  3. E Oltman (additional)
  4. S Gerstl (additional)
  5. D Reinhard (additional)
  6. TF Kelly (additional)
  7. TJ Prosa (additional)
References 0 Referenced 142

None

Dates
Type When
Created 16 years ago (July 27, 2009, 4:24 a.m.)
Deposited 2 years, 6 months ago (Feb. 14, 2023, 4:04 p.m.)
Indexed 4 weeks, 1 day ago (July 24, 2025, 7:56 a.m.)
Issued 16 years, 1 month ago (July 1, 2009)
Published 16 years, 1 month ago (July 1, 2009)
Published Online 16 years ago (July 26, 2009)
Published Print 16 years, 1 month ago (July 1, 2009)
Funders 0

None

@article{Geiser_2009, title={Wide-Field-of-View Atom Probe Reconstruction}, volume={15}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927609098249}, DOI={10.1017/s1431927609098249}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Geiser, BP and Larson, DJ and Oltman, E and Gerstl, S and Reinhard, D and Kelly, TF and Prosa, TJ}, year={2009}, month=jul, pages={292–293} }