DOI: 10.1017/s1431927606063537. FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System

FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System

10.1017/s1431927606063537

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Bibliography

Sadayama, S., Takahashi, H., Iwasaki, K., & Fujii, T. (2006). FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System. Microscopy and Microanalysis, 12(S02), 1298â1299.

Authors 4

S Sadayama (first)
H Takahashi (additional)
K Iwasaki (additional)
T Fujii (additional)

References 0 Referenced 1

None

Dates

Type	When
Created	18 years, 9 months ago (Oct. 30, 2006, 11:54 a.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:06 p.m.)
Indexed	2 years, 6 months ago (Feb. 14, 2023, 4:40 p.m.)
Issued	19 years ago (July 31, 2006)
Published	19 years ago (July 31, 2006)
Published Online	19 years ago (July 31, 2006)
Published Print	19 years ago (Aug. 1, 2006)

Funders 0

None

BibTeX

@article{Sadayama_2006, title={FIB Damage Reduction Technique in TEM Membrane Using Triple Beam System}, volume={12}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927606063537}, DOI={10.1017/s1431927606063537}, number={S02}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Sadayama, S and Takahashi, H and Iwasaki, K and Fujii, T}, year={2006}, month=jul, pages={1298–1299} }

JSON

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