Abstract
We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 eV = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.
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Dates
Type | When |
---|---|
Created | 18 years, 10 months ago (Nov. 3, 2006, 2:59 p.m.) |
Deposited | 2 years, 6 months ago (Feb. 14, 2023, 4:05 p.m.) |
Indexed | 3 months, 2 weeks ago (May 21, 2025, 12:48 p.m.) |
Issued | 18 years, 10 months ago (Oct. 11, 2006) |
Published | 18 years, 10 months ago (Oct. 11, 2006) |
Published Online | 18 years, 10 months ago (Oct. 11, 2006) |
Published Print | 18 years, 9 months ago (Dec. 1, 2006) |
@article{Koch_2006, title={SESAM: Exploring the Frontiers of Electron Microscopy}, volume={12}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927606060624}, DOI={10.1017/s1431927606060624}, number={6}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Koch, Christoph T. and Sigle, Wilfried and Höschen, Rainer and Rühle, Manfred and Essers, Erik and Benner, Gerd and Matijevic, Marko}, year={2006}, month=oct, pages={506–514} }