Crossref journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
Abstract

We report on the sub-electron-volt-sub-angstrom microscope (SESAM), a high-resolution 200-kV FEG-TEM equipped with a monochromator and an in-column MANDOLINE filter. We report on recent results obtained with this instrument, demonstrating its performance (e.g., 87-meV energy resolution at 10-s exposure time, or a transmissivity of the energy filter of T1 eV = 11,000 nm2). New opportunities to do unique experiments that may advance the frontiers of microscopy in areas such as energy-filtered TEM, spectroscopy, energy-filtered electron diffraction and spectroscopic profiling are also discussed.

Bibliography

Koch, C. T., Sigle, W., Höschen, R., Rühle, M., Essers, E., Benner, G., & Matijevic, M. (2006). SESAM: Exploring the Frontiers of Electron Microscopy. Microscopy and Microanalysis, 12(6), 506–514.

Authors 7
  1. Christoph T. Koch (first)
  2. Wilfried Sigle (additional)
  3. Rainer Höschen (additional)
  4. Manfred Rühle (additional)
  5. Erik Essers (additional)
  6. Gerd Benner (additional)
  7. Marko Matijevic (additional)
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Dates
Type When
Created 18 years, 10 months ago (Nov. 3, 2006, 2:59 p.m.)
Deposited 2 years, 6 months ago (Feb. 14, 2023, 4:05 p.m.)
Indexed 3 months, 2 weeks ago (May 21, 2025, 12:48 p.m.)
Issued 18 years, 10 months ago (Oct. 11, 2006)
Published 18 years, 10 months ago (Oct. 11, 2006)
Published Online 18 years, 10 months ago (Oct. 11, 2006)
Published Print 18 years, 9 months ago (Dec. 1, 2006)
Funders 0

None

@article{Koch_2006, title={SESAM: Exploring the Frontiers of Electron Microscopy}, volume={12}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927606060624}, DOI={10.1017/s1431927606060624}, number={6}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Koch, Christoph T. and Sigle, Wilfried and Höschen, Rainer and Rühle, Manfred and Essers, Erik and Benner, Gerd and Matijevic, Marko}, year={2006}, month=oct, pages={506–514} }