Crossref journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Bibliography

Oleshko, V. P., & Howe, J. M. (2004). In Situ EFTEM/PEELS Investigation of Melting Behavior of Individual Al-Si Alloy Small Particles. Microscopy and Microanalysis, 10(S02), 350–351.

Authors 2
  1. V. P. Oleshko (first)
  2. J. M. Howe (additional)
References 0 Referenced 3

None

Dates
Type When
Created 17 years, 7 months ago (Jan. 4, 2008, 5 a.m.)
Deposited 2 years, 6 months ago (Feb. 14, 2023, 3:54 p.m.)
Indexed 2 years, 6 months ago (Feb. 15, 2023, 12:19 a.m.)
Issued 21 years ago (Aug. 1, 2004)
Published 21 years ago (Aug. 1, 2004)
Published Online 21 years ago (Aug. 1, 2004)
Published Print 21 years ago (Aug. 1, 2004)
Funders 0

None

@article{Oleshko_2004, title={In Situ EFTEM/PEELS Investigation of Melting Behavior of Individual Al-Si Alloy Small Particles}, volume={10}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927604884447}, DOI={10.1017/s1431927604884447}, number={S02}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Oleshko, V. P. and Howe, J. M.}, year={2004}, month=aug, pages={350–351} }