Crossref journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Bibliography

Jin, Q. (2004). Thickness Measurements of a TEM Foil and Its Surface Layer By Electron Energy-Loss Spectroscopy. Microscopy and Microanalysis, 10(S02), 882–883.

Authors 1
  1. Qiang Jin (first)
References 0 Referenced 6

None

Dates
Type When
Created 17 years, 7 months ago (Jan. 4, 2008, 5 a.m.)
Deposited 2 years, 6 months ago (Feb. 14, 2023, 3:52 p.m.)
Indexed 1 year, 4 months ago (April 9, 2024, 10:15 p.m.)
Issued 21 years ago (Aug. 1, 2004)
Published 21 years ago (Aug. 1, 2004)
Published Online 21 years ago (Aug. 1, 2004)
Published Print 21 years ago (Aug. 1, 2004)
Funders 0

None

@article{Jin_2004, title={Thickness Measurements of a TEM Foil and Its Surface Layer By Electron Energy-Loss Spectroscopy}, volume={10}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927604881327}, DOI={10.1017/s1431927604881327}, number={S02}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Jin, Qiang}, year={2004}, month=aug, pages={882–883} }