Crossref
journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
Dates
Type | When |
---|---|
Created | 17 years, 7 months ago (Jan. 4, 2008, 5 a.m.) |
Deposited | 2 years, 6 months ago (Feb. 14, 2023, 3:52 p.m.) |
Indexed | 1 year, 4 months ago (April 9, 2024, 10:15 p.m.) |
Issued | 21 years ago (Aug. 1, 2004) |
Published | 21 years ago (Aug. 1, 2004) |
Published Online | 21 years ago (Aug. 1, 2004) |
Published Print | 21 years ago (Aug. 1, 2004) |
@article{Jin_2004, title={Thickness Measurements of a TEM Foil and Its Surface Layer By Electron Energy-Loss Spectroscopy}, volume={10}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927604881327}, DOI={10.1017/s1431927604881327}, number={S02}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Jin, Qiang}, year={2004}, month=aug, pages={882–883} }