Crossref
journal-article
Oxford University Press (OUP)
Microscopy and Microanalysis (286)
Dates
Type | When |
---|---|
Created | 6 years, 3 months ago (May 6, 2019, 6:47 p.m.) |
Deposited | 2 years, 6 months ago (Feb. 14, 2023, 4:08 p.m.) |
Indexed | 2 years, 6 months ago (Feb. 15, 2023, 12:12 a.m.) |
Issued | 22 years ago (Sept. 1, 2003) |
Published | 22 years ago (Sept. 1, 2003) |
Published Online | 21 years, 11 months ago (Sept. 5, 2003) |
Published Print | 22 years ago (Sept. 1, 2003) |
@article{Maas_2003, title={Electrostatic Aberration Correction in Low-Voltage SEM}, volume={9}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927603011061}, DOI={10.1017/s1431927603011061}, number={S03}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Maas, Diederik and Mentink, Sjoerd and Henstra, Sander}, year={2003}, month=sep, pages={24–25} }