DOI: 10.1017/s1431927602107744. Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.

Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.

10.1017/s1431927602107744

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Bibliography

Pantel, R., Jullian, S., & Dutartre, D. (2002). Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging. Microscopy and Microanalysis, 8(S02), 1174â1175.

Authors 3

R. Pantel (first)
S. Jullian (additional)
D. Dutartre (additional)

References 0 Referenced 3

None

Dates

Type	When
Created	6 years, 3 months ago (May 6, 2019, 8:55 p.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:08 p.m.)
Indexed	2 years, 6 months ago (Feb. 15, 2023, 12:11 a.m.)
Issued	23 years, 1 month ago (Aug. 1, 2002)
Published	23 years, 1 month ago (Aug. 1, 2002)
Published Online	23 years, 1 month ago (Aug. 1, 2002)
Published Print	23 years, 1 month ago (Aug. 1, 2002)

Funders 0

None

BibTeX

@article{Pantel_2002, title={Inelastic Electron Scattering Observation Using Energy Filtered Transmission Electron Microscopy for Silicon-Germanium Nanostructures Imaging.}, volume={8}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927602107744}, DOI={10.1017/s1431927602107744}, number={S02}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Pantel, R. and Jullian, S. and Dutartre, D.}, year={2002}, month=aug, pages={1174–1175} }

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