DOI: 10.1017/s1431927602105502. “H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

10.1017/s1431927602105502

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Bibliography

Patterson, R. J., Mayer, D., Weaver, L., & Phaneuf, M. W. (2002). âH-Bar Lift-Outâ and âPlan-View Lift-Outâ: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation. Microscopy and Microanalysis, 8(S02), 566â567.

Authors 4

R. J. Patterson (first)
D. Mayer (additional)
L. Weaver (additional)
M.W. Phaneuf (additional)

References 0 Referenced 23

None

Dates

Type	When
Created	6 years, 3 months ago (May 6, 2019, 8:55 p.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:06 p.m.)
Indexed	4 months, 2 weeks ago (April 1, 2025, 3:24 a.m.)
Issued	23 years ago (Aug. 1, 2002)
Published	23 years ago (Aug. 1, 2002)
Published Online	23 years ago (Aug. 1, 2002)
Published Print	23 years ago (Aug. 1, 2002)

Funders 0

None

BibTeX

@article{Patterson_2002, title={“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation}, volume={8}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s1431927602105502}, DOI={10.1017/s1431927602105502}, number={S02}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Patterson, R. J. and Mayer, D. and Weaver, L. and Phaneuf, M.W.}, year={2002}, month=aug, pages={566–567} }

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