DOI: 10.1017/s143192760210184x. Monochromized 200kV (S)TEM

10.1017/s143192760210184x

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Bibliography

Tiemeijer, P. C., van Lin, J. H. A., Freitag, B. H., & de Jong, A. F. (2002). Monochromized 200kV (S)TEM. Microscopy and Microanalysis, 8(S02), 70â71.

Authors 4

P.C. Tiemeijer (first)
J.H.A van Lin (additional)
B.H. Freitag (additional)
A.F. de Jong (additional)

References 0 Referenced 17

None

Dates

Type	When
Created	6 years, 3 months ago (May 6, 2019, 8:55 p.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 4:04 p.m.)
Indexed	1 year, 11 months ago (Sept. 18, 2023, 7:47 a.m.)
Issued	23 years ago (Aug. 1, 2002)
Published	23 years ago (Aug. 1, 2002)
Published Online	22 years, 9 months ago (Nov. 1, 2002)
Published Print	23 years ago (Aug. 1, 2002)

Funders 0

None

BibTeX

@article{Tiemeijer_2002, title={Monochromized 200kV (S)TEM}, volume={8}, ISSN={1435-8115}, url={http://dx.doi.org/10.1017/s143192760210184x}, DOI={10.1017/s143192760210184x}, number={S02}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Tiemeijer, P.C. and van Lin, J.H.A and Freitag, B.H. and de Jong, A.F.}, year={2002}, month=aug, pages={70–71} }

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