DOI: 10.1007/s10005-001-0016-0. Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique

Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique

10.1007/s10005-001-0016-0

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

AbstractMicrometer sized particles have been studied to show that a high-quality transmission electron microscope (TEM) specimen can be produced, without the use of embedding media, from a site-specific region of chosen particles using the focused ion beam (FIB) lift-out (LO) technique. The uniqueness of this technique is that site-specific TEM LO specimens may be obtained from particles and from regions which are smaller than the conventional ∼10–20 μm × 5 μm × ∼0.1 μm dimensions of the LO specimen. The innovative FIB LO procedures are described in detail and TEM images of electron transparent specimens obtained from specific micrometer-sized particles are presented.

Bibliography

Lomness, J. K., Giannuzzi, L. A., & Hampton, M. D. (2001). Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique. Microscopy and Microanalysis, 7(5), 418â423.

Authors 3

Janice K. Lomness (first)
Lucille A. Giannuzzi (additional)
Michael D. Hampton (additional)

References 0 Referenced 15

None

Dates

Type	When
Created	5 years, 2 months ago (June 22, 2020, 4:49 p.m.)
Deposited	2 years, 6 months ago (Feb. 14, 2023, 6:31 a.m.)
Indexed	2 years, 5 months ago (March 24, 2023, 10:50 p.m.)
Issued	24 years ago (Sept. 1, 2001)
Published	24 years ago (Sept. 1, 2001)
Published Online	23 years, 7 months ago (Feb. 2, 2002)
Published Print	24 years ago (Sept. 1, 2001)

Funders 0

None

BibTeX

@article{Lomness_2001, title={Site-specific Transmission Electron Microscope Characterization of Micrometer-sized Particles Using the Focused Ion Beam Lift-out Technique}, volume={7}, ISSN={1435-8115}, url={http://dx.doi.org/10.1007/s10005-001-0016-0}, DOI={10.1007/s10005-001-0016-0}, number={5}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Lomness, Janice K. and Giannuzzi, Lucille A. and Hampton, Michael D.}, year={2001}, month=sep, pages={418–423} }

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