DOI: 10.1017/s1431927600037831. In-Situ TEM Investigation of the Solid/Liquid Interface in Al-Si Alloys

In-Situ TEM Investigation of the Solid/Liquid Interface in Al-Si Alloys

10.1017/s1431927600037831

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Abstract The solid/liquid interface is a junction between two condensed phases with completely different atomic arrangements. At the interface between the periodically ordered solid and the amorphous liquid, the atoms adopt a structure that minimizes the excess energy due to the abrupt change between the surrounding phases. Faceted and diffuse interfaces describe two extremes in morphology of a solid/liquid interface. In a faceted interface, the change from solid to liquid occurs over one atomic layer, however periodic order extends into the first few liquid layers adjacent to the crystalline solid, as predicted by numerous models.1 The faceted interface advances by nucleation and growth of ledges on the interface. A diffuse interface has a structure in which the change from solid to liquid occurs over several atomic layers. This interface contains many ledges to which liquid atoms may attach continuously as the interface advances.

Bibliography

Storaska, G. A., & Howe, J. M. (2000). In-Situ TEM Investigation of the Solid/Liquid Interface in Al-Si Alloys. Microscopy and Microanalysis, 6(S2), 1068â1069.

Authors 2

Garrett A Storaska (first)
James M Howe (additional)

References 4 Referenced 2

{'key': '2024091007470626500_ref1', 'first-page': '224', 'volume-title': 'Interfaces in Materials', 'author': 'Howe', 'year': '1997'} / Interfaces in Materials by Howe (1997)
{'key': '2024091007470626500_ref2', 'first-page': '34', 'volume-title': 'Metals and Alloys', 'author': 'Murr', 'year': '1975'} / Metals and Alloys by Murr (1975)
10.1016/0001-6160(85)90161-0 / Acta metall. by Gunduz (1985)
10.1017/S1431927698980266 / Microsc. Microanai by Arai (1998)

Dates

Type	When
Created	5 years, 1 month ago (July 2, 2020, 4:36 a.m.)
Deposited	11 months, 3 weeks ago (Sept. 10, 2024, 7:34 a.m.)
Indexed	11 months, 3 weeks ago (Sept. 10, 2024, 8:43 a.m.)
Issued	25 years ago (Aug. 1, 2000)
Published	25 years ago (Aug. 1, 2000)
Published Online	25 years ago (Aug. 1, 2000)
Published Print	25 years ago (Aug. 1, 2000)

Funders 0

None

BibTeX

@article{Storaska_2000, title={In-Situ TEM Investigation of the Solid/Liquid Interface in Al-Si Alloys}, volume={6}, ISSN={1431-9276}, url={http://dx.doi.org/10.1017/s1431927600037831}, DOI={10.1017/s1431927600037831}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Storaska, Garrett A and Howe, James M}, year={2000}, month=aug, pages={1068–1069} }

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