DOI: 10.1017/s1431927600034383. Copper Oxidation Via “Ex-Situ” TEM

10.1017/s1431927600034383

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Abstract The ability to understand and control the microstructure of materials under “real life” conditions is of great interest to both the scientific and industrial communities. In recent years, a variety of “ex-situ” TEM methods have been developed to improve this knowledge base. ExxonMobil's dedicated reactor system developed for “ex-situ” TEM was used to study the oxidation and reduction of copper on a carbon film and Cu on a Si support. By following the oxidation of specific Cu particles, it was possible to illustrate the oxidation process. A standard, commercially available, 200 mesh Cu grid covered with a holey C support film was used for the Cu on C study. Small Cu islands were vapor deposited from the grid onto the C film during a high temperature reduction in the reactor (Figure 1). The grid was transferred under inert conditions into the TEM where the Cu metal islands were imaged (Figure 2a).

Bibliography

Kliewer, C., Disko, M., Soled, S., DeMartin, G., Baumgartner, J., & Miseo, S. (2000). Copper Oxidation Via âEx-Situâ TEM. Microscopy and Microanalysis, 6(S2), 378â379.

Authors 6

CE Kliewer (first)
MM Disko (additional)
SL Soled (additional)
G DeMartin (additional)
J Baumgartner (additional)
S Miseo (additional)

References 3 Referenced 4

10.1017/S1431927600009867 / Proc. Micro. & Microanalysis by Allard (1997)
10.1017/S1431927600017955 / Proc. Micro.&Microanalysis by Kliewer (1999)
{'year': '1995', 'author': 'Dayte', 'key': '2024091007441332500_ref3'} by Dayte (1995)

Dates

Type	When
Created	5 years, 1 month ago (July 2, 2020, 4:36 a.m.)
Deposited	11 months, 2 weeks ago (Sept. 10, 2024, 5:39 a.m.)
Indexed	11 months, 2 weeks ago (Sept. 10, 2024, 6:40 a.m.)
Issued	25 years ago (Aug. 1, 2000)
Published	25 years ago (Aug. 1, 2000)
Published Online	25 years ago (Aug. 1, 2000)
Published Print	25 years ago (Aug. 1, 2000)

Funders 0

None

BibTeX

@article{Kliewer_2000, title={Copper Oxidation Via “Ex-Situ” TEM}, volume={6}, ISSN={1431-9276}, url={http://dx.doi.org/10.1017/s1431927600034383}, DOI={10.1017/s1431927600034383}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Kliewer, CE and Disko, MM and Soled, SL and DeMartin, G and Baumgartner, J and Miseo, S}, year={2000}, month=aug, pages={378–379} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        9,
        10
      ]
    ],
    "date-time": "2024-09-10T10:40:11Z",
    "timestamp": 1725964811663
  },
  "reference-count": 3,
  "publisher": "Oxford University Press (OUP)",
  "issue": "S2",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2000,
            8,
            1
          ]
        ],
        "date-time": "2000-08-01T00:00:00Z",
        "timestamp": 965088000000
      },
      "content-version": "vor",
      "delay-in-days": 0,
      "URL": "https://academic.oup.com/journals/pages/open_access/funder_policies/chorus/standard_publication_model"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2000,
        8,
        1
      ]
    ]
  },
  "abstract": "<jats:title>Abstract</jats:title>\n               <jats:p>The ability to understand and control the microstructure of materials under \u201creal life\u201d conditions is of great interest to both the scientific and industrial communities. In recent years, a variety of \u201cex-situ\u201d TEM methods have been developed to improve this knowledge base.</jats:p>\n               <jats:p>ExxonMobil's dedicated reactor system developed for \u201cex-situ\u201d TEM was used to study the oxidation and reduction of copper on a carbon film and Cu on a Si support. By following the oxidation of specific Cu particles, it was possible to illustrate the oxidation process. A standard, commercially available, 200 mesh Cu grid covered with a holey C support film was used for the Cu on C study. Small Cu islands were vapor deposited from the grid onto the C film during a high temperature reduction in the reactor (Figure 1). The grid was transferred under inert conditions into the TEM where the Cu metal islands were imaged (Figure 2a).</jats:p>",
  "DOI": "10.1017/s1431927600034383",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2020,
        7,
        2
      ]
    ],
    "date-time": "2020-07-02T08:36:37Z",
    "timestamp": 1593678997000
  },
  "page": "378-379",
  "source": "Crossref",
  "is-referenced-by-count": 4,
  "title": "Copper Oxidation Via \u201cEx-Situ\u201d TEM",
  "prefix": "10.1093",
  "volume": "6",
  "author": [
    {
      "given": "CE",
      "family": "Kliewer",
      "sequence": "first",
      "affiliation": [
        {
          "name": "ExxonMobil Research & Engineering , Rt. 22 East, Annandale, NJ 08801"
        }
      ]
    },
    {
      "given": "MM",
      "family": "Disko",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "ExxonMobil Research & Engineering , Rt. 22 East, Annandale, NJ 08801"
        }
      ]
    },
    {
      "given": "SL",
      "family": "Soled",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "ExxonMobil Research & Engineering , Rt. 22 East, Annandale, NJ 08801"
        }
      ]
    },
    {
      "given": "G",
      "family": "DeMartin",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "ExxonMobil Research & Engineering , Rt. 22 East, Annandale, NJ 08801"
        }
      ]
    },
    {
      "given": "J",
      "family": "Baumgartner",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "ExxonMobil Research & Engineering , Rt. 22 East, Annandale, NJ 08801"
        }
      ]
    },
    {
      "given": "S",
      "family": "Miseo",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "ExxonMobil Research & Engineering , Rt. 22 East, Annandale, NJ 08801"
        }
      ]
    }
  ],
  "member": "286",
  "published-online": {
    "date-parts": [
      [
        2000,
        8,
        1
      ]
    ]
  },
  "reference": [
    {
      "key": "2024091007441332500_ref1",
      "doi-asserted-by": "crossref",
      "first-page": "595",
      "DOI": "10.1017/S1431927600009867",
      "volume": "3",
      "author": "Allard",
      "year": "1997",
      "journal-title": "Proc. Micro. & Microanalysis"
    },
    {
      "key": "2024091007441332500_ref2",
      "doi-asserted-by": "crossref",
      "first-page": "926",
      "DOI": "10.1017/S1431927600017955",
      "volume": "1",
      "author": "Kliewer",
      "year": "1999",
      "journal-title": "Proc. Micro.&Microanalysis"
    },
    {
      "year": "1995",
      "author": "Dayte",
      "key": "2024091007441332500_ref3"
    }
  ],
  "container-title": "Microscopy and Microanalysis",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://academic.oup.com/mam/article-pdf/6/S2/378/59064137/mam0378.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://academic.oup.com/mam/article-pdf/6/S2/378/59064137/mam0378.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        9,
        10
      ]
    ],
    "date-time": "2024-09-10T09:39:30Z",
    "timestamp": 1725961170000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://academic.oup.com/mam/article/6/S2/378/6940576"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2000,
        8,
        1
      ]
    ]
  },
  "references-count": 3,
  "journal-issue": {
    "issue": "S2",
    "published-online": {
      "date-parts": [
        [
          2000,
          8,
          1
        ]
      ]
    },
    "published-print": {
      "date-parts": [
        [
          2000,
          8,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1017/S1431927600034383",
  "relation": {},
  "ISSN": [
    "1435-8115",
    "1431-9276"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2000,
        8,
        1
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2000,
        8,
        1
      ]
    ]
  }
}