DOI: 10.1017/s1431927600017438. Effect of Correction of the 3-Fold Astigmatism on HREM Lattice Imaging With Information Below 100 Pm

Effect of Correction of the 3-Fold Astigmatism on HREM Lattice Imaging With Information Below 100 Pm

10.1017/s1431927600017438

Crossref journal-article

Oxford University Press (OUP)

Microscopy and Microanalysis (286)

Abstract

Abstract High resolution electron microscopes with field emission sources opened the possibility to investigate solids on a 100 pm range. Either electron holograpy can be applied or an information limit that may even extend into a region below 100 pm can be exploited to reach this goal [1]. However, lens aberrations such as the three-fold astigmatism often complicate an image interpretation in the 100 pm range or even make it impossible [2]. On the other hand, there is growing need to understand physical processes at a mono-atomic level in order to further develop artificially structured materials such as nano-crystals, ceramic coatings or semiconductors. Commonly, such materials contain light elements like C, N, or O with bond lengths that are shorter than a typical 180 pm point resolution of a high resolution, electron microscope. The carbon-carbon distance of 150 pm is the shortest bond length value in crystalline solids. Moreover, any projection of a diamond lattice along a low index zone axis for lattice imaging leads to a reduced C-C distance.

Bibliography

Wang, Y., Fitzgerald, A., Nelson, E., Song, C., OâKeefe, M., & Kisielowski, C. (1999). Effect of Correction of the 3-Fold Astigmatism on HREM Lattice Imaging With Information Below 100 Pm. Microscopy and Microanalysis, 5(S2), 822â823.

Authors 6

YC Wang (first)
A Fitzgerald (additional)
EC Nelson (additional)
C Song (additional)
MA O’Keefe (additional)
C Kisielowski (additional)

References 5 Referenced 10

{'key': 'S1431927600017438_ref002', 'first-page': '297', 'volume-title': '“Electron Optics”', 'author': 'Hawkes', 'year': '1989'} / “Electron Optics” by Hawkes (1989)
{'key': 'S1431927600017438_ref003', 'first-page': '57', 'volume-title': 'Electron Microscopy', 'author': 'Wang', 'year': '1998'} / Electron Microscopy by Wang (1998)
10.1016/0304-3991(90)90035-K
10.1017/S0424820100164556
Diffractograms in figure 2 are a courtesy of Dr. Pan, M. , Gatan,

Dates

Type	When
Created	5 years, 1 month ago (July 2, 2020, 4:37 a.m.)
Deposited	11 months, 2 weeks ago (Sept. 9, 2024, 2:25 p.m.)
Indexed	11 months, 2 weeks ago (Sept. 9, 2024, 8:07 p.m.)
Issued	26 years ago (Aug. 1, 1999)
Published	26 years ago (Aug. 1, 1999)
Published Online	26 years ago (Aug. 1, 1999)
Published Print	26 years ago (Aug. 1, 1999)

Funders 0

None

BibTeX

@article{Wang_1999, title={Effect of Correction of the 3-Fold Astigmatism on HREM Lattice Imaging With Information Below 100 Pm}, volume={5}, ISSN={1431-9276}, url={http://dx.doi.org/10.1017/s1431927600017438}, DOI={10.1017/s1431927600017438}, number={S2}, journal={Microscopy and Microanalysis}, publisher={Oxford University Press (OUP)}, author={Wang, YC and Fitzgerald, A and Nelson, EC and Song, C and O’Keefe, MA and Kisielowski, C}, year={1999}, month=aug, pages={822–823} }

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