DOI: 10.1017/s0424820100110271. Combined TEM, FIM, atom probe analysis of a nickel based superalloy

Combined TEM, FIM, atom probe analysis of a nickel based superalloy

10.1017/s0424820100110271

Crossref journal-article

Cambridge University Press (CUP)

Proceedings, annual meeting, Electron Microscopy Society of America (56)

Abstract

We have recently reported the first combined use of electron microscopy (TEM), field ion microscopy (FIM) and Atom Probe microanalysis for the study of alloy element partitioning between the γ and γ' phases in a nickel-based superalloy, IN939 (l). The distribution of the major alloying elements Co, Cr, Al, and Ti was determined, and the ordered structure of the γ' phase was investigated directly by monitoring the nature of the ions field evaporated from successive atom layers of a superlattice plane. In the present paper, we report several extensions to this work, including investigation of the ultra-fine secondary precipitates formed during the final low temperature stage of heat treatment of the alloy, and a study of the detailed composition of the primary carbide phase.The alloy studied was a cast, high-chromium superalloy, supplied by Inco (Europe) Ltd. Research Laboratories. The composition of the alloy (in atomic %) is as follows.

Bibliography

Beaven, P. A., Delargy, K. M., Miller, M. K., & Smith, G. D. W. (1978). Combined TEM, FIM, atom probe analysis of a nickel based superalloy. Proceedings, Annual Meeting, Electron Microscopy Society of America, 36(1), 626â627.

Authors 4

P.A. Beaven (first)
K.M. Delargy (additional)
M.K. Miller (additional)
G.D.W. Smith (additional)

References 4 Referenced 3

10.1016/0025-5416(74)90135-9
1. Beaven, P.A. , Miller, M.K. and G. Smith, D.W. , Proc. Inst, of Phys. EMAG Conf.,(1977)199
10.1179/msc.1977.11.10.474
2. Miller, M.K. , D.Phil. Thesis, Oxford University, (1977).

Dates

Type	When
Created	5 years, 2 months ago (June 18, 2020, 8:35 a.m.)
Deposited	5 years, 2 months ago (June 18, 2020, 9:07 a.m.)
Indexed	3 years, 4 months ago (April 3, 2022, 3:22 p.m.)
Issued	47 years, 7 months ago (Jan. 1, 1978)
Published	47 years, 7 months ago (Jan. 1, 1978)
Published Online	5 years, 2 months ago (June 18, 2020)
Published Print	47 years, 7 months ago (Jan. 1, 1978)

Funders 0

None

BibTeX

@article{Beaven_1978, title={Combined TEM, FIM, atom probe analysis of a nickel based superalloy}, volume={36}, ISSN={2690-1315}, url={http://dx.doi.org/10.1017/s0424820100110271}, DOI={10.1017/s0424820100110271}, number={1}, journal={Proceedings, annual meeting, Electron Microscopy Society of America}, publisher={Cambridge University Press (CUP)}, author={Beaven, P.A. and Delargy, K.M. and Miller, M.K. and Smith, G.D.W.}, year={1978}, pages={626–627} }

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