DOI: 10.1016/j.ultramic.2019.112921. Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks

Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks

10.1016/j.ultramic.2019.112921

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Zhang, C., Feng, J., DaCosta, L. R., & Voyles, Paul. M. (2020). Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks. Ultramicroscopy, 210, 112921.

Authors 4

Chenyu Zhang (first)
Jie Feng (additional)
Luis Rangel DaCosta (additional)
Paul.M. Voyles (additional)

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Dates

Type	When
Created	5 years, 8 months ago (Dec. 23, 2019, 1:01 p.m.)
Deposited	4 years, 4 months ago (April 17, 2021, 11:38 a.m.)
Indexed	3 months ago (May 27, 2025, 9:27 a.m.)
Issued	5 years, 5 months ago (March 1, 2020)
Published	5 years, 5 months ago (March 1, 2020)
Published Print	5 years, 5 months ago (March 1, 2020)

Funders 2

National Science Foundation 10.13039/100000001
Region: Americas
gov (National government)
Labels4
1. U.S. National Science Foundation
2. NSF
3. US NSF
4. USA NSF
U.S. Department of Energy 10.13039/100000015
Region: Americas
gov (National government)
Labels8
1. Energy Department
2. Department of Energy
3. United States Department of Energy
4. ENERGY.GOV
5. US Department of Energy
6. USDOE
7. DOE
8. USADOE

BibTeX

@article{Zhang_2020, title={Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks}, volume={210}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2019.112921}, DOI={10.1016/j.ultramic.2019.112921}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zhang, Chenyu and Feng, Jie and DaCosta, Luis Rangel and Voyles, Paul.M.}, year={2020}, month=mar, pages={112921} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        5,
        27
      ]
    ],
    "date-time": "2025-05-27T13:27:02Z",
    "timestamp": 1748352422977,
    "version": "3.37.3"
  },
  "reference-count": 60,
  "publisher": "Elsevier BV",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2020,
            3,
            1
          ]
        ],
        "date-time": "2020-03-01T00:00:00Z",
        "timestamp": 1583020800000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    },
    {
      "start": {
        "date-parts": [
          [
            2021,
            1,
            21
          ]
        ],
        "date-time": "2021-01-21T00:00:00Z",
        "timestamp": 1611187200000
      },
      "content-version": "am",
      "delay-in-days": 326,
      "URL": "http://www.elsevier.com/open-access/userlicense/1.0/"
    }
  ],
  "funder": [
    {
      "DOI": "10.13039/100000001",
      "name": "National Science Foundation",
      "doi-asserted-by": "publisher",
      "id": [
        {
          "id": "10.13039/100000001",
          "id-type": "DOI",
          "asserted-by": "publisher"
        }
      ]
    },
    {
      "DOI": "10.13039/100000015",
      "name": "U.S. Department of Energy",
      "doi-asserted-by": "publisher",
      "id": [
        {
          "id": "10.13039/100000015",
          "id-type": "DOI",
          "asserted-by": "publisher"
        }
      ]
    }
  ],
  "content-domain": {
    "domain": [
      "elsevier.com",
      "sciencedirect.com"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2020,
        3
      ]
    ]
  },
  "DOI": "10.1016/j.ultramic.2019.112921",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2019,
        12,
        23
      ]
    ],
    "date-time": "2019-12-23T18:01:35Z",
    "timestamp": 1577124095000
  },
  "page": "112921",
  "update-policy": "https://doi.org/10.1016/elsevier_cm_policy",
  "source": "Crossref",
  "is-referenced-by-count": 34,
  "special_numbering": "C",
  "title": "Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks",
  "prefix": "10.1016",
  "volume": "210",
  "author": [
    {
      "given": "Chenyu",
      "family": "Zhang",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Jie",
      "family": "Feng",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Luis Rangel",
      "family": "DaCosta",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Paul.M.",
      "family": "Voyles",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0001",
      "doi-asserted-by": "crossref",
      "first-page": "721",
      "DOI": "10.1016/S0091-679X(06)79028-8",
      "article-title": "Future directions for camera systems in electron microscopy",
      "volume": "79",
      "author": "Xuong",
      "year": "2007",
      "journal-title": "Methods Cell Biol."
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0002",
      "doi-asserted-by": "crossref",
      "first-page": "352",
      "DOI": "10.1016/j.jsb.2007.10.007",
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      "doi-asserted-by": "crossref",
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      "key": "10.1016/j.ultramic.2019.112921_bib0006",
      "doi-asserted-by": "crossref",
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      "DOI": "10.1016/j.ultramic.2014.10.013",
      "article-title": "Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions",
      "volume": "151",
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      "year": "2015",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0007",
      "doi-asserted-by": "crossref",
      "first-page": "160",
      "DOI": "10.1016/j.ultramic.2014.09.013",
      "article-title": "Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution",
      "volume": "151",
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      "year": "2015",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0008",
      "article-title": "Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy",
      "author": "M\u00fcller-Caspary",
      "year": "2016",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0009",
      "doi-asserted-by": "crossref",
      "DOI": "10.1063/1.4922994",
      "article-title": "Strain mapping at nanometer resolution using advanced nano-beam electron diffraction",
      "volume": "106",
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      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0010",
      "doi-asserted-by": "crossref",
      "first-page": "170",
      "DOI": "10.1016/j.ultramic.2016.12.021",
      "article-title": "Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping",
      "volume": "176",
      "author": "Pekin",
      "year": "2017",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0011",
      "doi-asserted-by": "crossref",
      "first-page": "1502",
      "DOI": "10.1021/acs.accounts.7b00123",
      "article-title": "Direct visualization of local electromagnetic field structures by scanning transmission electron microscopy",
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      "author": "Shibata",
      "year": "2017",
      "journal-title": "Acc. Chem. Res."
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0012",
      "doi-asserted-by": "crossref",
      "DOI": "10.1038/srep35880",
      "article-title": "Jointed magnetic skyrmion lattices at a small-angle grain boundary directly visualized by advanced electron microscopy",
      "volume": "6",
      "author": "Matsumoto",
      "year": "2016",
      "journal-title": "Sci. Rep."
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0013",
      "doi-asserted-by": "crossref",
      "first-page": "189",
      "DOI": "10.1016/j.ultramic.2018.09.005",
      "article-title": "Direct determination of structural heterogeneity in metallic glasses using four-dimensional scanning transmission electron microscopy",
      "volume": "195",
      "author": "Im",
      "year": "2018",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0014",
      "doi-asserted-by": "crossref",
      "first-page": "118",
      "DOI": "10.1016/j.ultramic.2009.10.001",
      "article-title": "Position averaged convergent beam electron diffraction: theory and applications",
      "volume": "110",
      "author": "LeBeau",
      "year": "2010",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2019.112921_bib0015",
      "doi-asserted-by": "crossref",
      "DOI": "10.1063/1.3549300",
      "article-title": "Determining ferroelectric polarity at the nanoscale",
      "volume": "98",
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      "doi-asserted-by": "crossref",
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      "doi-asserted-by": "crossref",
      "first-page": "0",
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      "article-title": "Non-spectroscopic composition measurements of SrTiO3\u2013La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction",
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    {
      "key": "10.1016/j.ultramic.2019.112921_bib0018",
      "doi-asserted-by": "crossref",
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      "doi-asserted-by": "crossref",
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      "doi-asserted-by": "crossref",
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  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399119303511?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399119303511?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2021,
        4,
        17
      ]
    ],
    "date-time": "2021-04-17T15:38:12Z",
    "timestamp": 1618673892000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0304399119303511"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2020,
        3
      ]
    ]
  },
  "references-count": 60,
  "alternative-id": [
    "S0304399119303511"
  ],
  "URL": "http://dx.doi.org/10.1016/j.ultramic.2019.112921",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        2020,
        3
      ]
    ]
  },
  "assertion": [
    {
      "value": "Elsevier",
      "name": "publisher",
      "label": "This article is maintained by"
    },
    {
      "value": "Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks",
      "name": "articletitle",
      "label": "Article Title"
    },
    {
      "value": "Ultramicroscopy",
      "name": "journaltitle",
      "label": "Journal Title"
    },
    {
      "value": "https://doi.org/10.1016/j.ultramic.2019.112921",
      "name": "articlelink",
      "label": "CrossRef DOI link to publisher maintained version"
    },
    {
      "value": "article",
      "name": "content_type",
      "label": "Content Type"
    },
    {
      "value": "\u00a9 2020 Elsevier B.V. All rights reserved.",
      "name": "copyright",
      "label": "Copyright"
    }
  ],
  "article-number": "112921"
}