DOI: 10.1016/j.ultramic.2016.12.021. Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

10.1016/j.ultramic.2016.12.021

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Pekin, T. C., Gammer, C., Ciston, J., Minor, A. M., & Ophus, C. (2017). Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping. Ultramicroscopy, 176, 170â176.

Authors 5

Thomas C. Pekin (first)
Christoph Gammer (additional)
Jim Ciston (additional)
Andrew M. Minor (additional)
Colin Ophus (additional)

References 26 Referenced 77

10.1109/TED.2006.872912 / IEEE Trans. Electron Devices / Fundamentals of silicon material properties for successful exploitation of strain engineering in modern CMOS manufacturing by Chidambaram (2006)
10.1016/j.ultramic.2013.03.014 / Ultramicroscopy / Strain measurement at the nanoscale: comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography by Béché (2013)
10.1016/0304-3991(93)90234-O / Ultramicroscopy / Direct measurement of local lattice distortions in strained layer structures by hrem by Bierwolf (1993)
10.1107/S0909049502021362 / J. Synchrotron. Radiat. / Scanning x-ray microdiffraction with submicrometer white beam for strain/stress and orientation mapping in thin films by Tamura (2003)
10.1007/s11340-012-9685-2 / Exp. Mech. / Plastic strain mapping with sub-micron resolution using digital image correlation by Di Gioacchino (2013)
10.1179/026708301101509980 / Mater. Sci. Technol. / Residual stress. part 1-measurement techniques by Withers (2001)
10.1063/1.3337090 / Appl. Phys. Lett. / An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices by Koch (2010)
10.1017/S1431927612001274 / Microsc. Microanal. / Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy by Müller (2012)
10.1016/j.ultramic.2011.01.035 / Ultramicroscopy / Evaluation of two-dimensional strain distribution by stem/nbd by Uesugi (2011)
10.1063/1.3224886 / Appl. Phys. Lett. / Improved precision in strain measurement using nanobeam electron diffraction by Béché (2009)
10.1063/1.4922994 / Appl. Phys. Lett. / Strain mapping at nanometer resolution using advanced nano-beam electron diffraction by Ozdol (2015)
10.1016/j.micron.2015.09.001 / Micron / Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope by Cooper (2016)
O. Panova, X.C. Chen, K.C. Bustillo, C. Ophus, M.P. Bhatt, N. Balsara, A.M. Minor, Orientation Mapping of Semicrystalline Polymers Using Scanning Electron Nanobeam Diffraction, Micron.
10.1063/1.4901435 / Appl. Phys. Lett. / Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera by Vigouroux (2014)
10.1063/1.4829154 / Appl. Phys. Lett. / Improved strain precision with high spatial resolution using nanobeam precession electron diffraction by Rouviere (2013)
{'issue': '605', 'key': '10.1016/j.ultramic.2016.12.021_bib16', 'first-page': '428', 'article-title': 'The reflection of x-rays by crystals, proceedings of the royal society of london', 'volume': '88', 'author': 'Bragg', 'year': '1913', 'journal-title': 'Ser. A, Contain. Pap. A Math. Phys. Character'} / Ser. A, Contain. Pap. A Math. Phys. Character / The reflection of x-rays by crystals, proceedings of the royal society of london by Bragg (1913)
10.1016/0734-189X(86)90028-9 / Graph., Image Process. / Algorithms for subpixel registration, Computer Vision by Tian (1986)
10.1364/OL.33.000156 / Opt. Lett. / Efficient subpixel image registration algorithms by Guizar-Sicairos (2008)
{'issue': '8', 'key': '10.1016/j.ultramic.2016.12.021_bib19', 'first-page': '1925', 'article-title': 'High-accuracy subpixel image registration based on phase-only correlation', 'volume': '86', 'author': 'Takita', 'year': '2003', 'journal-title': 'IEICE Trans. Fundam. Electron., Commun. Comput. Sci.'} / IEICE Trans. Fundam. Electron., Commun. Comput. Sci. / High-accuracy subpixel image registration based on phase-only correlation by Takita (2003)
10.1109/42.585765 / IEEE Trans. Med. Imaging / A rapid and automatic image registration algorithm with subpixel accuracy by Althof (1997)
10.1063/1.4767655 / Appl. Phys. Lett. / Scanning transmission electron microscopy strain measurement from millisecond frames of a direct electron charge coupled device by Müller (2012)
10.1016/j.ultramic.2015.06.011 / Ultramicroscopy / Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction by Mahr (2015)
10.1016/j.rse.2010.08.012 / Remote Sens. Environ. / Sub-pixel precision image matching for measuring surface displacements on mass movements using normalized cross-correlation by Debella-Gilo (2011)
S.S. Gleason, M.A. Hunt, W.B. Jatko, Subpixel measurement of image features based on paraboloid surface fit, in: Fibers' 91, Boston, MA, International Society for Optics and Photonics, 1991, pp. 135–144. (10.1117/12.25387)
10.1016/j.compeleceng.2012.04.005 / Comput. Electr. Eng. / Local upsampling fourier transform for accurate 2d/3d image registration by Wang (2012)
10.1016/j.ultramic.2016.03.006 / Ultramicroscopy / Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast by Krajnak (2016)

Dates

Type	When
Created	8 years, 7 months ago (Jan. 28, 2017, 3:46 a.m.)
Deposited	1 year, 5 months ago (April 6, 2024, 12:44 p.m.)
Indexed	2 weeks, 1 day ago (Aug. 23, 2025, 1:14 a.m.)
Issued	8 years, 4 months ago (May 1, 2017)
Published	8 years, 4 months ago (May 1, 2017)
Published Print	8 years, 4 months ago (May 1, 2017)

Funders 3

Office of Science, Office of Basic Energy Sciences, Materials Sciences and Engineering Division, of the U.S. Department of Energy 10.13039/100006151 Basic Energy Sciences
Region: Americas
gov (National government)
Labels6
1. Office of Basic Energy Sciences
2. DOE Office of Basic Energy Sciences
3. US Department of Energy's Basic Energy Sciences
4. DOE Basic Energy Sciences
5. Department of Energy Basic Energy Sciences Program
6. BES
Awards1
1. DE-AC02-05-CH11231
Austrian Science Fund (FWF) 10.13039/501100002428 Austrian Science Fund
Region: Europe
gov (National government)
Labels8
1. Fonds zur Förderung der Wissenschaftlichen Forschung
2. FWF Der Wissenschaftsfonds
3. FWF Austrian Science Fund
4. Der Wissenschaftsfonds FWF
5. Österreichischer Wissenschaftsfonds
6. FWF
7. FFWF
8. FWF EN
Awards1
1. J3397
Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy 10.13039/100006151 Basic Energy Sciences
Region: Americas
gov (National government)
Labels6
1. Office of Basic Energy Sciences
2. DOE Office of Basic Energy Sciences
3. US Department of Energy's Basic Energy Sciences
4. DOE Basic Energy Sciences
5. Department of Energy Basic Energy Sciences Program
6. BES
Awards1
1. DE-AC02-05CH11231

BibTeX

@article{Pekin_2017, title={Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping}, volume={176}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2016.12.021}, DOI={10.1016/j.ultramic.2016.12.021}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Pekin, Thomas C. and Gammer, Christoph and Ciston, Jim and Minor, Andrew M. and Ophus, Colin}, year={2017}, month=may, pages={170–176} }

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