DOI: 10.1016/j.ultramic.2016.08.018. StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images

10.1016/j.ultramic.2016.08.018

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

De Backer, A., van den Bos, K. H. W., Van den Broek, W., Sijbers, J., & Van Aert, S. (2016). StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images. Ultramicroscopy, 171, 104â116.

Authors 5

A. De Backer (first)
K.H.W. van den Bos (additional)
W. Van den Broek (additional)
J. Sijbers (additional)
S. Van Aert (additional)

References 48 Referenced 222

10.1016/j.ultramic.2005.03.001 / Ultramicroscopy / Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework by den Dekker (2005)
10.1016/j.ultramic.2005.03.002 / Ultramicroscopy / Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: Part II: A practical example by Van Aert (2005)
10.1016/S1076-5670(02)80062-3 / Adv. Imaging Electron Phys. / High-resolution electron microscopy by Van Dyck (2002)
{'key': '10.1016/j.ultramic.2016.08.018_bib4', 'first-page': '65', 'article-title': 'Scanning transmission electron microscopy', 'volume': 'vol. 1', 'author': 'Nellist', 'year': '2007'} / Scanning transmission electron microscopy by Nellist (2007)
10.1103/PhysRevLett.96.096106 / Phys. Rev. Lett. / Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range by Bals (2006)
10.1016/j.ultramic.2005.07.009 / Ultramicroscopy / Atomic-precision determination of the reconstruction of a 90° tilt boundary in YBa2Cu3O7−δ by aberration corrected HRTEM by Houben (2006)
10.1038/nmat2080 / Nat. Mater. / Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films by Jia (2008)
10.1126/science.1152800 / Science / Studying atomic structures by aberration-corrected transmission electron microscopy by Urban (2008)
10.1016/j.ultramic.2008.10.024 / Ultramicroscopy / Effect of amorphous layers on the interpretation of restored exit waves by Van Aert (2009)
10.1016/j.ultramic.2011.07.002 / Ultramicroscopy / High precision measurements of atom column positions using model-based exit wave reconstruction by De Backer (2011)
10.1524/zkri.2012.1517 / Z. Krist. / Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x 0.11) by Klingstedt (2012)
10.1016/j.micron.2011.10.019 / Micron / Model-based electron microscopy: from images toward precise numbers for unknown structure parameters by Van Aert (2012)
10.1038/nmat1675 / Nat. Mater. / Electronically coupled complementary interfaces between perovskite band insulators by Huijben (2006)
10.1016/j.ultramic.2009.11.014 / Ultramicroscopy / Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy by Kimoto (2010)
10.1038/nmat3393 / Nat. Mater. / Probing oxygen vacancy concentration and homogeneity in solid-oxide fuell-cell cathode materials on the subunit-cell level by Kim (2012)
10.1038/ncomms5155 / Nat. Commun. / Voy, Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts by Yankovich (2014)
10.1016/j.ultramic.2009.05.010 / Ultramicroscopy / Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy by Van Aert (2009)
10.1038/nature09741 / Nature / Three-dimensional atomic imaging of crystalline nanoparticles by Van Aert (2011)
S. Van Aert, A. De Backer, G.T. Martinez, B. Goris, S. Bals, G. Van Tendeloo, Procedure to count atoms with trustworthy single-atom sensitivity, Physical Review B, 87, pp. 064107. (10.1103/PhysRevB.87.064107)
10.1016/j.ultramic.2013.11.001 / Ultramicroscopy / Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy by Martinez (2014)
10.1016/j.ultramic.2013.05.003 / Ultramicroscopy / Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations by De Backer (2013)
10.1016/j.ultramic.2014.11.028 / Ultramicroscopy / Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting by De Backer (2015)
10.1107/S2052252515019727 / IUCrJ / Advanced electron crystallography through model-based imaging by Van Aert (2016)
[link] URL 〈http://www.gnu.org/licenses/gpl.html〉.
10.1021/nl401945b / Nano Lett. / Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals by Goris (2013)
10.1021/acs.nanolett.5b03008 / Nano Lett. / Measuring lattice strain in three dimensions through electron microscopy by Goris (2015)
10.1103/PhysRevLett.116.246101 / Phys. Rev. Lett. / Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy by van den Bos (2016)
10.1016/j.ultramic.2011.04.009 / Ultramicroscopy / Composition mapping in InGaN by scanning transmission electron microscopy by Rosenauer (2011)
10.1063/1.4799382 / Appl. Phys. Lett. / Measurement of the indium concentration in high indium content ingan layers by scanning transmission electron microscopy and atom probe tomography by Mehrtens (2013)
H. E, K.E. MacArthur, T.J. Pennycook, E. Okunishi, A.J. D′Alfonso, N.R. Lugg, L.J. Allen, P.D. a. Nellist, Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images, Ultramicroscopy, vol. 133, 2013, pp. 109–119. (10.1016/j.ultramic.2013.07.002)
10.1021/nl502762m / Nano Lett. / Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopy by Jones (2014)
10.1016/j.ultramic.2013.05.017 / Ultramicroscopy / Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits? by den Dekker (2013)
10.1080/00401706.1971.10488810 / Technometrics / Elimination of linear parameters in nonlinear regression by Lawton (1971)
10.1137/S1052623496303470 / SIAM J. Optim. / Convergence properties of the Nelder-Mead simplex method in low dimension by Lagarias (1998)
10.1016/S1076-5670(01)80114-2 / Adv. Imaging Electron Phys. / Resolution reconsidered – conventional approaches and an alternative by van den Bos (2001)
10.1016/S0304-3991(01)00145-0 / Ultramicroscopy / A practical approach for STEM image simulation based on the FFT multislice method by Ishizuka (2002)
{'key': '10.1016/j.ultramic.2016.08.018_bib37', 'first-page': '170', 'article-title': 'STEMSIM - a new software tool for simulation of STEM HAADF Z-contrast imaging', 'volume': 'vol. 120', 'author': 'Rosenauer', 'year': '2008'} / STEMSIM - a new software tool for simulation of STEM HAADF Z-contrast imaging by Rosenauer (2008)
10.1016/j.ultramic.2009.05.003 / Ultramicroscopy / Measurement of specimen thickness and composition in AlxGa1−xN/GaN using high-angle annular dark field images by Rosenauer (2009)
10.1107/S0108767399005176 / Acta Crystallogr. A / Parameterization of the temperature dependence of the Debye-Waller factors by Gao (1999)
10.1093/jmicro/dfp052 / J. Electron Microsc. / High-resolution low-dose scanning transmission electron microscopy by Buban (2010)
10.1017/S1431927613001402 / Microsc. Microanal. / Identifying and correcting scan noise and drift in the scanning transmission electron microscope by Jones (2013)
10.1021/la900393v / Langmuir / Image analysis with rapid and accurate two-dimensional Gaussian fitting by Anthony (2009)
10.1016/j.ultramic.2016.06.001 / Ultramicroscopy / Oxygen octahedra picker: a software tool to extract quantitative information from STEM images by Wang (2016)
10.1016/j.ultramic.2014.10.015 / Ultramicroscopy / Optimal experimental design for nano-particle atom-counting from high-resolution STEM images by De Backer (2015)
〈https://github.com/quantitativeTEM/StatSTEM〉.
{'key': '10.1016/j.ultramic.2016.08.018_bib46', 'first-page': '331', 'volume': 'vol. 1', 'author': 'van den Bos', 'year': '1982'} by van den Bos (1982)
{'key': '10.1016/j.ultramic.2016.08.018_bib47', 'year': '1998'} (1998)
{'key': '10.1016/j.ultramic.2016.08.018_bib48', 'series-title': 'Parameter Estimation for Scientists and Engineers', 'author': 'van den Bos', 'year': '2007'} / Parameter Estimation for Scientists and Engineers by van den Bos (2007)

Dates

Type	When
Created	8 years, 11 months ago (Sept. 9, 2016, 3:58 p.m.)
Deposited	6 years, 11 months ago (Sept. 8, 2018, 12:20 p.m.)
Indexed	1 day ago (Aug. 20, 2025, 8:32 a.m.)
Issued	8 years, 8 months ago (Dec. 1, 2016)
Published	8 years, 8 months ago (Dec. 1, 2016)
Published Print	8 years, 8 months ago (Dec. 1, 2016)

Funders 2

Research Foundation Flanders 10.13039/501100003130 Fonds Wetenschappelijk Onderzoek
Region: Europe
gov (Local government)
Labels3
1. Research Foundation Flanders
2. Flemish Research Foundation
3. FWO
Awards3
1. G.0374.13
2. G.0393.11
3. G.0064.10
European Union Seventh Framework Programme 10.13039/100011102 Seventh Framework Programme
Region: Europe
gov (National government)
Labels13
1. EC Seventh Framework Programm
2. European Commission Seventh Framework Programme
3. EU Seventh Framework Programme
4. European Union Seventh Framework Programme
5. EU 7th Framework Programme
6. European Union 7th Framework Programme
7. Siebten Rahmenprogramm
8. Séptimo Programa Marco
9. Septième programme-cadre
10. Settimo programma quadro
11. 7th Framework Programme
12. Seventh EU Framework Programme
13. FP7
Awards1
1. 312483

BibTeX

@article{De_Backer_2016, title={StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images}, volume={171}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2016.08.018}, DOI={10.1016/j.ultramic.2016.08.018}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={De Backer, A. and van den Bos, K.H.W. and Van den Broek, W. and Sijbers, J. and Van Aert, S.}, year={2016}, month=dec, pages={104–116} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        20
      ]
    ],
    "date-time": "2025-08-20T12:32:16Z",
    "timestamp": 1755693136350
  },
  "reference-count": 48,
  "publisher": "Elsevier BV",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2016,
            12,
            1
          ]
        ],
        "date-time": "2016-12-01T00:00:00Z",
        "timestamp": 1480550400000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "funder": [
    {
      "DOI": "10.13039/501100003130",
      "name": "Research Foundation Flanders",
      "doi-asserted-by": "crossref",
      "award": [
        "G.0393.11",
        "G.0064.10",
        "G.0374.13"
      ],
      "id": [
        {
          "id": "10.13039/501100003130",
          "id-type": "DOI",
          "asserted-by": "crossref"
        }
      ]
    },
    {
      "DOI": "10.13039/100011102",
      "name": "European Union Seventh Framework Programme",
      "doi-asserted-by": "crossref",
      "award": [
        "312483"
      ],
      "id": [
        {
          "id": "10.13039/100011102",
          "id-type": "DOI",
          "asserted-by": "crossref"
        }
      ]
    }
  ],
  "content-domain": {
    "domain": [
      "elsevier.com",
      "sciencedirect.com"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2016,
        12
      ]
    ]
  },
  "DOI": "10.1016/j.ultramic.2016.08.018",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2016,
        9,
        9
      ]
    ],
    "date-time": "2016-09-09T19:58:12Z",
    "timestamp": 1473451092000
  },
  "page": "104-116",
  "update-policy": "http://dx.doi.org/10.1016/elsevier_cm_policy",
  "source": "Crossref",
  "is-referenced-by-count": 222,
  "special_numbering": "C",
  "title": "StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images",
  "prefix": "10.1016",
  "volume": "171",
  "author": [
    {
      "given": "A.",
      "family": "De Backer",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "K.H.W.",
      "family": "van den Bos",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "W.",
      "family": "Van den Broek",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "J.",
      "family": "Sijbers",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "S.",
      "family": "Van Aert",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib1",
      "doi-asserted-by": "crossref",
      "first-page": "83",
      "DOI": "10.1016/j.ultramic.2005.03.001",
      "article-title": "Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework",
      "volume": "104",
      "author": "den Dekker",
      "year": "2005",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib2",
      "doi-asserted-by": "crossref",
      "first-page": "107",
      "DOI": "10.1016/j.ultramic.2005.03.002",
      "article-title": "Maximum likelihood estimation of structure parameters from high resolution electron microscopy images: Part II: A practical example",
      "volume": "104",
      "author": "Van Aert",
      "year": "2005",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib3",
      "doi-asserted-by": "crossref",
      "first-page": "105",
      "DOI": "10.1016/S1076-5670(02)80062-3",
      "article-title": "High-resolution electron microscopy",
      "volume": "123",
      "author": "Van Dyck",
      "year": "2002",
      "journal-title": "Adv. Imaging Electron Phys."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib4",
      "first-page": "65",
      "article-title": "Scanning transmission electron microscopy",
      "volume": "vol. 1",
      "author": "Nellist",
      "year": "2007"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib5",
      "doi-asserted-by": "crossref",
      "first-page": "096106",
      "DOI": "10.1103/PhysRevLett.96.096106",
      "article-title": "Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range",
      "volume": "96",
      "author": "Bals",
      "year": "2006",
      "journal-title": "Phys. Rev. Lett."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib6",
      "doi-asserted-by": "crossref",
      "first-page": "200",
      "DOI": "10.1016/j.ultramic.2005.07.009",
      "article-title": "Atomic-precision determination of the reconstruction of a 90\u00b0 tilt boundary in YBa2Cu3O7\u2212\u03b4 by aberration corrected HRTEM",
      "volume": "106",
      "author": "Houben",
      "year": "2006",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib7",
      "doi-asserted-by": "crossref",
      "first-page": "57",
      "DOI": "10.1038/nmat2080",
      "article-title": "Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films",
      "volume": "7",
      "author": "Jia",
      "year": "2008",
      "journal-title": "Nat. Mater."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib8",
      "doi-asserted-by": "crossref",
      "first-page": "506",
      "DOI": "10.1126/science.1152800",
      "article-title": "Studying atomic structures by aberration-corrected transmission electron microscopy",
      "volume": "321",
      "author": "Urban",
      "year": "2008",
      "journal-title": "Science"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib9",
      "doi-asserted-by": "crossref",
      "first-page": "237",
      "DOI": "10.1016/j.ultramic.2008.10.024",
      "article-title": "Effect of amorphous layers on the interpretation of restored exit waves",
      "volume": "109",
      "author": "Van Aert",
      "year": "2009",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib10",
      "doi-asserted-by": "crossref",
      "first-page": "1475",
      "DOI": "10.1016/j.ultramic.2011.07.002",
      "article-title": "High precision measurements of atom column positions using model-based exit wave reconstruction",
      "volume": "111",
      "author": "De Backer",
      "year": "2011",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib11",
      "doi-asserted-by": "crossref",
      "first-page": "341",
      "DOI": "10.1524/zkri.2012.1517",
      "article-title": "Exit wave reconstruction from focal series of HRTEM images, single crystal XRD and total energy studies on SbxWO3+y (x 0.11)",
      "volume": "227",
      "author": "Klingstedt",
      "year": "2012",
      "journal-title": "Z. Krist."
    },
    {
      "issue": "4",
      "key": "10.1016/j.ultramic.2016.08.018_bib12",
      "doi-asserted-by": "crossref",
      "first-page": "509",
      "DOI": "10.1016/j.micron.2011.10.019",
      "article-title": "Model-based electron microscopy: from images toward precise numbers for unknown structure parameters",
      "volume": "43",
      "author": "Van Aert",
      "year": "2012",
      "journal-title": "Micron"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib13",
      "doi-asserted-by": "crossref",
      "first-page": "556",
      "DOI": "10.1038/nmat1675",
      "article-title": "Electronically coupled complementary interfaces between perovskite band insulators",
      "volume": "5",
      "author": "Huijben",
      "year": "2006",
      "journal-title": "Nat. Mater."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib14",
      "doi-asserted-by": "crossref",
      "first-page": "778",
      "DOI": "10.1016/j.ultramic.2009.11.014",
      "article-title": "Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy",
      "volume": "110",
      "author": "Kimoto",
      "year": "2010",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib15",
      "doi-asserted-by": "crossref",
      "first-page": "888",
      "DOI": "10.1038/nmat3393",
      "article-title": "Probing oxygen vacancy concentration and homogeneity in solid-oxide fuell-cell cathode materials on the subunit-cell level",
      "volume": "11",
      "author": "Kim",
      "year": "2012",
      "journal-title": "Nat. Mater."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib16",
      "doi-asserted-by": "crossref",
      "first-page": "4155",
      "DOI": "10.1038/ncomms5155",
      "article-title": "Voy, Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts",
      "volume": "5",
      "author": "Yankovich",
      "year": "2014",
      "journal-title": "Nat. Commun."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib17",
      "doi-asserted-by": "crossref",
      "first-page": "1236",
      "DOI": "10.1016/j.ultramic.2009.05.010",
      "article-title": "Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy",
      "volume": "109",
      "author": "Van Aert",
      "year": "2009",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib18",
      "doi-asserted-by": "crossref",
      "first-page": "374",
      "DOI": "10.1038/nature09741",
      "article-title": "Three-dimensional atomic imaging of crystalline nanoparticles",
      "volume": "470",
      "author": "Van Aert",
      "year": "2011",
      "journal-title": "Nature"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib19",
      "doi-asserted-by": "crossref",
      "unstructured": "S. Van Aert, A. De Backer, G.T. Martinez, B. Goris, S. Bals, G. Van Tendeloo, Procedure to count atoms with trustworthy single-atom sensitivity, Physical Review B, 87, pp. 064107.",
      "DOI": "10.1103/PhysRevB.87.064107"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib20",
      "doi-asserted-by": "crossref",
      "first-page": "12",
      "DOI": "10.1016/j.ultramic.2013.11.001",
      "article-title": "Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy",
      "volume": "137",
      "author": "Martinez",
      "year": "2014",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib21",
      "doi-asserted-by": "crossref",
      "first-page": "23",
      "DOI": "10.1016/j.ultramic.2013.05.003",
      "article-title": "Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations",
      "volume": "134",
      "author": "De Backer",
      "year": "2013",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib22",
      "doi-asserted-by": "crossref",
      "first-page": "56",
      "DOI": "10.1016/j.ultramic.2014.11.028",
      "article-title": "Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting",
      "volume": "151",
      "author": "De Backer",
      "year": "2015",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib23",
      "doi-asserted-by": "crossref",
      "first-page": "71",
      "DOI": "10.1107/S2052252515019727",
      "article-title": "Advanced electron crystallography through model-based imaging",
      "volume": "3",
      "author": "Van Aert",
      "year": "2016",
      "journal-title": "IUCrJ"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib24",
      "unstructured": "[link] URL \u3008http://www.gnu.org/licenses/gpl.html\u3009."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib25",
      "doi-asserted-by": "crossref",
      "first-page": "4236",
      "DOI": "10.1021/nl401945b",
      "article-title": "Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals",
      "volume": "13",
      "author": "Goris",
      "year": "2013",
      "journal-title": "Nano Lett."
    },
    {
      "issue": "10",
      "key": "10.1016/j.ultramic.2016.08.018_bib26",
      "doi-asserted-by": "crossref",
      "first-page": "6996",
      "DOI": "10.1021/acs.nanolett.5b03008",
      "article-title": "Measuring lattice strain in three dimensions through electron microscopy",
      "volume": "15",
      "author": "Goris",
      "year": "2015",
      "journal-title": "Nano Lett."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib27",
      "doi-asserted-by": "crossref",
      "first-page": "246101",
      "DOI": "10.1103/PhysRevLett.116.246101",
      "article-title": "Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy",
      "volume": "116",
      "author": "van den Bos",
      "year": "2016",
      "journal-title": "Phys. Rev. Lett."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib28",
      "doi-asserted-by": "crossref",
      "first-page": "1316",
      "DOI": "10.1016/j.ultramic.2011.04.009",
      "article-title": "Composition mapping in InGaN by scanning transmission electron microscopy",
      "volume": "111",
      "author": "Rosenauer",
      "year": "2011",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib29",
      "doi-asserted-by": "crossref",
      "first-page": "132112",
      "DOI": "10.1063/1.4799382",
      "article-title": "Measurement of the indium concentration in high indium content ingan layers by scanning transmission electron microscopy and atom probe tomography",
      "volume": "102",
      "author": "Mehrtens",
      "year": "2013",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib30",
      "doi-asserted-by": "crossref",
      "unstructured": "H. E, K.E. MacArthur, T.J. Pennycook, E. Okunishi, A.J. D\u2032Alfonso, N.R. Lugg, L.J. Allen, P.D. a. Nellist, Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images, Ultramicroscopy, vol. 133, 2013, pp. 109\u2013119.",
      "DOI": "10.1016/j.ultramic.2013.07.002"
    },
    {
      "issue": "11",
      "key": "10.1016/j.ultramic.2016.08.018_bib31",
      "doi-asserted-by": "crossref",
      "first-page": "6336",
      "DOI": "10.1021/nl502762m",
      "article-title": "Rapid estimation of catalyst nanoparticle morphology and atomic-coordination by high-resolution Z-contrast electron microscopy",
      "volume": "14",
      "author": "Jones",
      "year": "2014",
      "journal-title": "Nano Lett."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib32",
      "doi-asserted-by": "crossref",
      "first-page": "34",
      "DOI": "10.1016/j.ultramic.2013.05.017",
      "article-title": "Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?",
      "volume": "134",
      "author": "den Dekker",
      "year": "2013",
      "journal-title": "Ultramicroscopy"
    },
    {
      "issue": "3",
      "key": "10.1016/j.ultramic.2016.08.018_bib33",
      "doi-asserted-by": "crossref",
      "first-page": "461",
      "DOI": "10.1080/00401706.1971.10488810",
      "article-title": "Elimination of linear parameters in nonlinear regression",
      "volume": "13",
      "author": "Lawton",
      "year": "1971",
      "journal-title": "Technometrics"
    },
    {
      "issue": "1",
      "key": "10.1016/j.ultramic.2016.08.018_bib34",
      "doi-asserted-by": "crossref",
      "first-page": "112",
      "DOI": "10.1137/S1052623496303470",
      "article-title": "Convergence properties of the Nelder-Mead simplex method in low dimension",
      "volume": "9",
      "author": "Lagarias",
      "year": "1998",
      "journal-title": "SIAM J. Optim."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib35",
      "doi-asserted-by": "crossref",
      "first-page": "241",
      "DOI": "10.1016/S1076-5670(01)80114-2",
      "article-title": "Resolution reconsidered \u2013 conventional approaches and an alternative",
      "volume": "117",
      "author": "van den Bos",
      "year": "2001",
      "journal-title": "Adv. Imaging Electron Phys."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib36",
      "doi-asserted-by": "crossref",
      "first-page": "71",
      "DOI": "10.1016/S0304-3991(01)00145-0",
      "article-title": "A practical approach for STEM image simulation based on the FFT multislice method",
      "volume": "90",
      "author": "Ishizuka",
      "year": "2002",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib37",
      "first-page": "170",
      "article-title": "STEMSIM - a new software tool for simulation of STEM HAADF Z-contrast imaging",
      "volume": "vol. 120",
      "author": "Rosenauer",
      "year": "2008"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib38",
      "doi-asserted-by": "crossref",
      "first-page": "1171",
      "DOI": "10.1016/j.ultramic.2009.05.003",
      "article-title": "Measurement of specimen thickness and composition in AlxGa1\u2212xN/GaN using high-angle annular dark field images",
      "volume": "109",
      "author": "Rosenauer",
      "year": "2009",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib39",
      "doi-asserted-by": "crossref",
      "first-page": "926",
      "DOI": "10.1107/S0108767399005176",
      "article-title": "Parameterization of the temperature dependence of the Debye-Waller factors",
      "volume": "55",
      "author": "Gao",
      "year": "1999",
      "journal-title": "Acta Crystallogr. A"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib40",
      "doi-asserted-by": "crossref",
      "first-page": "103",
      "DOI": "10.1093/jmicro/dfp052",
      "article-title": "High-resolution low-dose scanning transmission electron microscopy",
      "volume": "59",
      "author": "Buban",
      "year": "2010",
      "journal-title": "J. Electron Microsc."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib41",
      "doi-asserted-by": "crossref",
      "first-page": "1050",
      "DOI": "10.1017/S1431927613001402",
      "article-title": "Identifying and correcting scan noise and drift in the scanning transmission electron microscope",
      "volume": "19",
      "author": "Jones",
      "year": "2013",
      "journal-title": "Microsc. Microanal."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib42",
      "doi-asserted-by": "crossref",
      "first-page": "8152",
      "DOI": "10.1021/la900393v",
      "article-title": "Image analysis with rapid and accurate two-dimensional Gaussian fitting",
      "volume": "25",
      "author": "Anthony",
      "year": "2009",
      "journal-title": "Langmuir"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib43",
      "doi-asserted-by": "crossref",
      "first-page": "46",
      "DOI": "10.1016/j.ultramic.2016.06.001",
      "article-title": "Oxygen octahedra picker: a software tool to extract quantitative information from STEM images",
      "volume": "168",
      "author": "Wang",
      "year": "2016",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib44",
      "doi-asserted-by": "crossref",
      "first-page": "46",
      "DOI": "10.1016/j.ultramic.2014.10.015",
      "article-title": "Optimal experimental design for nano-particle atom-counting from high-resolution STEM images",
      "volume": "151",
      "author": "De Backer",
      "year": "2015",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib45",
      "unstructured": "\u3008https://github.com/quantitativeTEM/StatSTEM\u3009."
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib46",
      "first-page": "331",
      "volume": "vol. 1",
      "author": "van den Bos",
      "year": "1982"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib47",
      "year": "1998"
    },
    {
      "key": "10.1016/j.ultramic.2016.08.018_bib48",
      "series-title": "Parameter Estimation for Scientists and Engineers",
      "author": "van den Bos",
      "year": "2007"
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399116301747?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399116301747?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2018,
        9,
        8
      ]
    ],
    "date-time": "2018-09-08T16:20:54Z",
    "timestamp": 1536423654000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0304399116301747"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2016,
        12
      ]
    ]
  },
  "references-count": 48,
  "alternative-id": [
    "S0304399116301747"
  ],
  "URL": "http://dx.doi.org/10.1016/j.ultramic.2016.08.018",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        2016,
        12
      ]
    ]
  },
  "assertion": [
    {
      "value": "Elsevier",
      "name": "publisher",
      "label": "This article is maintained by"
    },
    {
      "value": "StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images",
      "name": "articletitle",
      "label": "Article Title"
    },
    {
      "value": "Ultramicroscopy",
      "name": "journaltitle",
      "label": "Journal Title"
    },
    {
      "value": "https://doi.org/10.1016/j.ultramic.2016.08.018",
      "name": "articlelink",
      "label": "CrossRef DOI link to publisher maintained version"
    },
    {
      "value": "article",
      "name": "content_type",
      "label": "Content Type"
    },
    {
      "value": "\u00a9 2016 Elsevier B.V. All rights reserved.",
      "name": "copyright",
      "label": "Copyright"
    }
  ]
}