DOI: 10.1016/j.ultramic.2013.07.018. Lattice and strain analysis of atomic resolution Z-contrast images based on template matching

Lattice and strain analysis of atomic resolution Z-contrast images based on template matching

10.1016/j.ultramic.2013.07.018

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Zuo, J.-M., Shah, A. B., Kim, H., Meng, Y., Gao, W., & RouviÃ©re, J.-L. (2014). Lattice and strain analysis of atomic resolution Z-contrast images based on template matching. Ultramicroscopy, 136, 50â60.

Authors 6

Jian-Min Zuo (first)
Amish B. Shah (additional)
Honggyu Kim (additional)
Yifei Meng (additional)
Wenpei Gao (additional)
Jean-Luc Rouviére (additional)

References 40 Referenced 80

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Dates

Type	When
Created	12 years ago (Aug. 7, 2013, 9:45 a.m.)
Deposited	6 years, 6 months ago (Feb. 11, 2019, 6:05 a.m.)
Indexed	2 weeks ago (Aug. 6, 2025, 10 a.m.)
Issued	11 years, 7 months ago (Jan. 1, 2014)
Published	11 years, 7 months ago (Jan. 1, 2014)
Published Print	11 years, 7 months ago (Jan. 1, 2014)

Funders 0

None

BibTeX

@article{Zuo_2014, title={Lattice and strain analysis of atomic resolution Z-contrast images based on template matching}, volume={136}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2013.07.018}, DOI={10.1016/j.ultramic.2013.07.018}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zuo, Jian-Min and Shah, Amish B. and Kim, Honggyu and Meng, Yifei and Gao, Wenpei and Rouviére, Jean-Luc}, year={2014}, month=jan, pages={50–60} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        6
      ]
    ],
    "date-time": "2025-08-06T14:00:37Z",
    "timestamp": 1754488837139
  },
  "reference-count": 40,
  "publisher": "Elsevier BV",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2014,
            1,
            1
          ]
        ],
        "date-time": "2014-01-01T00:00:00Z",
        "timestamp": 1388534400000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [
      "elsevier.com",
      "sciencedirect.com"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2014,
        1
      ]
    ]
  },
  "DOI": "10.1016/j.ultramic.2013.07.018",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2013,
        8,
        7
      ]
    ],
    "date-time": "2013-08-07T13:45:36Z",
    "timestamp": 1375883136000
  },
  "page": "50-60",
  "update-policy": "http://dx.doi.org/10.1016/elsevier_cm_policy",
  "source": "Crossref",
  "is-referenced-by-count": 80,
  "special_numbering": "C",
  "title": "Lattice and strain analysis of atomic resolution Z-contrast images based on template matching",
  "prefix": "10.1016",
  "volume": "136",
  "author": [
    {
      "given": "Jian-Min",
      "family": "Zuo",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Amish B.",
      "family": "Shah",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Honggyu",
      "family": "Kim",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Yifei",
      "family": "Meng",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Wenpei",
      "family": "Gao",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Jean-Luc",
      "family": "Rouvi\u00e9re",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib1",
      "doi-asserted-by": "crossref",
      "first-page": "938",
      "DOI": "10.1103/PhysRevLett.64.938",
      "article-title": "High-resolution incoherent imaging of crystals",
      "volume": "64",
      "author": "Pennycook",
      "year": "1990",
      "journal-title": "Physical Review Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib2",
      "doi-asserted-by": "crossref",
      "first-page": "325",
      "DOI": "10.1016/0304-3991(93)90043-W",
      "article-title": "Thickness effects in Adf stem zone-axis images",
      "volume": "52",
      "author": "Hillyard",
      "year": "1993",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib3",
      "doi-asserted-by": "crossref",
      "first-page": "14",
      "DOI": "10.1016/0304-3991(91)90004-P",
      "article-title": "High-resolution Z-contrast imaging of crystals",
      "volume": "37",
      "author": "Pennycook",
      "year": "1991",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib4",
      "series-title": "Scanning Transmission Electron Microscopy",
      "first-page": "117",
      "article-title": "The principles of STEM imaging",
      "author": "Nellist",
      "year": "2011"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib5",
      "doi-asserted-by": "crossref",
      "first-page": "38",
      "DOI": "10.1016/j.ultramic.2012.06.016",
      "article-title": "Study on probe current dependence of the intensity distribution in annular dark field images",
      "volume": "121",
      "author": "Kim",
      "year": "2012",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib6",
      "doi-asserted-by": "crossref",
      "first-page": "206101",
      "DOI": "10.1103/PhysRevLett.100.206101",
      "article-title": "Quantitative atomic resolution scanning transmission electron microscopy",
      "volume": "100",
      "author": "LeBeau",
      "year": "2008",
      "journal-title": "Physical Review Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib7",
      "doi-asserted-by": "crossref",
      "first-page": "4405",
      "DOI": "10.1021/nl102025s",
      "article-title": "Standardless atom counting in scanning transmission electron microscopy",
      "volume": "10",
      "author": "LeBeau",
      "year": "2010",
      "journal-title": "Nano Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib8",
      "series-title": "High-Resolution Electron Microscopy",
      "author": "Spence",
      "year": "2003"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib9",
      "doi-asserted-by": "crossref",
      "first-page": "131",
      "DOI": "10.1016/S0304-3991(98)00035-7",
      "article-title": "Quantitative measurement of displacement and strain fields from HREM micrographs",
      "volume": "74",
      "author": "Hytch",
      "year": "1998",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib10",
      "doi-asserted-by": "crossref",
      "first-page": "1",
      "DOI": "10.1016/j.ultramic.2005.06.001",
      "article-title": "Theoretical discussions on the geometrical phase analysis",
      "volume": "106",
      "author": "Rouviere",
      "year": "2005",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib11",
      "doi-asserted-by": "crossref",
      "first-page": "143126",
      "DOI": "10.1063/1.3243990",
      "article-title": "Accuracy assessment of strain mapping from Z-contrast images of strained nanostructures",
      "volume": "95",
      "author": "Guerrero",
      "year": "2009",
      "journal-title": "Applied Physics Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib12",
      "first-page": "012022",
      "article-title": "Measuring strain on HR-STEM images: application to threading dislocations in Al0.8In0.2N",
      "volume": "326",
      "author": "Rouvi\u00e8re",
      "year": "2011",
      "journal-title": "Journal of Physics: Conference Series"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib13",
      "doi-asserted-by": "crossref",
      "first-page": "261911",
      "DOI": "10.1063/1.3672194",
      "article-title": "Quantitative strain mapping of InAs/InP quantum dots with 1nm spatial resolution using dark field electron holography",
      "volume": "99",
      "author": "Cooper",
      "year": "2011",
      "journal-title": "Applied Physics Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib14",
      "doi-asserted-by": "crossref",
      "first-page": "233121",
      "DOI": "10.1063/1.4723572",
      "article-title": "Strain mapping for the silicon-on-insulator generation of semiconductor devices by high-angle annular dark field scanning electron transmission microscopy",
      "volume": "100",
      "author": "Cooper",
      "year": "2012",
      "journal-title": "Applied Physics Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib15",
      "doi-asserted-by": "crossref",
      "first-page": "124505",
      "DOI": "10.1063/1.4767925",
      "article-title": "Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advanced electron microscopy",
      "volume": "112",
      "author": "Cooper",
      "year": "2012",
      "journal-title": "Journal of Applied Physics"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib16",
      "doi-asserted-by": "crossref",
      "first-page": "1033",
      "DOI": "10.1016/j.ultramic.2006.04.017",
      "article-title": "Room design for high-performance electron microscopy",
      "volume": "106",
      "author": "Muller",
      "year": "2006",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib17",
      "doi-asserted-by": "crossref",
      "first-page": "383",
      "DOI": "10.1093/jmicro/51.6.383",
      "article-title": "Retrieval process of high-resolution HAADF-STEM images",
      "volume": "51",
      "author": "Nakanishi",
      "year": "2002",
      "journal-title": "Journal of Electron Microscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib18",
      "doi-asserted-by": "crossref",
      "first-page": "285",
      "DOI": "10.1016/j.ultramic.2005.01.003",
      "article-title": "IMAGE-WARP: a real-space restoration method for high-resolution STEM images using quantitative HRTEM analysis",
      "volume": "103",
      "author": "Recnik",
      "year": "2005",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib19",
      "doi-asserted-by": "crossref",
      "first-page": "67",
      "DOI": "10.1016/j.ultramic.2012.04.001",
      "article-title": "Correcting scanning instabilities from images of periodic structures",
      "volume": "118",
      "author": "Braidy",
      "year": "2012",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib20",
      "doi-asserted-by": "crossref",
      "first-page": "1236",
      "DOI": "10.1016/j.ultramic.2009.05.010",
      "article-title": "Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy",
      "volume": "109",
      "author": "Van Aert",
      "year": "2009",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib21",
      "doi-asserted-by": "crossref",
      "first-page": "1186",
      "DOI": "10.1016/j.ultramic.2007.01.019",
      "article-title": "The Peak Pairs algorithm for strain mapping from HRTEM images",
      "volume": "107",
      "author": "Galindo",
      "year": "2007",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib22",
      "first-page": "135",
      "article-title": "Lattice distortion analysis directly from high resolution transmission electron microscopy images \u2013 the LADIA program package",
      "volume": "18",
      "author": "Du",
      "year": "2002",
      "journal-title": "Journal of Materials Sciences and Technology"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib23",
      "series-title": "Three-Dimensional Electron Microscopy of Macromolecular Assemblies: Visualization of Biological Molecules in Their Native State",
      "author": "Frank",
      "year": "2006"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib24",
      "doi-asserted-by": "crossref",
      "first-page": "15",
      "DOI": "10.1016/0304-3991(95)00084-4",
      "article-title": "A pattern recognition technique for the analysis of grain boundary structure by HREM",
      "volume": "62",
      "author": "Paciornik",
      "year": "1996",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib25",
      "doi-asserted-by": "crossref",
      "first-page": "103",
      "DOI": "10.1093/jmicro/dfp052",
      "article-title": "High-resolution low-dose scanning transmission electron microscopy",
      "volume": "59",
      "author": "Buban",
      "year": "2010",
      "journal-title": "Journal of Electron Microscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib26",
      "doi-asserted-by": "crossref",
      "first-page": "1219",
      "DOI": "10.1080/14786435.2012.746479",
      "article-title": "Quantifying stoichiometry-induced variations in structure and energy of a SrTiO3 symmetric sigma 13 {510}/<100>grain boundary",
      "volume": "93",
      "author": "Yang",
      "year": "2013",
      "journal-title": "Philosophical Magazine"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib27",
      "doi-asserted-by": "crossref",
      "first-page": "103511",
      "DOI": "10.1063/1.4794193",
      "article-title": "Atomic resolution mapping of interfacial intermixing and segregation in InAs/GaSb superlattices: a correlative study",
      "volume": "113",
      "author": "Kim",
      "year": "2013",
      "journal-title": "Journal of Applied Physics"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib28",
      "series-title": "Digital Image Processing",
      "author": "Burger",
      "year": "2008"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib29",
      "doi-asserted-by": "crossref",
      "first-page": "3189",
      "DOI": "10.1103/PhysRevB.57.R3189",
      "article-title": "Neutron-diffraction study of the Jahn\u2013Teller transition in stoichiometric LaMnO3",
      "volume": "57",
      "author": "Rodr\u00edguez-Carvajal",
      "year": "1998",
      "journal-title": "Physical Review B"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib30",
      "doi-asserted-by": "crossref",
      "first-page": "409",
      "DOI": "10.1016/0022-4596(70)90123-4",
      "article-title": "The system SrMnO3\u2212x",
      "volume": "1",
      "author": "Negas",
      "year": "1970",
      "journal-title": "Journal of Solid State Chemistry"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib31",
      "doi-asserted-by": "crossref",
      "first-page": "174409",
      "DOI": "10.1103/PhysRevB.77.174409",
      "article-title": "Magnetically asymmetiric interfaces in a LaMnO3/SrMnO3 superlattice due to structural asymmetries",
      "volume": "77",
      "author": "May",
      "year": "2008",
      "journal-title": "Physical Review B"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib32",
      "doi-asserted-by": "crossref",
      "first-page": "115112",
      "DOI": "10.1103/PhysRevB.82.115112",
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      "year": "2010",
      "journal-title": "Physical Review B"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib33",
      "doi-asserted-by": "crossref",
      "first-page": "1428",
      "DOI": "10.1017/S143192760550922X",
      "article-title": "The aberration corrected JEM-2200FS at Brookhaven",
      "volume": "11",
      "author": "Zhu",
      "year": "2005",
      "journal-title": "Microscopy and Microanalysis"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib34",
      "doi-asserted-by": "crossref",
      "first-page": "183",
      "DOI": "10.1017/S1431927610000085",
      "article-title": "The formation and utility of sub-angstrom to nanometer-sized electron probes in the aberration-corrected transmission electron microscope at the University of Illinois",
      "volume": "16",
      "author": "Wen",
      "year": "2010",
      "journal-title": "Microscopy and Microanalysis"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib35",
      "doi-asserted-by": "crossref",
      "first-page": "140405",
      "DOI": "10.1103/PhysRevB.80.140405",
      "article-title": "Evolution of magnetic phases and orbital occupation in (SrMnO3)n/(LaMnO3)2n superlattices",
      "volume": "80",
      "author": "Aruta",
      "year": "2009",
      "journal-title": "Physical Review B"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib36",
      "doi-asserted-by": "crossref",
      "first-page": "257203",
      "DOI": "10.1103/PhysRevLett.100.257203",
      "article-title": "Metal-insulator transition and its relation to magnetic structure in (LaMnO3)2n/(SrMnO3)n superlattices",
      "volume": "100",
      "author": "Bhattacharya",
      "year": "2008",
      "journal-title": "Physical Review Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib37",
      "doi-asserted-by": "crossref",
      "DOI": "10.1063/1.2745205",
      "article-title": "Signatures of enhanced ordering temperatures in digital superlattices of (LaMnO3)m/(SrMnO3)m",
      "volume": "90",
      "author": "Bhattacharya",
      "year": "2007",
      "journal-title": "Applied Physics Letters"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib38",
      "doi-asserted-by": "crossref",
      "first-page": "174409",
      "DOI": "10.1103/PhysRevB.77.174409",
      "article-title": "Magnetically asymmetric interfaces in a LaMnO3/SrMnO3 superlattice due to structural asymmetries",
      "volume": "77",
      "author": "May",
      "year": "2008",
      "journal-title": "Physical Review B"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib39",
      "doi-asserted-by": "crossref",
      "first-page": "15",
      "DOI": "10.1016/j.ultramic.2012.03.014",
      "article-title": "Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis",
      "volume": "117",
      "author": "Grieb",
      "year": "2012",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2013.07.018_bib40",
      "doi-asserted-by": "crossref",
      "first-page": "778",
      "DOI": "10.1016/j.ultramic.2009.11.014",
      "article-title": "Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy",
      "volume": "110",
      "author": "Kimoto",
      "year": "2010",
      "journal-title": "Ultramicroscopy"
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399113002040?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399113002040?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2019,
        2,
        11
      ]
    ],
    "date-time": "2019-02-11T11:05:29Z",
    "timestamp": 1549883129000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0304399113002040"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2014,
        1
      ]
    ]
  },
  "references-count": 40,
  "alternative-id": [
    "S0304399113002040"
  ],
  "URL": "http://dx.doi.org/10.1016/j.ultramic.2013.07.018",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        2014,
        1
      ]
    ]
  },
  "assertion": [
    {
      "value": "Elsevier",
      "name": "publisher",
      "label": "This article is maintained by"
    },
    {
      "value": "Lattice and strain analysis of atomic resolution Z-contrast images based on template matching",
      "name": "articletitle",
      "label": "Article Title"
    },
    {
      "value": "Ultramicroscopy",
      "name": "journaltitle",
      "label": "Journal Title"
    },
    {
      "value": "https://doi.org/10.1016/j.ultramic.2013.07.018",
      "name": "articlelink",
      "label": "CrossRef DOI link to publisher maintained version"
    },
    {
      "value": "article",
      "name": "content_type",
      "label": "Content Type"
    },
    {
      "value": "Copyright \u00a9 2013 Elsevier B.V. Published by Elsevier B.V. All rights reserved.",
      "name": "copyright",
      "label": "Copyright"
    }
  ]
}