DOI: 10.1016/j.ultramic.2012.03.004. Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy

Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy

10.1016/j.ultramic.2012.03.004

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

VuloviÄ, M., Franken, E., Ravelli, R. B. G., van Vliet, L. J., & Rieger, B. (2012). Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy. Ultramicroscopy, 116, 115â134.

Authors 5

Miloš Vulović (first)
Erik Franken (additional)
Raimond B.G. Ravelli (additional)
Lucas J. van Vliet (additional)
Bernd Rieger (additional)

References 59 Referenced 24

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Dates

Type	When
Created	13 years, 5 months ago (March 12, 2012, noon)
Deposited	2 years, 2 months ago (June 20, 2023, 9:41 p.m.)
Indexed	2 months, 3 weeks ago (May 29, 2025, 10:25 p.m.)
Issued	13 years, 3 months ago (May 1, 2012)
Published	13 years, 3 months ago (May 1, 2012)
Published Print	13 years, 3 months ago (May 1, 2012)

Funders 2

FOM Industrial
Awards1
1. No. 07.0599
NWO
Awards1
1. number 016.072.321

BibTeX

@article{Vulovi__2012, title={Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy}, volume={116}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2012.03.004}, DOI={10.1016/j.ultramic.2012.03.004}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Vulović, Miloš and Franken, Erik and Ravelli, Raimond B.G. and van Vliet, Lucas J. and Rieger, Bernd}, year={2012}, month=may, pages={115–134} }

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