DOI: 10.1016/j.ultramic.2012.01.005. Sample preparation for atomic-resolution STEM at low voltages by FIB

Sample preparation for atomic-resolution STEM at low voltages by FIB

10.1016/j.ultramic.2012.01.005

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Schaffer, M., Schaffer, B., & Ramasse, Q. (2012). Sample preparation for atomic-resolution STEM at low voltages by FIB. Ultramicroscopy, 114, 62â71.

Authors 3

Miroslava Schaffer (first)
Bernhard Schaffer (additional)
Quentin Ramasse (additional)

References 46 Referenced 346

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Dates

Type	When
Created	13 years, 7 months ago (Jan. 19, 2012, 8:14 a.m.)
Deposited	6 years, 2 months ago (June 22, 2019, 1:58 p.m.)
Indexed	1 day, 4 hours ago (Aug. 24, 2025, 6:54 p.m.)
Issued	13 years, 5 months ago (March 1, 2012)
Published	13 years, 5 months ago (March 1, 2012)
Published Print	13 years, 5 months ago (March 1, 2012)

Funders 0

None

BibTeX

@article{Schaffer_2012, title={Sample preparation for atomic-resolution STEM at low voltages by FIB}, volume={114}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2012.01.005}, DOI={10.1016/j.ultramic.2012.01.005}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Schaffer, Miroslava and Schaffer, Bernhard and Ramasse, Quentin}, year={2012}, month=mar, pages={62–71} }

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