Crossref
journal-article
Elsevier BV
Ultramicroscopy (78)
References
33
Referenced
83
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Dates
Type | When |
---|---|
Created | 13 years, 8 months ago (Dec. 8, 2011, 11:32 p.m.) |
Deposited | 1 year, 4 months ago (April 9, 2024, 9:29 p.m.) |
Indexed | 1 day, 4 hours ago (Aug. 23, 2025, 1:07 a.m.) |
Issued | 13 years, 6 months ago (Feb. 1, 2012) |
Published | 13 years, 6 months ago (Feb. 1, 2012) |
Published Print | 13 years, 6 months ago (Feb. 1, 2012) |
Funders
1
U.S. Department of Energy
10.13039/100000015
Region: Americas
gov (National government)
Labels
8
- Energy Department
- Department of Energy
- United States Department of Energy
- ENERGY.GOV
- US Department of Energy
- USDOE
- DOE
- USADOE
Awards
1
- DE-FG52-09NA29451
@article{Jiang_2012, title={On the dose-rate threshold of beam damage in TEM}, volume={113}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2011.11.016}, DOI={10.1016/j.ultramic.2011.11.016}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Jiang, Nan and Spence, John C.H.}, year={2012}, month=feb, pages={77–82} }