10.1016/j.ultramic.2011.11.016
Crossref journal-article
Elsevier BV
Ultramicroscopy (78)
Bibliography

Jiang, N., & Spence, J. C. H. (2012). On the dose-rate threshold of beam damage in TEM. Ultramicroscopy, 113, 77–82.

Authors 2
  1. Nan Jiang (first)
  2. John C.H. Spence (additional)
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Dates
Type When
Created 13 years, 8 months ago (Dec. 8, 2011, 11:32 p.m.)
Deposited 1 year, 4 months ago (April 9, 2024, 9:29 p.m.)
Indexed 1 day, 4 hours ago (Aug. 23, 2025, 1:07 a.m.)
Issued 13 years, 6 months ago (Feb. 1, 2012)
Published 13 years, 6 months ago (Feb. 1, 2012)
Published Print 13 years, 6 months ago (Feb. 1, 2012)
Funders 1
  1. U.S. Department of Energy 10.13039/100000015

    Region: Americas

    gov (National government)

    Labels8
    1. Energy Department
    2. Department of Energy
    3. United States Department of Energy
    4. ENERGY.GOV
    5. US Department of Energy
    6. USDOE
    7. DOE
    8. USADOE
    Awards1
    1. DE-FG52-09NA29451

@article{Jiang_2012, title={On the dose-rate threshold of beam damage in TEM}, volume={113}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2011.11.016}, DOI={10.1016/j.ultramic.2011.11.016}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Jiang, Nan and Spence, John C.H.}, year={2012}, month=feb, pages={77–82} }