DOI: 10.1016/j.ultramic.2010.11.027. Minimization of focused ion beam damage in nanostructured polymer thin films

Minimization of focused ion beam damage in nanostructured polymer thin films

10.1016/j.ultramic.2010.11.027

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Kim, S., Jeong Park, M., Balsara, N. P., Liu, G., & Minor, A. M. (2011). Minimization of focused ion beam damage in nanostructured polymer thin films. Ultramicroscopy, 111(3), 191â199.

Authors 5

Suhan Kim (first)
Moon Jeong Park (additional)
Nitash P. Balsara (additional)
Gao Liu (additional)
Andrew M. Minor (additional)

References 19 Referenced 90

10.1021/nl8014022 / Nano Letters / Three-dimensional nanoscale organization of bulk heterojunction polymer solar cells by van Bavel (2009)
10.1002/adma.200700887 / Advanced Materials / Imaging the interfaces of conjugated polymer optoelectronic devices by Steuerman (2008)
10.1021/cm802530x / Chemistry of Materials / Influence of molecular structure and film properties on the water-stability and sensor characteristics of organic transistors by Roberts (2008)
10.1126/science.1168108 / Science / Macroscopic 10-terabit-per-square-inch arrays from block copolymers with lateral order by Park (2009)
10.2494/photopolymer.20.767 / Journal of Photopolymer Science and Technology / Pattern transfer of laterally aligned lamellar domains of diblock copolymers by Yamaguchi (2007)
10.1038/nature03310 / Nature / Self-directed self-assembly of nanoparticle/copolymer mixtures by Lin (2005)
10.1021/cm062030s / Chemistry of Materials / Surface segregation and formation of silver nanoparticles created in situ in poly(methyl methacrylate) films by Deshmukh (2007)
10.1557/mrs2007.63 / MRS Bulletin / TEM sample preparation and FIB-induced damage by Mayer (2007)
10.1557/mrs2007.62 / MRS Bulletin / Focused ion beam microscopy and micromachining by Volkert (2007)
10.1116/1.583937 / Journal of Vacuum Science and Technology B / Focused ion-beam technology and applications by Melngailis (1987)
10.1002/polb.21088 / Journal of Polymer Science. Part B—Polymer Physics / Three-dimensional structural analysis of a block copolymer by scanning electron microscopy combined with a focused ion beam by Kato (2007)
10.1016/S0032-3861(02)00643-2 / Polymer / The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass by Loos (2002)
10.1021/ma0710737 / Macromolecules / Effect of humidity on the ordering of PEO-based copolymer thin films by Bang (2007)
10.1016/S0032-3861(00)00503-6 / Polymer / Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates by White (2001)
10.1021/ma048380m / Macromolecules / Nanoprocessing and nanofabrication of a structured polymer film by the focused-ion-beam technique by Niihara (2005)
10.1016/j.matlet.2006.07.026 / Materials Letters / Focused ion beam milling and scanning electron microscopy characterization of polymer plus metal hybrids by Brostow (2007)
10.1002/sia.3042 / Surface Interface Analysis / Focused ion beam irradiation-morphological and chemical evolution in PMMA by Kochumalayil (2009)
10.1017/S1431927605504872 / Microscopy and Microanalysis / Shadow FIBing- using geometry to prepare tem samples by Welz (2005)
10.1017/S1551929509991003 / Microscopy Today / FIB sample preparation of polymer thin films on hard substrates using the shadow-fib method by Kim (2009)

Dates

Type	When
Created	14 years, 8 months ago (Dec. 2, 2010, 4:38 a.m.)
Deposited	6 years, 8 months ago (Dec. 6, 2018, 8:22 a.m.)
Indexed	2 weeks ago (Aug. 6, 2025, 9:54 a.m.)
Issued	14 years, 6 months ago (Feb. 1, 2011)
Published	14 years, 6 months ago (Feb. 1, 2011)
Published Print	14 years, 6 months ago (Feb. 1, 2011)

Funders 0

None

BibTeX

@article{Kim_2011, title={Minimization of focused ion beam damage in nanostructured polymer thin films}, volume={111}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2010.11.027}, DOI={10.1016/j.ultramic.2010.11.027}, number={3}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Kim, Suhan and Jeong Park, Moon and Balsara, Nitash P. and Liu, Gao and Minor, Andrew M.}, year={2011}, month=feb, pages={191–199} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        8,
        6
      ]
    ],
    "date-time": "2025-08-06T13:54:10Z",
    "timestamp": 1754488450240
  },
  "reference-count": 19,
  "publisher": "Elsevier BV",
  "issue": "3",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2011,
            2,
            1
          ]
        ],
        "date-time": "2011-02-01T00:00:00Z",
        "timestamp": 1296518400000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2011,
        2
      ]
    ]
  },
  "DOI": "10.1016/j.ultramic.2010.11.027",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2010,
        12,
        2
      ]
    ],
    "date-time": "2010-12-02T09:38:45Z",
    "timestamp": 1291282725000
  },
  "page": "191-199",
  "source": "Crossref",
  "is-referenced-by-count": 90,
  "title": "Minimization of focused ion beam damage in nanostructured polymer thin films",
  "prefix": "10.1016",
  "volume": "111",
  "author": [
    {
      "given": "Suhan",
      "family": "Kim",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "Moon",
      "family": "Jeong Park",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Nitash P.",
      "family": "Balsara",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Gao",
      "family": "Liu",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "Andrew M.",
      "family": "Minor",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "issue": "2",
      "key": "10.1016/j.ultramic.2010.11.027_bib1",
      "doi-asserted-by": "crossref",
      "first-page": "507",
      "DOI": "10.1021/nl8014022",
      "article-title": "Three-dimensional nanoscale organization of bulk heterojunction polymer solar cells",
      "volume": "9",
      "author": "van Bavel",
      "year": "2009",
      "journal-title": "Nano Letters"
    },
    {
      "issue": "3",
      "key": "10.1016/j.ultramic.2010.11.027_bib2",
      "doi-asserted-by": "crossref",
      "first-page": "528",
      "DOI": "10.1002/adma.200700887",
      "article-title": "Imaging the interfaces of conjugated polymer optoelectronic devices",
      "volume": "20",
      "author": "Steuerman",
      "year": "2008",
      "journal-title": "Advanced Materials"
    },
    {
      "issue": "23",
      "key": "10.1016/j.ultramic.2010.11.027_bib3",
      "doi-asserted-by": "crossref",
      "first-page": "7332",
      "DOI": "10.1021/cm802530x",
      "article-title": "Influence of molecular structure and film properties on the water-stability and sensor characteristics of organic transistors",
      "volume": "20",
      "author": "Roberts",
      "year": "2008",
      "journal-title": "Chemistry of Materials"
    },
    {
      "issue": "5917",
      "key": "10.1016/j.ultramic.2010.11.027_bib4",
      "doi-asserted-by": "crossref",
      "first-page": "1030",
      "DOI": "10.1126/science.1168108",
      "article-title": "Macroscopic 10-terabit-per-square-inch arrays from block copolymers with lateral order",
      "volume": "323",
      "author": "Park",
      "year": "2009",
      "journal-title": "Science"
    },
    {
      "issue": "5",
      "key": "10.1016/j.ultramic.2010.11.027_bib5",
      "doi-asserted-by": "crossref",
      "first-page": "767",
      "DOI": "10.2494/photopolymer.20.767",
      "article-title": "Pattern transfer of laterally aligned lamellar domains of diblock copolymers",
      "volume": "20",
      "author": "Yamaguchi",
      "year": "2007",
      "journal-title": "Journal of Photopolymer Science and Technology"
    },
    {
      "issue": "7029",
      "key": "10.1016/j.ultramic.2010.11.027_bib6",
      "doi-asserted-by": "crossref",
      "first-page": "55",
      "DOI": "10.1038/nature03310",
      "article-title": "Self-directed self-assembly of nanoparticle/copolymer mixtures",
      "volume": "434",
      "author": "Lin",
      "year": "2005",
      "journal-title": "Nature"
    },
    {
      "issue": "4",
      "key": "10.1016/j.ultramic.2010.11.027_bib7",
      "doi-asserted-by": "crossref",
      "first-page": "745",
      "DOI": "10.1021/cm062030s",
      "article-title": "Surface segregation and formation of silver nanoparticles created in situ in poly(methyl methacrylate) films",
      "volume": "19",
      "author": "Deshmukh",
      "year": "2007",
      "journal-title": "Chemistry of Materials"
    },
    {
      "issue": "5",
      "key": "10.1016/j.ultramic.2010.11.027_bib8",
      "doi-asserted-by": "crossref",
      "first-page": "400",
      "DOI": "10.1557/mrs2007.63",
      "article-title": "TEM sample preparation and FIB-induced damage",
      "volume": "32",
      "author": "Mayer",
      "year": "2007",
      "journal-title": "MRS Bulletin"
    },
    {
      "issue": "5",
      "key": "10.1016/j.ultramic.2010.11.027_bib9",
      "doi-asserted-by": "crossref",
      "first-page": "389",
      "DOI": "10.1557/mrs2007.62",
      "article-title": "Focused ion beam microscopy and micromachining",
      "volume": "32",
      "author": "Volkert",
      "year": "2007",
      "journal-title": "MRS Bulletin"
    },
    {
      "issue": "2",
      "key": "10.1016/j.ultramic.2010.11.027_bib10",
      "doi-asserted-by": "crossref",
      "first-page": "469",
      "DOI": "10.1116/1.583937",
      "article-title": "Focused ion-beam technology and applications",
      "volume": "5",
      "author": "Melngailis",
      "year": "1987",
      "journal-title": "Journal of Vacuum Science and Technology B"
    },
    {
      "issue": "6",
      "key": "10.1016/j.ultramic.2010.11.027_bib11",
      "doi-asserted-by": "crossref",
      "first-page": "677",
      "DOI": "10.1002/polb.21088",
      "article-title": "Three-dimensional structural analysis of a block copolymer by scanning electron microscopy combined with a focused ion beam",
      "volume": "45",
      "author": "Kato",
      "year": "2007",
      "journal-title": "Journal of Polymer Science. Part B\u2014Polymer Physics"
    },
    {
      "issue": "26",
      "key": "10.1016/j.ultramic.2010.11.027_bib12",
      "doi-asserted-by": "crossref",
      "first-page": "7493",
      "DOI": "10.1016/S0032-3861(02)00643-2",
      "article-title": "The use of the focused ion beam technique to prepare cross-sectional transmission electron microscopy specimen of polymer solar cells deposited on glass",
      "volume": "43",
      "author": "Loos",
      "year": "2002",
      "journal-title": "Polymer"
    },
    {
      "issue": "19",
      "key": "10.1016/j.ultramic.2010.11.027_bib13",
      "doi-asserted-by": "crossref",
      "first-page": "7019",
      "DOI": "10.1021/ma0710737",
      "article-title": "Effect of humidity on the ordering of PEO-based copolymer thin films",
      "volume": "40",
      "author": "Bang",
      "year": "2007",
      "journal-title": "Macromolecules"
    },
    {
      "issue": "4",
      "key": "10.1016/j.ultramic.2010.11.027_bib14",
      "doi-asserted-by": "crossref",
      "first-page": "1613",
      "DOI": "10.1016/S0032-3861(00)00503-6",
      "article-title": "Focused ion beam/lift-out transmission electron microscopy cross sections of block copolymer films ordered on silicon substrates",
      "volume": "42",
      "author": "White",
      "year": "2001",
      "journal-title": "Polymer"
    },
    {
      "issue": "8",
      "key": "10.1016/j.ultramic.2010.11.027_bib15",
      "doi-asserted-by": "crossref",
      "first-page": "3048",
      "DOI": "10.1021/ma048380m",
      "article-title": "Nanoprocessing and nanofabrication of a structured polymer film by the focused-ion-beam technique",
      "volume": "38",
      "author": "Niihara",
      "year": "2005",
      "journal-title": "Macromolecules"
    },
    {
      "issue": "6",
      "key": "10.1016/j.ultramic.2010.11.027_bib16",
      "doi-asserted-by": "crossref",
      "first-page": "1333",
      "DOI": "10.1016/j.matlet.2006.07.026",
      "article-title": "Focused ion beam milling and scanning electron microscopy characterization of polymer plus metal hybrids",
      "volume": "61",
      "author": "Brostow",
      "year": "2007",
      "journal-title": "Materials Letters"
    },
    {
      "issue": "5",
      "key": "10.1016/j.ultramic.2010.11.027_bib17",
      "doi-asserted-by": "crossref",
      "first-page": "412",
      "DOI": "10.1002/sia.3042",
      "article-title": "Focused ion beam irradiation-morphological and chemical evolution in PMMA",
      "volume": "41",
      "author": "Kochumalayil",
      "year": "2009",
      "journal-title": "Surface Interface Analysis"
    },
    {
      "issue": "2",
      "key": "10.1016/j.ultramic.2010.11.027_bib18",
      "doi-asserted-by": "crossref",
      "first-page": "834",
      "DOI": "10.1017/S1431927605504872",
      "article-title": "Shadow FIBing- using geometry to prepare tem samples",
      "volume": "11",
      "author": "Welz",
      "year": "2005",
      "journal-title": "Microscopy and Microanalysis"
    },
    {
      "issue": "06",
      "key": "10.1016/j.ultramic.2010.11.027_bib19",
      "doi-asserted-by": "crossref",
      "first-page": "20",
      "DOI": "10.1017/S1551929509991003",
      "article-title": "FIB sample preparation of polymer thin films on hard substrates using the shadow-fib method",
      "volume": "17",
      "author": "Kim",
      "year": "2009",
      "journal-title": "Microscopy Today"
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399110003177?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0304399110003177?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2018,
        12,
        6
      ]
    ],
    "date-time": "2018-12-06T13:22:54Z",
    "timestamp": 1544102574000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0304399110003177"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2011,
        2
      ]
    ]
  },
  "references-count": 19,
  "journal-issue": {
    "issue": "3",
    "published-print": {
      "date-parts": [
        [
          2011,
          2
        ]
      ]
    }
  },
  "alternative-id": [
    "S0304399110003177"
  ],
  "URL": "http://dx.doi.org/10.1016/j.ultramic.2010.11.027",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        2011,
        2
      ]
    ]
  }
}