Crossref
journal-article
Elsevier BV
Ultramicroscopy (78)
References
51
Referenced
216
10.1017/S1431927604040565
/ Microscopy and Microanalysis by Kelly (2004)10.1017/S1431927607070869
/ Microscopy and Microanalysis by Bunton (2007)10.1002/sia.2491
/ Surface and Interface Analysis by Deconihout (2007)10.1063/1.2194089
/ Review of Scientific Instruments by Gault (2006)10.1016/j.ultramic.2007.02.032
/ Ultramicroscopy by Stender (2007)10.1146/annurev.matsci.37.052506.084239
/ Annual Review Materials Research by Kelly (2007)10.1063/1.2709758
/ Review of Scientific Instruments by Kelly (2007)10.1016/S1369-7021(07)70306-1
/ Materials Today by Cerezo (2007)10.1017/S143192760707095X
/ Microscopy and Microanalysis by Cerezo (2007){'key': '10.1016/j.ultramic.2010.11.016_bib10', 'series-title': 'Atom Probe Field Ion Microscopy', 'author': 'Miller', 'year': '1996'}
/ Atom Probe Field Ion Microscopy by Miller (1996)10.1063/1.3182351
/ Applied Physics Letters by Gault (2009)10.1017/S1431927609991267
/ Microscopy and Microanalysis by Gault (2010)10.1063/1.3186617
/ Journal of Applied Physics by Cadel (2009)10.1063/1.3462399
/ Journal of Applied Physics by Gault (2010)10.1016/0169-4332(94)00561-3
/ Applied Surface Science by Bas (1995)10.1051/rphysap:01982001707043500
/ Revue De Physique Appliquee by Blavette (1982)10.1017/S1431927609098249
/ Microscopy and Microanalysis by Geiser (2009)10.1017/S1431927608080690
/ Microscopy and Microanalysis by Gault (2008)10.1063/1.3068197
/ Journal of Applied Physics by Gault (2009)10.1046/j.1365-2818.1999.00637.x
/ Journal of Microscopy-Oxford by Vurpillot (1999)10.1051/epjap:1999173
/ European Physical Journal—Applied Physics by Vurpillot (1999)10.1063/1.1662526
/ Journal of Applied Physics by Wiesner (1973)10.1088/0022-3727/12/5/006
/ Journal of Physics D—Applied Physics by Walls (1979)10.1088/0950-7671/41/6/305
/ Journal of Scientific Instruments by Brandon (1964)10.1016/0039-6028(71)90089-6
/ Surface Science by Fortes (1971)10.1016/0026-0800(74)90041-X
/ Metallography by Wilkes (1974)10.1016/S0304-3991(99)00071-6
/ Ultramicroscopy by Cerezo (1999)10.1016/0169-4332(94)90371-9
/ Applied Surface Science by Hyde (1994)10.1038/363432a0
/ Nature by Blavette (1993){'key': '10.1016/j.ultramic.2010.11.016_bib30', 'series-title': 'Field emission and field ionisation', 'author': 'Gomer', 'year': '1961'}
/ Field emission and field ionisation by Gomer (1961)10.1016/0039-6028(78)90410-7
/ Surface Science by Tsong (1978)- D. Blavette, These d'etat, Ph.D. thesis, University of Rouen, Rouen, 1986.
{'key': '10.1016/j.ultramic.2010.11.016_bib33', 'first-page': '451', 'volume': '47', 'author': 'Walck', 'year': '1986', 'journal-title': 'Journal De Physique'}
/ Journal De Physique by Walck (1986)10.1016/0022-3697(62)90148-8
/ Journal of Physics and Chemistry of Solids by Moore (1962)10.1016/0039-6028(68)90095-2
/ Surface Science by Moore (1968)10.1016/S0304-3991(01)00108-5
/ Ultramicroscopy by Huang (2001)10.1002/nme.2579
/ International Journal for Numerical Methods in Engineering by Geuzaine (2009)- M. Galassi, J. Davies, J. Theiler, B. Gough, G. Jungman, P. Alken, M. Booth, F. Rossi, GNU Scientific Library Reference Manual, Third Edition, 2009.
10.1088/0022-3727/11/4/005
/ Journal of Physics D—Applied Physics by Smith (1978)-
E.A. Marquis, B.P. Geiser, T.J. Prosa, D.J. Larson, Journal of Microscopy, in press, doi:10.1111/j.1365-2818.2010.03421.x
(
10.1111/j.1365-2818.2010.03421.x
) {'key': '10.1016/j.ultramic.2010.11.016_bib41', 'first-page': '793', 'volume': '7', 'author': 'Delaunay', 'year': '1934', 'journal-title': 'Otdelenie Matematicheskikh i Estestvennykh Nauk'}
/ Otdelenie Matematicheskikh i Estestvennykh Nauk by Delaunay (1934)10.1145/235815.235821
/ Acm Transactions on Mathematical Software by Barber (1996)10.1016/j.ultramic.2009.03.016
/ Ultramicroscopy by Moody (2009)10.1017/S1431927607070948
/ Microscopy and Microanalysis by Geiser (2007){'key': '10.1016/j.ultramic.2010.11.016_bib45', 'first-page': '383', 'volume': '39', 'author': 'Loberg', 'year': '1968', 'journal-title': 'Arkiv For Fysik'}
/ Arkiv For Fysik by Loberg (1968)10.1017/S1431927609093337
/ Microscopy and Microanalysis by Gerstl (2009)-
D.J. Larson, B.P. Geiser, T.J. Prosa, S.S.A. Gerstl, D.A. Reinhard, T.F. Kelly, Journal of Microscopy, in press, doi:10.1111/j.1365-2818.2010.03474.x.
(
10.1111/j.1365-2818.2010.03474.x
) 10.1017/S1431927604040486
/ Microscopy and Microanalysis by Vurpillot (2004)10.1002/sia.1697
/ Surface and Interface Analysis by Vurpillot (2004)10.1016/j.ultramic.2010.04.017
/ Ultramicroscopy by Gault (2010)10.1016/0039-6028(91)90449-3
/ Surface Science by Miller (1991)
Dates
Type | When |
---|---|
Created | 14 years, 9 months ago (Nov. 20, 2010, 4:34 a.m.) |
Deposited | 1 year, 4 months ago (April 9, 2024, 9:27 p.m.) |
Indexed | 1 day, 17 hours ago (Aug. 20, 2025, 8:48 a.m.) |
Issued | 14 years, 3 months ago (May 1, 2011) |
Published | 14 years, 3 months ago (May 1, 2011) |
Published Print | 14 years, 3 months ago (May 1, 2011) |
@article{Gault_2011, title={Advances in the reconstruction of atom probe tomography data}, volume={111}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2010.11.016}, DOI={10.1016/j.ultramic.2010.11.016}, number={6}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Gault, B. and Haley, D. and de Geuser, F. and Moody, M.P. and Marquis, E.A. and Larson, D.J. and Geiser, B.P.}, year={2011}, month=may, pages={448–457} }