Crossref journal-article
Elsevier BV
Ultramicroscopy (78)
Bibliography

Vila-Comamala, J., Jefimovs, K., Raabe, J., Pilvi, T., Fink, R. H., Senoner, M., Maaßdorf, A., Ritala, M., & David, C. (2009). Advanced thin film technology for ultrahigh resolution X-ray microscopy. Ultramicroscopy, 109(11), 1360–1364.

Authors 9
  1. Joan Vila-Comamala (first)
  2. Konstantins Jefimovs (additional)
  3. Jörg Raabe (additional)
  4. Tero Pilvi (additional)
  5. Rainer H. Fink (additional)
  6. Mathias Senoner (additional)
  7. Andre Maaßdorf (additional)
  8. Mikko Ritala (additional)
  9. Christian David (additional)
References 21 Referenced 102
  1. 10.1126/science.1439809 / Science by Ade (1992)
  2. 10.1017/S0033583500003139 / Q. Rev. Biophys. by Kirz (1995)
  3. 10.1038/1341 / Nat. Struct. Biol. by Jacobsen (1998)
  4. 10.1007/s00216-003-2007-x / Anal. Bioanal. Chem. by Schneider (2003)
  5. 10.1021/es0726254 / Environ. Sci. Technol. by Thieme (2007)
  6. 10.1109/TMAG.2008.924532 / IEEE Trans. Magn. by Fischer (2008)
  7. 10.1143/JJAP.42.3913 / Jpn. J. Appl. Phys. by Ishida (2003)
  8. 10.1038/nature03719 / Nature by Chao (2005)
  9. 10.1002/anie.200301652 / Angew. Chem. Int. Ed. by Leskelä (2003)
  10. 10.1111/j.1749-6632.1980.tb47211.x / Ann. N. Y. Acad. Sci. by Rudolph (1980)
  11. 10.1016/j.vacuum.2005.11.004 / Vacuum by Tamura (2006)
  12. {'key': '10.1016/j.ultramic.2009.07.005_bib12', 'first-page': '127', 'volume': '96', 'author': 'Kang', 'year': '2006', 'journal-title': 'Phys. Rev. Lett.'} / Phys. Rev. Lett. by Kang (2006)
  13. 10.1063/1.2912503 / Appl. Phys. Lett. by Kang (2008)
  14. 10.1103/PhysRevLett.99.264801 / Phys. Rev. Lett. by Jefimovs (2007)
  15. 10.1016/S0167-9317(99)00066-0 / Microelectron. Eng. by David (1999)
  16. 10.1016/j.mee.2008.01.023 / Microelectron. Eng. by Vila-Comamala (2008)
  17. 10.1149/1.1761011 / J. Electrochem. Soc. by Aaltonen (2004)
  18. 10.1002/sia.1936 / Surf. Interface Anal. by Senoner (2004)
  19. 10.1002/sia.2453 / Surf. Interface Anal. by Senoner (2007)
  20. 10.1063/1.2436109 / AIP Conf. Proc. by Flechsig (2007)
  21. 10.1063/1.3021472 / Rev. Sci. Instrum. by Raabe (2008)
Dates
Type When
Created 16 years, 1 month ago (July 17, 2009, 1:55 p.m.)
Deposited 6 years, 8 months ago (Dec. 17, 2018, 11:22 p.m.)
Indexed 1 month, 1 week ago (July 14, 2025, 11:31 p.m.)
Issued 15 years, 10 months ago (Oct. 1, 2009)
Published 15 years, 10 months ago (Oct. 1, 2009)
Published Print 15 years, 10 months ago (Oct. 1, 2009)
Funders 0

None

@article{Vila_Comamala_2009, title={Advanced thin film technology for ultrahigh resolution X-ray microscopy}, volume={109}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2009.07.005}, DOI={10.1016/j.ultramic.2009.07.005}, number={11}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Vila-Comamala, Joan and Jefimovs, Konstantins and Raabe, Jörg and Pilvi, Tero and Fink, Rainer H. and Senoner, Mathias and Maaßdorf, Andre and Ritala, Mikko and David, Christian}, year={2009}, month=oct, pages={1360–1364} }