Crossref journal-article
Elsevier BV
Ultramicroscopy (78)
Bibliography

Moore, J. S., Jones, K. S., Kennel, H., & Corcoran, S. (2008). 3-D analysis of semiconductor dopant distributions in a patterned structure using LEAP. Ultramicroscopy, 108(6), 536–539.

Authors 4
  1. J.S. Moore (first)
  2. K.S. Jones (additional)
  3. H. Kennel (additional)
  4. S. Corcoran (additional)
References 8 Referenced 17
  1. 10.1063/1.327686 / J. Appl. Phys. by Kellogg (1980)
  2. 10.1017/S1431927604040565 / Microsc. Microanal. by Kelly (2004)
  3. International Technology Roadmap for Semiconductors: Front End Processes, 2005, p. 37.
  4. 10.1016/j.ultramic.2004.10.011 / Ultramicroscopy by Miller (2005)
  5. 10.1016/j.ultramic.2006.06.008 / Ultramicroscopy by Thompson (2007)
  6. 10.1016/S0927-0256(98)00020-2 / Comput. Mater. Sci. by Law (1998)
  7. 10.1109/IEDM.2002.1175976 / IEDM Tech. Digest by Kennel (2002)
  8. {'key': '10.1016/j.ultramic.2007.08.008_bib8', 'series-title': 'Atom Probe Field Ion Microscopy', 'author': 'Miller', 'year': '1996'} / Atom Probe Field Ion Microscopy by Miller (1996)
Dates
Type When
Created 17 years, 11 months ago (Aug. 31, 2007, 3:14 a.m.)
Deposited 6 years, 7 months ago (Jan. 4, 2019, 11:51 a.m.)
Indexed 1 year, 4 months ago (April 1, 2024, 1:21 p.m.)
Issued 17 years, 3 months ago (May 1, 2008)
Published 17 years, 3 months ago (May 1, 2008)
Published Print 17 years, 3 months ago (May 1, 2008)
Funders 0

None

@article{Moore_2008, title={3-D analysis of semiconductor dopant distributions in a patterned structure using LEAP}, volume={108}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2007.08.008}, DOI={10.1016/j.ultramic.2007.08.008}, number={6}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Moore, J.S. and Jones, K.S. and Kennel, H. and Corcoran, S.}, year={2008}, month=may, pages={536–539} }