DOI: 10.1016/j.ultramic.2007.02.024. Atom probe specimen fabrication methods using a dual FIB/SEM

Atom probe specimen fabrication methods using a dual FIB/SEM

10.1016/j.ultramic.2007.02.024

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Saxey, D. W., Cairney, J. M., McGrouther, D., Honma, T., & Ringer, S. P. (2007). Atom probe specimen fabrication methods using a dual FIB/SEM. Ultramicroscopy, 107(9), 756â760.

Authors 5

D.W. Saxey (first)
J.M. Cairney (additional)
D. McGrouther (additional)
T. Honma (additional)
S.P. Ringer (additional)

References 19 Referenced 73

10.1016/S0304-3991(99)00055-8 / Ultramicroscopy by Larson (1999)
10.1063/1.372589 / J. Appl. Phys. by Larson (2000)
10.1007/S100050010058 / Microsc. Microanalysis by Larson (2001)
10.1016/j.actamat.2004.03.015 / Acta Materialia by Larson (2004)
10.1016/j.ultramic.2004.01.010 / Ultramicroscopy by Thompson (2004)
10.1016/j.ultramic.2004.10.011 / Ultramicroscopy by Miller (2005)
10.1017/S143192760606394X / Microsc. Microanalysis by Lawrence (2006)
10.1016/j.ultramic.2006.06.008 / Ultramicroscopy by Thompson (2007)
10.1016/S1044-5803(99)00055-8 / Mater. Charact. by Kelly (2000)
10.1017/S1431927604040565 / Microsc. Microanalysis by Kelly (2004)
10.1017/S1431927606061113 / Microsc. Microanalysis by Ulfig (2006)
10.1017/S1431927604883193 / Microsc. Microanalysis by Colijn (2004)
10.1016/j.msea.2005.06.027 / Mater. Sci. Eng. A / Aging response of coarse- and fine-grained beta alloys by Ivasishin (2005)
{'key': '10.1016/j.ultramic.2007.02.024_bib14', 'series-title': 'Transmission Electron Microscopy: 1 Basics', 'author': 'Williams', 'year': '1996'} / Transmission Electron Microscopy: 1 Basics by Williams (1996)
10.1017/S1431927606065457 / Microsc. Microanalysis by Thompson (2006)
T.M. Moore, U.S. Patent 6570170.
10.1002/sia.1063 / Surf. Interface Anal. by Stevie (2001)
{'key': '10.1016/j.ultramic.2007.02.024_bib18', 'series-title': 'Proceedings of “Bulk Metallic Glass Symposium”, 135th TMS Annual Meeting & Exhibition, TMS 2006', 'first-page': '77', 'author': 'Miller', 'year': '2006'} / Proceedings of “Bulk Metallic Glass Symposium”, 135th TMS Annual Meeting & Exhibition, TMS 2006 by Miller (2006)
J.M. Cairney, D.W. Saxey, D. McGrouther, S.P. Ringer, Physica B doi:10.1016/j.physb.2006.12.024. (10.1016/j.physb.2006.12.024)

Dates

Type	When
Created	18 years, 5 months ago (March 4, 2007, 6:52 a.m.)
Deposited	4 years ago (Aug. 9, 2021, 10:25 a.m.)
Indexed	5 months ago (March 19, 2025, 12:29 p.m.)
Issued	17 years, 11 months ago (Sept. 1, 2007)
Published	17 years, 11 months ago (Sept. 1, 2007)
Published Print	17 years, 11 months ago (Sept. 1, 2007)

Funders 0

None

BibTeX

@article{Saxey_2007, title={Atom probe specimen fabrication methods using a dual FIB/SEM}, volume={107}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2007.02.024}, DOI={10.1016/j.ultramic.2007.02.024}, number={9}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Saxey, D.W. and Cairney, J.M. and McGrouther, D. and Honma, T. and Ringer, S.P.}, year={2007}, month=sep, pages={756–760} }

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