DOI: 10.1016/j.ultramic.2005.04.004. Focused ion beam-nanomachined probes for improved electric force microscopy

Focused ion beam-nanomachined probes for improved electric force microscopy

10.1016/j.ultramic.2005.04.004

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Menozzi, C., Carlo Gazzadi, G., Alessandrini, A., & Facci, P. (2005). Focused ion beam-nanomachined probes for improved electric force microscopy. Ultramicroscopy, 104(3â4), 220â225.

Authors 4

Claudia Menozzi (first)
Gian Carlo Gazzadi (additional)
Andrea Alessandrini (additional)
Paolo Facci (additional)

References 15 Referenced 21

{'key': '10.1016/j.ultramic.2005.04.004_bib1', 'first-page': '726', 'volume': '55', 'author': 'Binnig', 'year': '1982', 'journal-title': 'Helv. Phys. Acta'} / Helv. Phys. Acta by Binnig (1982)
10.1103/PhysRevLett.56.930 / Phys. Rev. Lett. by Binnig (1986)
10.1143/JJAP.38.3958 / Jpn. J. Appl. Phys. by Kageshima (1999)
10.1063/1.125626 / Appl. Phys. Lett. by Folks (2000)
10.1063/1.121564 / Appl. Phys. Lett. by Veerman (1998)
10.1063/1.1492304 / Appl. Phys. Lett. by Lugstein (2002)
10.1063/1.99224 / Appl. Phys. Lett. by Martin (1988)
10.1063/1.105227 / Appl. Phys. Lett. by Nonnenmacher (1991)
10.1063/1.363884 / J. Appl. Phys. by Belaidi (1997)
10.1063/1.368181 / J. Appl. Phys. by Jacobs (1998)
10.1016/S0026-2714(97)00126-1 / Microelectron. Reliab. by Belaidi (1997)
10.1016/S0026-2714(98)00118-8 / Microelectron. Reliab. by Wittpahl (1998)
10.1016/S0304-3991(02)00069-4 / Ultramicroscopy by Cui (2002)
10.1088/0957-4484/6/1/001 / Nanotechnology by Butt (1995)
10.1016/S0006-3495(94)81011-2 / Biophys. J. by Radmacher (1994)

Dates

Type	When
Created	20 years, 3 months ago (May 12, 2005, 7:45 a.m.)
Deposited	6 years, 6 months ago (Jan. 26, 2019, 10:27 a.m.)
Indexed	1 year, 1 month ago (July 11, 2024, 1:14 p.m.)
Issued	19 years, 10 months ago (Oct. 1, 2005)
Published	19 years, 10 months ago (Oct. 1, 2005)
Published Print	19 years, 10 months ago (Oct. 1, 2005)

Funders 0

None

BibTeX

@article{Menozzi_2005, title={Focused ion beam-nanomachined probes for improved electric force microscopy}, volume={104}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2005.04.004}, DOI={10.1016/j.ultramic.2005.04.004}, number={3–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Menozzi, Claudia and Carlo Gazzadi, Gian and Alessandrini, Andrea and Facci, Paolo}, year={2005}, month=oct, pages={220–225} }

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