DOI: 10.1016/j.ultramic.2005.03.001. Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework

10.1016/j.ultramic.2005.03.001

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

den Dekker, A. J., Van Aert, S., van den Bos, A., & Van Dyck, D. (2005). Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework. Ultramicroscopy, 104(2), 83â106.

Authors 4

A.J. den Dekker (first)
S. Van Aert (additional)
A. van den Bos (additional)
D. Van Dyck (additional)

References 52 Referenced 95

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Dates

Type	When
Created	20 years, 4 months ago (April 9, 2005, 7:57 a.m.)
Deposited	7 months, 3 weeks ago (Dec. 31, 2024, 8:15 a.m.)
Indexed	4 weeks, 2 days ago (July 25, 2025, 6:24 a.m.)
Issued	19 years, 11 months ago (Sept. 1, 2005)
Published	19 years, 11 months ago (Sept. 1, 2005)
Published Print	19 years, 11 months ago (Sept. 1, 2005)

Funders 0

None

BibTeX

@article{den_Dekker_2005, title={Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework}, volume={104}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2005.03.001}, DOI={10.1016/j.ultramic.2005.03.001}, number={2}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={den Dekker, A.J. and Van Aert, S. and van den Bos, A. and Van Dyck, D.}, year={2005}, month=sep, pages={83–106} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        7,
        25
      ]
    ],
    "date-time": "2025-07-25T10:24:35Z",
    "timestamp": 1753439075055,
    "version": "3.32.0"
  },
  "reference-count": 52,
  "publisher": "Elsevier BV",
  "issue": "2",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2005,
            9,
            1
          ]
        ],
        "date-time": "2005-09-01T00:00:00Z",
        "timestamp": 1125532800000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2005,
        9
      ]
    ]
  },
  "DOI": "10.1016/j.ultramic.2005.03.001",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2005,
        4,
        9
      ]
    ],
    "date-time": "2005-04-09T11:57:04Z",
    "timestamp": 1113047824000
  },
  "page": "83-106",
  "source": "Crossref",
  "is-referenced-by-count": 95,
  "title": "Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part I: A theoretical framework",
  "prefix": "10.1016",
  "volume": "104",
  "author": [
    {
      "given": "A.J.",
      "family": "den Dekker",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "S.",
      "family": "Van Aert",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "A.",
      "family": "van den Bos",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "D.",
      "family": "Van Dyck",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib1",
      "doi-asserted-by": "crossref",
      "unstructured": "S. Van Aert, A.J. den Dekker, A. van den Bos, D. Van Dyck, J.H. Chen, Maximum likelihood estimation of structure parameters from high resolution electron microscopy images, part II: a practical example, Ultramicroscopy, this issue, 2005, doi:10.1016/j.ultramic.2005.03.002.",
      "DOI": "10.1016/j.ultramic.2005.03.002"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib2",
      "doi-asserted-by": "crossref",
      "first-page": "289",
      "DOI": "10.1016/0304-3991(83)90008-6",
      "volume": "11",
      "author": "Kilaas",
      "year": "1982",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib3",
      "doi-asserted-by": "crossref",
      "first-page": "131",
      "DOI": "10.1016/0304-3991(87)90080-5",
      "volume": "21",
      "author": "Stadelman",
      "year": "1987",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib4",
      "doi-asserted-by": "crossref",
      "first-page": "159",
      "DOI": "10.1016/S0304-3991(00)00012-7",
      "volume": "83",
      "author": "Boothroyd",
      "year": "2000",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib5",
      "doi-asserted-by": "crossref",
      "first-page": "191",
      "DOI": "10.1016/0304-3991(94)90034-5",
      "volume": "53",
      "author": "Hytch",
      "year": "1994",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib6",
      "doi-asserted-by": "crossref",
      "first-page": "99",
      "DOI": "10.1046/j.1365-2818.1998.2910843.x",
      "volume": "190",
      "author": "Boothroyd",
      "year": "1998",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib7",
      "doi-asserted-by": "crossref",
      "first-page": "279",
      "DOI": "10.1093/jmicro/51.Supplement.S279",
      "volume": "51",
      "author": "Boothroyd",
      "year": "2000",
      "journal-title": "J. Electr. Microsc. Suppl."
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib8",
      "unstructured": "D. Van Dyck, A roadmap for quantitative hrem, in: R. Cross (Ed.), Proceedings of the 15th International Congress on Electron Microscopy, Interdisciplinary and Technical Forum Abstracts 2002 in Durban, South Africa, vol. 3, Onderstepoort, 2002, Microscopy Society of Southern Africa, pp. 207\u2013208."
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib9",
      "doi-asserted-by": "crossref",
      "first-page": "131",
      "DOI": "10.1046/j.1365-2818.1998.3320899.x",
      "volume": "190",
      "author": "King",
      "year": "1998",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib10",
      "first-page": "241",
      "article-title": "Resolution Reconsidered\u2014Conventional Approaches and an Alternative",
      "volume": "vol. 117",
      "author": "van den Bos",
      "year": "2001"
    },
    {
      "year": "1995",
      "series-title": "An Introduction to Computational Statistics\u2014Regression Analysis",
      "author": "Jennrich",
      "key": "10.1016/j.ultramic.2005.03.001_bib11"
    },
    {
      "year": "1994",
      "series-title": "Kendall's Advanced Theory of Statistics",
      "author": "Stuart",
      "key": "10.1016/j.ultramic.2005.03.001_bib12"
    },
    {
      "year": "1998",
      "series-title": "Physics from Fisher Information\u2014A Unification",
      "author": "Frieden",
      "key": "10.1016/j.ultramic.2005.03.001_bib13"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib14",
      "first-page": "331",
      "article-title": "Parameter estimation",
      "volume": "vol. 1",
      "author": "van den Bos",
      "year": "1982"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib15",
      "first-page": "448",
      "article-title": "Measurement errors",
      "volume": "vol. 12",
      "author": "van den Bos",
      "year": "1999"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib16",
      "doi-asserted-by": "crossref",
      "first-page": "95",
      "DOI": "10.1046/j.1365-2818.1999.00473.x",
      "volume": "194",
      "author": "den Dekker",
      "year": "1999",
      "journal-title": "J. Microsc."
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib17",
      "doi-asserted-by": "crossref",
      "first-page": "1833",
      "DOI": "10.1080/13642810110079674",
      "volume": "81",
      "author": "Van Aert",
      "year": "2001",
      "journal-title": "Philos. Mag. B"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib18",
      "doi-asserted-by": "crossref",
      "first-page": "275",
      "DOI": "10.1016/S0304-3991(01)00089-4",
      "volume": "89",
      "author": "den Dekker",
      "year": "2001",
      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib19",
      "doi-asserted-by": "crossref",
      "unstructured": "S. Van Aert, Statistical experimental design for quantitative atomic resolution transmission electron microscopy, Ph.D. Thesis, Delft Univeristy of Technology, 2003.",
      "DOI": "10.1016/S1076-5670(04)30001-7"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib20",
      "doi-asserted-by": "crossref",
      "first-page": "425",
      "DOI": "10.1016/j.micron.2004.01.007",
      "volume": "35",
      "author": "Van Aert",
      "year": "2004",
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    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib21",
      "first-page": "1",
      "article-title": "Statistical Experimental Design for Quantitative Atomic Resolution Transmission Electron Microscopy",
      "volume": "vol. 130",
      "author": "Van Aert",
      "year": "2004"
    },
    {
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      "author": "Cram\u00e9r",
      "key": "10.1016/j.ultramic.2005.03.001_bib22"
    },
    {
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      "series-title": "Nonlinear Regression",
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      "key": "10.1016/j.ultramic.2005.03.001_bib23"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib24",
      "unstructured": "L. Marks, Private communication."
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib25",
      "first-page": "125",
      "volume": "77",
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      "journal-title": "Optik"
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      "journal-title": "Optik"
    },
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      "key": "10.1016/j.ultramic.2005.03.001_bib27",
      "doi-asserted-by": "crossref",
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      "DOI": "10.1016/0304-3991(96)00010-1",
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      "journal-title": "Ultramicroscopy"
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      "doi-asserted-by": "crossref",
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      "journal-title": "Ultramicroscopy"
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      "key": "10.1016/j.ultramic.2005.03.001_bib30",
      "doi-asserted-by": "crossref",
      "first-page": "235",
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    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib31",
      "doi-asserted-by": "crossref",
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      "DOI": "10.1016/0304-3991(86)90203-2",
      "volume": "19",
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      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib32",
      "doi-asserted-by": "crossref",
      "first-page": "153",
      "DOI": "10.1016/0304-3991(96)00006-X",
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      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib33",
      "doi-asserted-by": "crossref",
      "first-page": "715",
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      "journal-title": "Acta Crystallogr. A"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib34",
      "doi-asserted-by": "crossref",
      "first-page": "243",
      "DOI": "10.1016/0304-3991(93)90031-R",
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      "author": "Beeching",
      "year": "1993",
      "journal-title": "Ultramicroscopy"
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    {
      "key": "10.1016/j.ultramic.2005.03.001_bib35",
      "doi-asserted-by": "crossref",
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      "DOI": "10.1016/0304-3991(94)90069-8",
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      "year": "1994",
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      "key": "10.1016/j.ultramic.2005.03.001_bib36",
      "doi-asserted-by": "crossref",
      "first-page": "89",
      "DOI": "10.1016/0304-3991(95)00091-7",
      "volume": "62",
      "author": "Lentzen",
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      "journal-title": "Ultramicroscopy"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib37",
      "doi-asserted-by": "crossref",
      "first-page": "7",
      "DOI": "10.1107/S010876739700874X",
      "volume": "54",
      "author": "Spence",
      "year": "1998",
      "journal-title": "Acta Crystallogr. A"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib38",
      "doi-asserted-by": "crossref",
      "first-page": "388",
      "DOI": "10.1107/S0108767398003560",
      "volume": "54",
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      "year": "1998",
      "journal-title": "Acta Crystallogr. A"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib39",
      "doi-asserted-by": "crossref",
      "first-page": "105",
      "DOI": "10.1107/S0108767398003705",
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      "year": "1999",
      "journal-title": "Acta Crystallogr. A"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib40",
      "doi-asserted-by": "crossref",
      "first-page": "179",
      "DOI": "10.1016/S0304-3991(02)00276-0",
      "volume": "93",
      "author": "Geuens",
      "year": "2002",
      "journal-title": "Ultramicroscopy"
    },
    {
      "year": "1988",
      "series-title": "Nonlinear Regression Analysis and Its Applications",
      "author": "Bates",
      "key": "10.1016/j.ultramic.2005.03.001_bib41"
    },
    {
      "year": "1974",
      "series-title": "Introduction to the Theory of Statistics",
      "author": "Mood",
      "key": "10.1016/j.ultramic.2005.03.001_bib42"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib43",
      "doi-asserted-by": "crossref",
      "first-page": "369",
      "DOI": "10.2307/1267666",
      "article-title": "Using a hyperbola as a transition model to fit two-regimen straight-line data",
      "volume": "16",
      "author": "Watts",
      "year": "1974",
      "journal-title": "Technometrics"
    },
    {
      "year": "1983",
      "series-title": "Graphical Methods for Data Analysis",
      "author": "Chambers",
      "key": "10.1016/j.ultramic.2005.03.001_bib44"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib45",
      "unstructured": "The MathWorks. n.d. http://www.mathworks.com/."
    },
    {
      "year": "1980",
      "series-title": "Practical Nonparametric Statistics",
      "author": "Conover",
      "key": "10.1016/j.ultramic.2005.03.001_bib46"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib47",
      "unstructured": "Handbook of Tables for Probability and Statistics, Chemical Rubber Company, Cleveland, 1966."
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib48",
      "unstructured": "D.A. Ratkowsky, Handbook of Nonlinear Regression Models, Marcel-Dekker, New York, 1990."
    },
    {
      "issue": "1",
      "key": "10.1016/j.ultramic.2005.03.001_bib49",
      "doi-asserted-by": "crossref",
      "first-page": "67",
      "DOI": "10.2307/1269884",
      "volume": "29",
      "author": "Donaldson",
      "year": "1987",
      "journal-title": "Technometrics"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib50",
      "doi-asserted-by": "crossref",
      "unstructured": "T. Amemiya, Non-Linear Regression Models, North-Holland, Amsterdam, 1983, pp. 333\u2013389.",
      "DOI": "10.1016/S1573-4412(83)01010-7"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib51",
      "doi-asserted-by": "crossref",
      "first-page": "1",
      "DOI": "10.1111/j.2517-6161.1980.tb01094.x",
      "volume": "42",
      "author": "Bates",
      "year": "1980",
      "journal-title": "J. R. Stat. Soc. B"
    },
    {
      "key": "10.1016/j.ultramic.2005.03.001_bib52",
      "doi-asserted-by": "crossref",
      "first-page": "19",
      "DOI": "10.1046/j.1365-2818.1998.3080867.x",
      "volume": "190",
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      "journal-title": "J. Microsc."
    }
  ],
  "container-title": "Ultramicroscopy",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S030439910500046X?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S030439910500046X?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        12,
        31
      ]
    ],
    "date-time": "2024-12-31T13:15:45Z",
    "timestamp": 1735650945000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S030439910500046X"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2005,
        9
      ]
    ]
  },
  "references-count": 52,
  "journal-issue": {
    "issue": "2",
    "published-print": {
      "date-parts": [
        [
          2005,
          9
        ]
      ]
    }
  },
  "alternative-id": [
    "S030439910500046X"
  ],
  "URL": "http://dx.doi.org/10.1016/j.ultramic.2005.03.001",
  "relation": {},
  "ISSN": [
    "0304-3991"
  ],
  "subject": [],
  "container-title-short": "Ultramicroscopy",
  "published": {
    "date-parts": [
      [
        2005,
        9
      ]
    ]
  }
}