Crossref
journal-article
Elsevier BV
Ultramicroscopy (78)
References
29
Referenced
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Dates
Type | When |
---|---|
Created | 20 years, 7 months ago (Dec. 29, 2004, 12:13 a.m.) |
Deposited | 5 years, 4 months ago (April 4, 2020, 9:37 p.m.) |
Indexed | 4 months ago (April 22, 2025, 2:04 a.m.) |
Issued | 20 years, 4 months ago (April 1, 2005) |
Published | 20 years, 4 months ago (April 1, 2005) |
Published Print | 20 years, 4 months ago (April 1, 2005) |
@article{Dunin_Borkowski_2005, title={Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors}, volume={103}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2004.11.018}, DOI={10.1016/j.ultramic.2004.11.018}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Dunin-Borkowski, Rafal E. and Newcomb, Simon B. and Kasama, Takeshi and McCartney, Martha R. and Weyland, Matthew and Midgley, Paul A.}, year={2005}, month=apr, pages={67–81} }