Crossref journal-article
Elsevier BV
Ultramicroscopy (78)
Bibliography

Dunin-Borkowski, R. E., Newcomb, S. B., Kasama, T., McCartney, M. R., Weyland, M., & Midgley, P. A. (2005). Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors. Ultramicroscopy, 103(1), 67–81.

Authors 6
  1. Rafal E. Dunin-Borkowski (first)
  2. Simon B. Newcomb (additional)
  3. Takeshi Kasama (additional)
  4. Martha R. McCartney (additional)
  5. Matthew Weyland (additional)
  6. Paul A. Midgley (additional)
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Dates
Type When
Created 20 years, 7 months ago (Dec. 29, 2004, 12:13 a.m.)
Deposited 5 years, 4 months ago (April 4, 2020, 9:37 p.m.)
Indexed 4 months ago (April 22, 2025, 2:04 a.m.)
Issued 20 years, 4 months ago (April 1, 2005)
Published 20 years, 4 months ago (April 1, 2005)
Published Print 20 years, 4 months ago (April 1, 2005)
Funders 0

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@article{Dunin_Borkowski_2005, title={Conventional and back-side focused ion beam milling for off-axis electron holography of electrostatic potentials in transistors}, volume={103}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2004.11.018}, DOI={10.1016/j.ultramic.2004.11.018}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Dunin-Borkowski, Rafal E. and Newcomb, Simon B. and Kasama, Takeshi and McCartney, Martha R. and Weyland, Matthew and Midgley, Paul A.}, year={2005}, month=apr, pages={67–81} }