DOI: 10.1016/j.ultramic.2004.11.010. A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

A versatile double aberration-corrected, energy filtered HREM/STEM for materials science

10.1016/j.ultramic.2004.11.010

Crossref journal-article

Elsevier BV

Ultramicroscopy (78)

Bibliography

Hutchison, J. L., Titchmarsh, J. M., Cockayne, D. J. H., Doole, R. C., Hetherington, C. J. D., Kirkland, A. I., & Sawada, H. (2005). A versatile double aberration-corrected, energy filtered HREM/STEM for materials science. Ultramicroscopy, 103(1), 7â15.

Authors 7

John L. Hutchison (first)
John M. Titchmarsh (additional)
David J.H. Cockayne (additional)
Ron C. Doole (additional)
Crispin J.D. Hetherington (additional)
Angus I. Kirkland (additional)
H. Sawada (additional)

References 11 Referenced 82

10.1103/PhysRevLett.69.3743 / Phys. Rev. Lett. by Coene (1992)
10.1016/0304-3991(94)00191-O / Ultramicroscopy by Kirkland (1995)
{'key': '10.1016/j.ultramic.2004.11.010_bib3', 'series-title': 'Image and Signal Processing in Electron Microscopy, Proceedings of the Sixth Pfefferkorn Conference, Niagara, 1987', 'first-page': '213', 'author': 'Saxton', 'year': '1988'} / Image and Signal Processing in Electron Microscopy, Proceedings of the Sixth Pfefferkorn Conference, Niagara, 1987 by Saxton (1988)
10.1016/B978-0-12-029912-6.50006-3 / Advances in Optical and Electron Microscopy by Lichte (1991)
10.1103/PhysRevLett.74.399 / Phys. Rev. Lett. by Orchowski (1995)
10.1016/S0304-3991(98)00048-5 / Ultramicroscopy by Haider (1998)
10.1016/S0304-3991(99)00013-3 / Ultramicroscopy by Krivanek (1999)
10.1046/j.1365-2818.1999.00446.x / J. Microsc. by Tanada (1999)
10.1016/S0168-9002(98)01571-X / Nucl. Instr. Meth. A by Tsuno (1999)
{'key': '10.1016/j.ultramic.2004.11.010_bib10', 'first-page': '155', 'volume': '99', 'author': 'Typke', 'year': '1995', 'journal-title': 'Optik'} / Optik by Typke (1995)
10.1016/0304-3991(92)90052-L / Ultramicroscopy by Koster (1992)

Dates

Type	When
Created	20 years, 7 months ago (Dec. 21, 2004, 8:35 p.m.)
Deposited	6 years, 6 months ago (Jan. 30, 2019, 2:58 p.m.)
Indexed	1 year ago (Aug. 3, 2024, 11:05 a.m.)
Issued	20 years, 4 months ago (April 1, 2005)
Published	20 years, 4 months ago (April 1, 2005)
Published Print	20 years, 4 months ago (April 1, 2005)

Funders 0

None

BibTeX

@article{Hutchison_2005, title={A versatile double aberration-corrected, energy filtered HREM/STEM for materials science}, volume={103}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2004.11.010}, DOI={10.1016/j.ultramic.2004.11.010}, number={1}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Hutchison, John L. and Titchmarsh, John M. and Cockayne, David J.H. and Doole, Ron C. and Hetherington, Crispin J.D. and Kirkland, Angus I. and Sawada, H.}, year={2005}, month=apr, pages={7–15} }

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