Crossref journal-article
Elsevier BV
Ultramicroscopy (78)
Bibliography

Yamazaki, T., Nakanishi, N., Rečnik, A., Kawasaki, M., Watanabe, K., Čeh, M., & Shiojiri, M. (2004). Quantitative high-resolution HAADF–STEM analysis of inversion boundaries in Sb2O3-doped zinc oxide. Ultramicroscopy, 98(2–4), 305–316.

Authors 7
  1. T Yamazaki (first)
  2. N Nakanishi (additional)
  3. A Rečnik (additional)
  4. M Kawasaki (additional)
  5. K Watanabe (additional)
  6. M Čeh (additional)
  7. M Shiojiri (additional)
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Dates
Type When
Created 21 years, 10 months ago (Sept. 23, 2003, 4:53 p.m.)
Deposited 6 years, 5 months ago (Feb. 22, 2019, 1:23 p.m.)
Indexed 1 year, 1 month ago (July 12, 2024, 3:07 a.m.)
Issued 21 years, 7 months ago (Jan. 1, 2004)
Published 21 years, 7 months ago (Jan. 1, 2004)
Published Print 21 years, 7 months ago (Jan. 1, 2004)
Funders 0

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@article{Yamazaki_2004, title={Quantitative high-resolution HAADF–STEM analysis of inversion boundaries in Sb2O3-doped zinc oxide}, volume={98}, ISSN={0304-3991}, url={http://dx.doi.org/10.1016/j.ultramic.2003.08.023}, DOI={10.1016/j.ultramic.2003.08.023}, number={2–4}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Yamazaki, T and Nakanishi, N and Rečnik, A and Kawasaki, M and Watanabe, K and Čeh, M and Shiojiri, M}, year={2004}, month=jan, pages={305–316} }