Crossref journal-article
Elsevier BV
Thin Solid Films (78)
Bibliography

Yuan, Z., Zhu, X., Wang, X., Cai, X., Zhang, B., Qiu, D., & Wu, H. (2011). Annealing effects of In2O3 thin films on electrical properties and application in thin film transistors. Thin Solid Films, 519(10), 3254–3258.

Authors 7
  1. Zijian Yuan (first)
  2. Xiaming Zhu (additional)
  3. Xiong Wang (additional)
  4. Xikun Cai (additional)
  5. Bingpo Zhang (additional)
  6. Dongjiang Qiu (additional)
  7. Huizhen Wu (additional)
References 10 Referenced 97
  1. 10.1016/j.tsf.2005.01.066 / Thin Solid Films by Fortunato (2005)
  2. 10.1109/TED.2006.887229 / IEEE Trans. Electron. Dev. by Wu (2007)
  3. 10.1063/1.2825422 / Appl. Phys. Lett. by Vygranenko (2007)
  4. 10.1038/nmat1755 / Nat. Mater. by Wang (2006)
  5. 10.1063/1.2966145 / Appl. Phys. Lett. by Park (2008)
  6. 10.1063/1.3262963 / Appl. Phys. Lett. by Dixit (2009)
  7. 10.1063/1.362612 / J. Appl. Phys. by Xirouchaki (1996)
  8. 10.1063/1.367025 / J. Appl. Phys. by Tahar (1998)
  9. 10.1063/1.2358829 / J. Appl. Phys. by Nakazawa (2006)
  10. 10.1016/j.cap.2007.06.001 / Curr. Appl Phys. by Prathap (2008)
Dates
Type When
Created 14 years, 8 months ago (Dec. 15, 2010, 11:35 p.m.)
Deposited 6 years, 8 months ago (Dec. 5, 2018, 9:20 p.m.)
Indexed 1 day, 19 hours ago (Aug. 28, 2025, 8:20 a.m.)
Issued 14 years, 5 months ago (March 1, 2011)
Published 14 years, 5 months ago (March 1, 2011)
Published Print 14 years, 5 months ago (March 1, 2011)
Funders 0

None

@article{Yuan_2011, title={Annealing effects of In2O3 thin films on electrical properties and application in thin film transistors}, volume={519}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/j.tsf.2010.12.022}, DOI={10.1016/j.tsf.2010.12.022}, number={10}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Yuan, Zijian and Zhu, Xiaming and Wang, Xiong and Cai, Xikun and Zhang, Bingpo and Qiu, Dongjiang and Wu, Huizhen}, year={2011}, month=mar, pages={3254–3258} }