Crossref
journal-article
Elsevier BV
Thin Solid Films (78)
References
10
Referenced
97
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Dates
Type | When |
---|---|
Created | 14 years, 8 months ago (Dec. 15, 2010, 11:35 p.m.) |
Deposited | 6 years, 8 months ago (Dec. 5, 2018, 9:20 p.m.) |
Indexed | 1 day, 19 hours ago (Aug. 28, 2025, 8:20 a.m.) |
Issued | 14 years, 5 months ago (March 1, 2011) |
Published | 14 years, 5 months ago (March 1, 2011) |
Published Print | 14 years, 5 months ago (March 1, 2011) |
@article{Yuan_2011, title={Annealing effects of In2O3 thin films on electrical properties and application in thin film transistors}, volume={519}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/j.tsf.2010.12.022}, DOI={10.1016/j.tsf.2010.12.022}, number={10}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Yuan, Zijian and Zhu, Xiaming and Wang, Xiong and Cai, Xikun and Zhang, Bingpo and Qiu, Dongjiang and Wu, Huizhen}, year={2011}, month=mar, pages={3254–3258} }