Crossref
journal-article
Elsevier BV
Thin Solid Films (78)
References
19
Referenced
12
{'key': '10.1016/j.tsf.2010.11.087_bb0005', 'series-title': 'Fundamentals of Semiconductors', 'author': 'Yu', 'year': '2010'}
/ Fundamentals of Semiconductors by Yu (2010)10.1103/PhysRev.98.368
/ Phys Rev by Dresselhaus (1955)10.1002/pssa.200777904
/ Phys Stat Sol by Hofmann (2008)10.1002/andp.200510204
/ Ann Phys by Schubert (2006)10.2307/2369245
/ Am J Math by Hall (1879)10.1364/JOSAA.20.000347
/ J Opt Soc Am A by Schubert (2003)10.1117/12.660382
/ Proc. SPIE / Terahertz Generalized Mueller-matrix Ellipsometry by Hofmann (2006)10.1063/1.1578162
/ Appl Phys Lett by Hofmann (2003){'key': '10.1016/j.tsf.2010.11.087_bb0045', 'series-title': 'Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons', 'author': 'Schubert', 'year': '2004'}
/ Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons and Polaritons by Schubert (2004){'key': '10.1016/j.tsf.2010.11.087_bb0050', 'series-title': 'Taschenbuch der Mathematik', 'author': 'Bronstein', 'year': '2008'}
/ Taschenbuch der Mathematik by Bronstein (2008){'key': '10.1016/j.tsf.2010.11.087_bb0055', 'series-title': 'Introduction to Solid State Physics', 'author': 'Kittel', 'year': '2009'}
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/ Thin Solid Films by Jellison (1998){'key': '10.1016/j.tsf.2010.11.087_bb0070', 'series-title': 'Spectroscopic Ellipsometry Principles and Applications', 'author': 'Fujiwara', 'year': '2007'}
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/ Rev Sci Instrum by Hofmann (2010)- T. Hofmann, C. M. Herzinger, J. L. Tedesco, D. K. Gaskill, J. A. Woollam, M. Schubert, Thin Solid Films in submission (2010) in submission.
{'key': '10.1016/j.tsf.2010.11.087_bb0085', 'year': '2007'}
(2007)10.1016/0038-1101(77)90054-5
/ Solid State Electron by Jacoboni (1977)- Note that in contrast to the setup described in Ref.[3], no mirrors were used to redirect the light onto the sample.
Dates
Type | When |
---|---|
Created | 14 years, 8 months ago (Dec. 12, 2010, 4:04 a.m.) |
Deposited | 5 years, 3 months ago (May 6, 2020, 5:22 p.m.) |
Indexed | 1 year, 1 month ago (July 5, 2024, 1:48 p.m.) |
Issued | 14 years, 6 months ago (Feb. 1, 2011) |
Published | 14 years, 6 months ago (Feb. 1, 2011) |
Published Print | 14 years, 6 months ago (Feb. 1, 2011) |
Funders
4
Army Research Office
10.13039/100000183
Region: Americas
gov (National government)
Labels
5
- U.S. Army Research Office
- United States Army Research Office
- U.S. Army Research Laboratory's Army Research Office
- ARL's Army Research Office
- ARO
Awards
1
- W911NF-09-C-0097
National Science Foundation
Awards
3
- MRI DMR-0922937
- MRSEC DMR-0820521
- DMR-0907475
University of Nebraska-Lincoln
10.13039/100008114
Region: Americas
gov (Universities (academic only))
Labels
6
- University of Nebraska, Lincoln
- University of Nebraska
- Nebraska
- Universitas Nebraskensis
- UNL
- NU
J.A. Woollam Foundation
@article{K_hne_2011, title={Terahertz optical-Hall effect for multiple valley band materials: n-type silicon}, volume={519}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/j.tsf.2010.11.087}, DOI={10.1016/j.tsf.2010.11.087}, number={9}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Kühne, P. and Hofmann, T. and Herzinger, C.M. and Schubert, M.}, year={2011}, month=feb, pages={2613–2616} }