DOI: 10.1016/j.tsf.2009.03.218. Optical modeling of free electron behavior in highly doped ZnO films

Optical modeling of free electron behavior in highly doped ZnO films

10.1016/j.tsf.2009.03.218

Crossref journal-article

Elsevier BV

Thin Solid Films (78)

Bibliography

Ruske, F., Pflug, A., Sittinger, V., Szyszka, B., Greiner, D., & Rech, B. (2009). Optical modeling of free electron behavior in highly doped ZnO films. Thin Solid Films, 518(4), 1289â1293.

Authors 6

F. Ruske (first)
A. Pflug (additional)
V. Sittinger (additional)
B. Szyszka (additional)
D. Greiner (additional)
B. Rech (additional)

References 31 Referenced 69

{'key': '10.1016/j.tsf.2009.03.218_bib1', 'volume': '25, 8', 'year': '2000'} (2000)
10.1557/mrs2007.29 / MRS Bulletin by Fortunato (2007)
10.1016/j.tsf.2007.03.014 / Thin Solid Films by Exarhos (2007)
We use the index opt in order to identify it as the quantity to be used in Eqs. 2 and 3. The calculation of mopt⁎ is explained in Section 4.2. It should be noted that the tensor-character of the effective mass has to be considered for a non-spherical band. In the case of ZnO it seems reasonalbe to assume a spherical conduction band [5,28], thus our data analysis will not consider anisotropy.
10.1002/cphc.200700002 / Chem. Phys. Chem. by Klingshirn (2007)
10.1016/S0040-6090(98)01490-4 / Thin Solid Films by Brehme (1999)
10.1063/1.2719158 / Appl. Phys. Lett. by Steinhauser (2007)
10.1016/j.tsf.2005.08.282 / Thin Solid Films by Qiao (2006)
10.1103/PhysRevB.71.075109 / Phys. Rev. B by Fujiwara (2005)
10.1063/1.2837109 / J. Appl. Phys. by Volintiru (2008)
10.1088/0022-3719/19/24/004 / J. Phys. C by Gerlach (1986)
10.1063/1.94896 / Appl. Phys. Lett. by Hamberg (1984)
10.1063/1.342419 / J. Appl. Phys. by Jin (1988)
10.1088/0022-3727/35/8/311 / J. Phys. D: Appl. Phys. by Mergel (2002)
10.1016/j.tsf.2004.01.006 / Thin Solid Films by Pflug (2004)
Jin et al.[13] also proposed α = −2 for ionized impurity scattering and found a good agreement in ZnO:Al.
{'key': '10.1016/j.tsf.2009.03.218_bib17', 'series-title': 'Society of Vacuum Coaters, 44th Annual Technical Conference Proceedings, Philadelphia, U.S.A.', 'first-page': '252', 'author': 'Szyszka', 'year': '2001'} / Society of Vacuum Coaters, 44th Annual Technical Conference Proceedings, Philadelphia, U.S.A. by Szyszka (2001)
10.1116/1.1472420 / J. Vac. Sci. Technol. A by Hong (2002)
10.1016/j.tsf.2005.08.177 / Thin Solid Films by Sittinger (2006)
10.1016/S0040-6090(97)00799-2 / Thin Solid Films by Leng (1998)
10.1002/andp.19354160802 / Annalen der Physik by Bruggeman (1935)
ASTM/ANSI F76 – 73 (1973).
10.1002/pssb.2221580141 / Phys. Stat. Sol. (B) by Pisarkiewicz (1990)
10.1063/1.1490620 / J. Appl. Phys. by Cavassilas (2002)
10.1116/1.1714985 / J. Vac. Sci. Technol. B by Pearton (2004)
10.1088/0022-3727/34/21/301 / J. Phys. D: Appl. Phys. by Ellmer (2001)
Unpublished data based on analysis of mobility versus carrier concentration and comparison to theories on grain boundary scattering.
10.1116/1.1290372 / J. Vac. Sci. Technol. A by Young (2000)
10.1557/mrs2000.149 / MRS Bulletin by Minami (2000)
10.1016/j.tsf.2007.05.084 / Thin Solid Films by Ellmer (2008)
10.1016/S0927-0248(02)00450-6 / Sol. Energy Mater. Sol. Cells by Lips (2003)

Dates

Type	When
Created	16 years, 4 months ago (April 14, 2009, 4:14 a.m.)
Deposited	6 years, 8 months ago (Dec. 20, 2018, 8:28 a.m.)
Indexed	2 months ago (June 24, 2025, 3:47 a.m.)
Issued	15 years, 8 months ago (Dec. 1, 2009)
Published	15 years, 8 months ago (Dec. 1, 2009)
Published Print	15 years, 8 months ago (Dec. 1, 2009)

Funders 0

None

BibTeX

@article{Ruske_2009, title={Optical modeling of free electron behavior in highly doped ZnO films}, volume={518}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/j.tsf.2009.03.218}, DOI={10.1016/j.tsf.2009.03.218}, number={4}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Ruske, F. and Pflug, A. and Sittinger, V. and Szyszka, B. and Greiner, D. and Rech, B.}, year={2009}, month=dec, pages={1289–1293} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        6,
        24
      ]
    ],
    "date-time": "2025-06-24T07:47:38Z",
    "timestamp": 1750751258959
  },
  "reference-count": 31,
  "publisher": "Elsevier BV",
  "issue": "4",
  "license": [
    {
      "start": {
        "date-parts": [
          [
            2009,
            12,
            1
          ]
        ],
        "date-time": "2009-12-01T00:00:00Z",
        "timestamp": 1259625600000
      },
      "content-version": "tdm",
      "delay-in-days": 0,
      "URL": "https://www.elsevier.com/tdm/userlicense/1.0/"
    }
  ],
  "content-domain": {
    "domain": [],
    "crossmark-restriction": false
  },
  "published-print": {
    "date-parts": [
      [
        2009,
        12
      ]
    ]
  },
  "DOI": "10.1016/j.tsf.2009.03.218",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2009,
        4,
        14
      ]
    ],
    "date-time": "2009-04-14T08:14:15Z",
    "timestamp": 1239696855000
  },
  "page": "1289-1293",
  "source": "Crossref",
  "is-referenced-by-count": 69,
  "title": "Optical modeling of free electron behavior in highly doped ZnO films",
  "prefix": "10.1016",
  "volume": "518",
  "author": [
    {
      "given": "F.",
      "family": "Ruske",
      "sequence": "first",
      "affiliation": []
    },
    {
      "given": "A.",
      "family": "Pflug",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "V.",
      "family": "Sittinger",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "B.",
      "family": "Szyszka",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "D.",
      "family": "Greiner",
      "sequence": "additional",
      "affiliation": []
    },
    {
      "given": "B.",
      "family": "Rech",
      "sequence": "additional",
      "affiliation": []
    }
  ],
  "member": "78",
  "reference": [
    {
      "key": "10.1016/j.tsf.2009.03.218_bib1",
      "volume": "25, 8",
      "year": "2000"
    },
    {
      "issue": "3",
      "key": "10.1016/j.tsf.2009.03.218_bib2",
      "doi-asserted-by": "crossref",
      "first-page": "242",
      "DOI": "10.1557/mrs2007.29",
      "volume": "32",
      "author": "Fortunato",
      "year": "2007",
      "journal-title": "MRS Bulletin"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib3",
      "doi-asserted-by": "crossref",
      "first-page": "7025",
      "DOI": "10.1016/j.tsf.2007.03.014",
      "volume": "515",
      "author": "Exarhos",
      "year": "2007",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib4",
      "unstructured": "We use the index opt in order to identify it as the quantity to be used in Eqs. 2 and 3. The calculation of mopt\u204e is explained in Section 4.2. It should be noted that the tensor-character of the effective mass has to be considered for a non-spherical band. In the case of ZnO it seems reasonalbe to assume a spherical conduction band [5,28], thus our data analysis will not consider anisotropy."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib5",
      "doi-asserted-by": "crossref",
      "first-page": "782",
      "DOI": "10.1002/cphc.200700002",
      "volume": "8",
      "author": "Klingshirn",
      "year": "2007",
      "journal-title": "Chem. Phys. Chem."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib6",
      "doi-asserted-by": "crossref",
      "first-page": "167",
      "DOI": "10.1016/S0040-6090(98)01490-4",
      "volume": "342",
      "author": "Brehme",
      "year": "1999",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib7",
      "doi-asserted-by": "crossref",
      "first-page": "142107",
      "DOI": "10.1063/1.2719158",
      "volume": "90",
      "author": "Steinhauser",
      "year": "2007",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib8",
      "doi-asserted-by": "crossref",
      "first-page": "520",
      "DOI": "10.1016/j.tsf.2005.08.282",
      "volume": "496",
      "author": "Qiao",
      "year": "2006",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib9",
      "doi-asserted-by": "crossref",
      "first-page": "075109",
      "DOI": "10.1103/PhysRevB.71.075109",
      "volume": "71",
      "author": "Fujiwara",
      "year": "2005",
      "journal-title": "Phys. Rev. B"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib10",
      "doi-asserted-by": "crossref",
      "first-page": "033704",
      "DOI": "10.1063/1.2837109",
      "volume": "103",
      "author": "Volintiru",
      "year": "2008",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib11",
      "doi-asserted-by": "crossref",
      "first-page": "4585",
      "DOI": "10.1088/0022-3719/19/24/004",
      "volume": "19",
      "author": "Gerlach",
      "year": "1986",
      "journal-title": "J. Phys. C"
    },
    {
      "issue": "8",
      "key": "10.1016/j.tsf.2009.03.218_bib12",
      "doi-asserted-by": "crossref",
      "first-page": "721",
      "DOI": "10.1063/1.94896",
      "volume": "44",
      "author": "Hamberg",
      "year": "1984",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "issue": "10",
      "key": "10.1016/j.tsf.2009.03.218_bib13",
      "doi-asserted-by": "crossref",
      "first-page": "5117",
      "DOI": "10.1063/1.342419",
      "volume": "64",
      "author": "Jin",
      "year": "1988",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib14",
      "doi-asserted-by": "crossref",
      "first-page": "794",
      "DOI": "10.1088/0022-3727/35/8/311",
      "volume": "35",
      "author": "Mergel",
      "year": "2002",
      "journal-title": "J. Phys. D: Appl. Phys."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib15",
      "doi-asserted-by": "crossref",
      "first-page": "201",
      "DOI": "10.1016/j.tsf.2004.01.006",
      "volume": "455\u2013456",
      "author": "Pflug",
      "year": "2004",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib16",
      "unstructured": "Jin et al.[13] also proposed \u03b1 = \u22122 for ionized impurity scattering and found a good agreement in ZnO:Al."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib17",
      "series-title": "Society of Vacuum Coaters, 44th Annual Technical Conference Proceedings, Philadelphia, U.S.A.",
      "first-page": "252",
      "author": "Szyszka",
      "year": "2001"
    },
    {
      "issue": "3",
      "key": "10.1016/j.tsf.2009.03.218_bib18",
      "doi-asserted-by": "crossref",
      "first-page": "900",
      "DOI": "10.1116/1.1472420",
      "volume": "20",
      "author": "Hong",
      "year": "2002",
      "journal-title": "J. Vac. Sci. Technol. A"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib19",
      "doi-asserted-by": "crossref",
      "first-page": "16",
      "DOI": "10.1016/j.tsf.2005.08.177",
      "volume": "496",
      "author": "Sittinger",
      "year": "2006",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib20",
      "doi-asserted-by": "crossref",
      "first-page": "132",
      "DOI": "10.1016/S0040-6090(97)00799-2",
      "volume": "313\u2013314",
      "author": "Leng",
      "year": "1998",
      "journal-title": "Thin Solid Films"
    },
    {
      "issue": "8",
      "key": "10.1016/j.tsf.2009.03.218_bib21",
      "doi-asserted-by": "crossref",
      "first-page": "665",
      "DOI": "10.1002/andp.19354160802",
      "volume": "416",
      "author": "Bruggeman",
      "year": "1935",
      "journal-title": "Annalen der Physik"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib22",
      "unstructured": "ASTM/ANSI F76 \u2013 73 (1973)."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib23",
      "doi-asserted-by": "crossref",
      "first-page": "K5",
      "DOI": "10.1002/pssb.2221580141",
      "volume": "158",
      "author": "Pisarkiewicz",
      "year": "1990",
      "journal-title": "Phys. Stat. Sol. (B)"
    },
    {
      "issue": "3",
      "key": "10.1016/j.tsf.2009.03.218_bib24",
      "doi-asserted-by": "crossref",
      "first-page": "1431",
      "DOI": "10.1063/1.1490620",
      "volume": "92",
      "author": "Cavassilas",
      "year": "2002",
      "journal-title": "J. Appl. Phys."
    },
    {
      "issue": "3",
      "key": "10.1016/j.tsf.2009.03.218_bib25",
      "doi-asserted-by": "crossref",
      "first-page": "932",
      "DOI": "10.1116/1.1714985",
      "volume": "22",
      "author": "Pearton",
      "year": "2004",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib26",
      "doi-asserted-by": "crossref",
      "first-page": "3097",
      "DOI": "10.1088/0022-3727/34/21/301",
      "volume": "34",
      "author": "Ellmer",
      "year": "2001",
      "journal-title": "J. Phys. D: Appl. Phys."
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib27",
      "unstructured": "Unpublished data based on analysis of mobility versus carrier concentration and comparison to theories on grain boundary scattering."
    },
    {
      "issue": "6",
      "key": "10.1016/j.tsf.2009.03.218_bib28",
      "doi-asserted-by": "crossref",
      "first-page": "2978",
      "DOI": "10.1116/1.1290372",
      "volume": "18",
      "author": "Young",
      "year": "2000",
      "journal-title": "J. Vac. Sci. Technol. A"
    },
    {
      "issue": "8",
      "key": "10.1016/j.tsf.2009.03.218_bib29",
      "doi-asserted-by": "crossref",
      "first-page": "38",
      "DOI": "10.1557/mrs2000.149",
      "volume": "25",
      "author": "Minami",
      "year": "2000",
      "journal-title": "MRS Bulletin"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib30",
      "doi-asserted-by": "crossref",
      "first-page": "4620",
      "DOI": "10.1016/j.tsf.2007.05.084",
      "volume": "516",
      "author": "Ellmer",
      "year": "2008",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "10.1016/j.tsf.2009.03.218_bib31",
      "doi-asserted-by": "crossref",
      "first-page": "513",
      "DOI": "10.1016/S0927-0248(02)00450-6",
      "volume": "78",
      "author": "Lips",
      "year": "2003",
      "journal-title": "Sol. Energy Mater. Sol. Cells"
    }
  ],
  "container-title": "Thin Solid Films",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0040609009007470?httpAccept=text/xml",
      "content-type": "text/xml",
      "content-version": "vor",
      "intended-application": "text-mining"
    },
    {
      "URL": "https://api.elsevier.com/content/article/PII:S0040609009007470?httpAccept=text/plain",
      "content-type": "text/plain",
      "content-version": "vor",
      "intended-application": "text-mining"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2018,
        12,
        20
      ]
    ],
    "date-time": "2018-12-20T13:28:38Z",
    "timestamp": 1545312518000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://linkinghub.elsevier.com/retrieve/pii/S0040609009007470"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2009,
        12
      ]
    ]
  },
  "references-count": 31,
  "journal-issue": {
    "issue": "4",
    "published-print": {
      "date-parts": [
        [
          2009,
          12
        ]
      ]
    }
  },
  "alternative-id": [
    "S0040609009007470"
  ],
  "URL": "http://dx.doi.org/10.1016/j.tsf.2009.03.218",
  "relation": {},
  "ISSN": [
    "0040-6090"
  ],
  "subject": [],
  "container-title-short": "Thin Solid Films",
  "published": {
    "date-parts": [
      [
        2009,
        12
      ]
    ]
  }
}