DOI: 10.1016/j.tsf.2006.12.172. Cu-accumulation at the interface between sputter-(Zn,Mg)O and Cu(In,Ga)(S,Se)2 — A key to understanding the need for buffer layers?

Cu-accumulation at the interface between sputter-(Zn,Mg)O and Cu(In,Ga)(S,Se)2 — A key to understanding the need for buffer layers?

10.1016/j.tsf.2006.12.172

Crossref journal-article

Elsevier BV

Thin Solid Films (78)

Bibliography

Lauermann, I., Loreck, Ch., Grimm, A., Klenk, R., MÃ¶nig, H., Lux-Steiner, M. Ch., Fischer, Ch.-H., Visbeck, S., & Niesen, T. P. (2007). Cu-accumulation at the interface between sputter-(Zn,Mg)O and Cu(In,Ga)(S,Se)2 â A key to understanding the need for buffer layers? Thin Solid Films, 515(15), 6015â6019.

Authors 9

I. Lauermann (first)
Ch. Loreck (additional)
A. Grimm (additional)
R. Klenk (additional)
H. Mönig (additional)
M.Ch. Lux-Steiner (additional)
Ch.-H. Fischer (additional)
S. Visbeck (additional)
T.P. Niesen (additional)

References 14 Referenced 31

10.1002/pip.626 / Prog. Photovolt. Res. Appl. by Contreras (2005)
{'key': '10.1016/j.tsf.2006.12.172_bib2', 'first-page': '707', 'volume': 'vol. 2', 'author': 'Glatzel', 'year': '2004'} by Glatzel (2004)
10.1016/j.tsf.2006.12.135 / Thin Solid Films by Grimm (2007)
{'key': '10.1016/j.tsf.2006.12.172_bib4', 'series-title': 'Proc. of Thin-film Compound Semiconductor Photovoltaics: Symposium held March 29–April 1. 2005, MRS Spring Meeeting', 'first-page': 'F2.1.1', 'author': 'Lauermann', 'year': '2005'} / Proc. of Thin-film Compound Semiconductor Photovoltaics: Symposium held March 29–April 1. 2005, MRS Spring Meeeting by Lauermann (2005)
{'key': '10.1016/j.tsf.2006.12.172_bib5', 'series-title': 'Practical Surface Analysis', 'volume': 'vol. 1', 'author': 'Briggs', 'year': '1990'} / Practical Surface Analysis by Briggs (1990)
10.1016/0092-640X(85)90016-6 / At. Data Nucl. Data Tables by Yeh (1985)
{'key': '10.1016/j.tsf.2006.12.172_bib7', 'series-title': 'QUASES-IMFP-TPP2MTM Software Package — Ver.2.1, Inelastic electron mean free path calculated from the TPP2M formula', 'first-page': '165', 'volume': 'vol. 21', 'author': 'Tougaard', 'year': '1993'} / QUASES-IMFP-TPP2MTM Software Package — Ver.2.1, Inelastic electron mean free path calculated from the TPP2M formula by Tougaard (1993)
10.1002/sia.740150705 / Surf. Interface Anal. by Niemi (1990)
Calvet, Wolfram, Präparation und in-situ Charakterisierung MBE-gewachsener Kupferindiumdisulfid-Schichten, Dissertation, Brandenburgische Technische Universität Cottbus, Cottbus, 2002.
10.1016/0022-3697(95)00050-X / J. Phys. Chem. Solids by Chernyak (1995)
10.1557/PROC-668-H8.21 / Mater. Res. Soc. Symp. Proc. by Hunger (2001)
10.1063/1.123825 / Appl. Phys. Lett. by Klein (1999)
10.1002/pip.618 / Prog. Photovolt. Res. Appl. by Bär (2005)
NIST, NIST X-Ray Photoelectron Spectroscopy Database, NIST Standard Reference Database 20, Version 3.4, 2005, Internet: http://srdata.nist.gov/xps/.

Dates

Type	When
Created	18 years, 8 months ago (Dec. 20, 2006, 10:12 a.m.)
Deposited	6 years, 7 months ago (Jan. 10, 2019, 1:28 p.m.)
Indexed	1 year, 2 months ago (May 24, 2024, 12:29 a.m.)
Issued	18 years, 3 months ago (May 1, 2007)
Published	18 years, 3 months ago (May 1, 2007)
Published Print	18 years, 3 months ago (May 1, 2007)

Funders 0

None

BibTeX

@article{Lauermann_2007, title={Cu-accumulation at the interface between sputter-(Zn,Mg)O and Cu(In,Ga)(S,Se)2 — A key to understanding the need for buffer layers?}, volume={515}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/j.tsf.2006.12.172}, DOI={10.1016/j.tsf.2006.12.172}, number={15}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Lauermann, I. and Loreck, Ch. and Grimm, A. and Klenk, R. and Mönig, H. and Lux-Steiner, M.Ch. and Fischer, Ch.-H. and Visbeck, S. and Niesen, T.P.}, year={2007}, month=may, pages={6015–6019} }

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