DOI: 10.1016/j.tsf.2005.07.357. Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in situ GISAXS and GIXD study

Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in situ GISAXS and GIXD study

10.1016/j.tsf.2005.07.357

Crossref journal-article

Elsevier BV

Thin Solid Films (78)

Bibliography

Richard, M.-I., SchÃ¼lli, T.-U., Wintersberger, E., Renaud, G., & Bauer, G. (2006). Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in situ GISAXS and GIXD study. Thin Solid Films, 508(1â2), 213â217.

Authors 5

M.-I. Richard (first)
T.-U. Schülli (additional)
E. Wintersberger (additional)
G. Renaud (additional)
G. Bauer (additional)

References 12 Referenced 5

10.1063/1.92959 / Appl. Phys. Lett. by Arakawa (1982)
10.1126/science.279.5349.353 / Science by Meideiros-Ribeiro (1998)
10.1016/S0370-1573(02)00009-1 / Phys. Rep. by Teichert (2002)
10.1063/1.1771452 / Appl. Phys. Lett. by Sonnet (2004)
10.1126/science.1082146 / Science by Renaud (2003)
See http://www.esrf.fr, BM32 beamline.
10.1016/j.nimb.2004.04.158 / Nucl. Instrum. Methods, B by Renaud (2004)
10.1103/RevModPhys.76.725 / Rev. Mod. Phys. by Stangl (2004)
10.1016/0304-3991(92)90365-Q / Ultramicroscopy by Kohler (1992)
10.1103/PhysRevB.33.3830 / Phys. Rev., B by Robinson (1986)
10.1103/PhysRevLett.65.1020 / Phys. Rev. Lett. by Mo (1990)
10.1103/PhysRevLett.83.1199 / Phys. Rev. Lett. by Chaperro (1999)

Dates

Type	When
Created	19 years, 8 months ago (Dec. 7, 2005, 8:36 a.m.)
Deposited	6 years, 7 months ago (Jan. 20, 2019, 5:54 a.m.)
Indexed	2 years, 1 month ago (July 4, 2023, 10:30 p.m.)
Issued	19 years, 2 months ago (June 1, 2006)
Published	19 years, 2 months ago (June 1, 2006)
Published Print	19 years, 2 months ago (June 1, 2006)

Funders 0

None

BibTeX

@article{Richard_2006, title={Growth mode, strain state and shape of Ge islands during their growth at different temperatures: a combined in situ GISAXS and GIXD study}, volume={508}, ISSN={0040-6090}, url={http://dx.doi.org/10.1016/j.tsf.2005.07.357}, DOI={10.1016/j.tsf.2005.07.357}, number={1–2}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Richard, M.-I. and Schülli, T.-U. and Wintersberger, E. and Renaud, G. and Bauer, G.}, year={2006}, month=jun, pages={213–217} }

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